X-ray spectrometer standard sheet

X-ray spectrometer standard sheet, Total:129 items.

The international standard classification for "X-ray spectrometer standard sheet" includes: Other standards related to optics and optical measurements , Radiation protection , Chemical analysis , IT applications in science , Other standards related to nuclear energy , Iron ores , Other methods of testing of metals , Refractories , Occupational safety. Industrial hygiene .

The Chinese standard classification for "X-ray spectrometer standard sheet" includes: Electron optics and other physical optics instrument , Ionizating Radiation Measurement , Radiological sanitation protection , Basic standards and general methods , Computer application , General nuclear instrument , Iron ore , Steel and iron alloy analysis method , Fireproof material in general , Optical Measurement .

Professional Standard - Machinery

JB/T 11145-2011 X-ray fluorescence spectrometer

Group Standards of the People's Republic of China

T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer

National Metrological Technical Specifications of the People's Republic of China

JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
JJF 2024-2023 Calibration Specification for Energy Dispersive X-Ray Fluorescence Spectrometers
JJF 1952-2021 Calibration Specification for Sulfur X-ray Fluorescence Spectrometry Analyzers
JJF 1306-2011 Calibration Specification for X-Ray Fluorescence Coating Thickness Instruments

未注明发布机构

ASTM RR-F01-1012 1996 F1526-Standard Test Method for Measuring Surface Metal Contamination on Silicon Wafers by Total Reflection X-Ray Fluorescence Spectroscopy
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/Z 42358-2023 Iron ores—Wavelength dispersive X-ray fluorescence spectrometers—Determination of precision
GB/T 29513-2013 Chemical analysis of ferric-containing dust and sludge by XRF―Fused cast bead method
GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
GB/T 21114-2007 Chemical analysis of refractory products by XRF—Fused cast bead method
GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer

Professional Standard - Electron

SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers

National Metrological Verification Regulations of the People's Republic of China

JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
JJG 810-1993 Wavelength Dispersive X-Ray Fluorescence Spectrometers

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales

Occupational Health Standard of the People's Republic of China

GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

Professional Standard - Agriculture

58药典四部-2020 0461 X-ray fluorescence spectrometry
JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer

工业和信息化部/国家能源局

JB/T 12962.1-2016 Energy dispersive X-ray fluorescence spectrometer. Part 1: General specification
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer

国家能源局

SY/T 7324-2016 X-ray fluorescence logging instrument calibration method

Professional Standard - Nuclear Industry

EJ/T 1100-1999 Bore-hole apparatus for X-ray fluorescence analysis

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 21114-2019 Refractories—Chemical analysis by X-ray fluorescence(XRF)—Fused cast-bead method

SCC

CEI 45-35:1997 Standardized test methods of semiconductor X-ray spectrometers
BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
AS 2563:1982 Wavelength dispersive X-ray fluorescence spectrometers - Methods of test for determination of precision
ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
VDI/VDE 5575 BLATT 6:2018 X-ray optical systems — reflection zone plates
VDI/VDE 5575 BLATT 5:2018 X-ray optical systems — transmission zone plates
SN-CR 10299:1998 Guidelines for the preparation of standard routine methods with wavelength-dispersive X-ray fluorescence spectrometry

IN-BIS

IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers
IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer

American Society for Testing and Materials (ASTM)

ASTM E1621-21 Standard Guide for X-Ray Emission Spectrometric Analysis
ASTM D5381-93(2014) Standard Guide for X-Ray Fluorescence 40;XRF41; Spectroscopy of Pigments and Extenders
ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E902-05 Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM E1172-16 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
ASTM E1172-22 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E572-02a(2006) Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
ASTM E572-02a Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
ASTM E1361-90(1999) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E572-02a(2006)e1 Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
ASTM E572-94(2000) Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
ASTM E1361-02(2021) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E572-94(2000)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1172-87(2001) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
ASTM D5381-93(2021) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
ASTM E1621-13 Standard Guide for Elemental Analysis by Wavelength Dispersive X-Ray Fluorescence Spectrometry
ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM C1271-99 Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM C1271-99(2020) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM E2735-13 Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ASTM E2735-14 Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy 40;XPS41; Experiments
ASTM E2120-10 Standard Practice for Performance Evaluation of the Portable X-Ray Fluorescence Spectrometer for the Measurement of Lead in Paint Films
ASTM F1467-18 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM E2735-14(2020) Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ASTM C1271-99(2006) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM E1085-09 Standard Test Method for Analysis of Low-Alloy Steels by X-Ray Fluorescence Spectrometry
ASTM D5381-93(2009) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
ASTM E539-11 Standard Test Method for Analysis of Titanium Alloys by X-Ray Fluorescence Spectrometry

Japanese Industrial Standards Committee (JISC)

JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS K 0119:2008 General rules for X-ray fluorescence analysis
JIS K 0119:1997 General rules for X-ray fluorescence spectrometric analysis
JIS G 1256:1997 Iron and steel -- Method for X-ray fluorescence spectrometric analysis

Korean Agency for Technology and Standards (KATS)

KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales

GSO

GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO/TR 18231:2021 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
BH GSO ISO/TR 18231:2022 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision

CZ-CSN

CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers

International Electrotechnical Commission (IEC)

IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1

Standard Association of Australia （SAA）

AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
AS 2563:2019 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 BLATT 9-2018 Roentgenoptische Systeme - Roentgenfilter
VDI/VDE 5575 BLATT 9-2019 Roentgenoptische Systeme - Roentgenfilter
VDI/VDE 5575 Blatt 5-2009 X-Ray optical systems - Transmission zone plates
VDI/VDE 5575 BLATT 6-2018 X-ray optical systems - Reflexion zone plates
VDI/VDE 5575 BLATT 5-2018 X-ray optical systems - Transmission zone plates
VDI/VDE 5575 BLATT 5-2017 Roentgenoptische Systeme - Transmissionszonenplatten

British Standards Institution (BSI)

BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision

German Institute for Standardization

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles

Institute of Electrical and Electronics Engineers (IEEE)

ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

International Organization for Standardization (ISO)

ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO/TR 18231:2016 Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision

RU-GOST R

GOST 22091.8-1984 X-ray devices. Method of measuring spectral structure and relative spectrum contamination

Association Francaise de Normalisation

NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.

KR-KS

KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale

European Committee for Standardization (CEN)

CEN/TR 10377:2023 Guidelines for the preparation of standard routine methods with wavelength-dispersive X-ray fluorescence spectrometry

Others: X-ray fluorescence spectrometer standard sample,X-ray spectrometer standard sheet