SEM method

SEM method, Total:11 items.

The international standard classification for "SEM method" includes: Linear and angular measurements in general , Optical equipment , Other standards related to analytical chemistry , Linear and angular measurements .

The Chinese standard classification for "SEM method" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Material Protection .

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General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
• GB/T 16594-1996 Micron grade lenght measurement by SEM
• GB/T 17722-1999 Gold-plated thickness measurement by SEM
• GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM

Professional Standard - Commodity Inspection

• SN/T 3009-2011 Identification of Seawater Corrosion on Metallic Surface by SEM

Professional Standard - Education

• JY/T 010-1996 General rules for analytical scanning electron microscopy

Professional Standard - Machinery

• JB/T 7503-1994 Thickness of Cross Section of Metal Coatings Scanning Electron Microscope Measuring Method

国家市场监督管理总局、中国国家标准化管理委员会

• GB/T 38783-2020 Method of coating thickness determination for precious metalcomposites by scanning electron microscope

International Organization for Standardization (ISO)

• ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary

SE-SIS

• SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

Spanish Association for Standardization (UNE)

• UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

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