GBT6620
GBT6620, Total:2 items.
The international standard classification for "GBT6620" includes: Semiconducting materials .
The Chinese standard classification for "GBT6620" includes: Metal physical property test method , Elemental semiconductor material .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 6620-2009 Test method for measuring warp on silicon slices by noncontact scanning
- GB/T 6620-1995 Test method for measuring warp on silicon slices by noncontact scanning
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