Infrared measurement method
Infrared measurement method, Total:10 items.
The international standard classification for "Infrared measurement method" includes: Semiconducting materials , Chemical analysis of metals .
The Chinese standard classification for "Infrared measurement method" includes: Metal physical property test method , Semimetal and semiconductor material in general , Metal nondestructive testing method .
Military Standard of the People's Republic of China-General Armament Department
- GJB 8700-2015 Infrared radiation rate measurement method
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB 5892-2006 Measuring method of infrared emissivity
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 14847-1993 Test method for thickness of lightly doped silicon eqitaxial layers on heavily doped silicon substrates by infrared reflectance
- GB/T 1557-2006 The method of determining interstitial oxygen content in silicon by infrared absorption
- GB/T 1557-1989 The method of determining interstitial oxygen content in silicon by infrared absorption
- GB/T 8758-2006 Measuring thickness of epitaxial layers of gallium arsenide by infrared interference
- GB/T 1558-2009 Test method for substitutional atomic carbon concent of silicon by infrared absorption
- GB/T 1558-1997 Test method for substitutional atomic carbon content of silicon by infrared absorption
- GB/T 14143-1993 300～900μm Silicon slices－Measuring of interstitial oxygen content－Infrared absorption method
Group Standards of the People's Republic of China
- T/IAWBS 007-2018 Test method for thickness of 4H silicon carbide homo-epitaxial layers by infrared reflectance
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