stacking fault contrast
stacking fault contrast, Total:3 items.
The international standard classification for "stacking fault contrast" includes: Semiconducting materials .
The Chinese standard classification for "stacking fault contrast" includes: Metallographic testing method , Semimetal and semiconductor material in general .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 14145-1993 Test method for stacking fault density of epitaxial layers of silicon by interference contrast microscopy
Professional Standard - Non-ferrous Metal
- YS/T 23-2016 Test method for thickness of epitaxial layers-Stacking fault size
- YS/T 23-1992 Thickness determination for silicon epitaxial layers - Stacking fault method
