x-ray electron microscope
x-ray electron microscope, Total:28 items.
The international standard classification for "x-ray electron microscope" includes: Optical equipment , Other standards related to analytical chemistry , Optical measuring instruments , Protection against crime .
The Chinese standard classification for "x-ray electron microscope" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Crime judging technology .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
- GB/T 17507-1998 General specification of thin biological STANDARDs for X-ray EDS microanalysis in electron microscope
- GB 7667-2003 The dose of X-rays leakage from electron microscope
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
- GB 7667-1996 The dose of X-rays leakage from electron microscope
- GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
Professional Standard - Judicatory
- SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry
Professional Standard - Public Safety Standards
- GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
- GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
- GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
Professional Standard - Education
- JY/T 011-1996 General rules for transmission electron microscopy
Professional Standard - Machinery
- JB/T 5383-1991 Specification for Transmission Electron Microscope
- JB/T 9352-1999 Test method for the transmission electron microscope
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
GSO
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
International Organization for Standardization (ISO)
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
x-ray diffraction,x-ray scattering test,small angle x-ray scattering,x-ray scattering,small angle x-ray scattering,x-ray scattering instrument x-ray diffractometer,x-ray diffractometer,x-ray polycrystal diffraction,x-ray strain gauge,liquid x-ray fluorescence,x-ray fluorescence,x-ray scattering,x-ray scattering measurements,x-ray instrument,hard x-ray,x-ray single crystal,x-ray structure,x-ray crystallography,x-ray principle,x-ray electron microscope
