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Ground resistance meter probe location

Ground resistance meter probe location, Total:36 items.

The international standard classification for "Ground resistance meter probe location" includes: Electricity. Magnetism. Electrical and magnetic measurements , Power stations in general , Semiconducting materials , Other methods of testing of metals , Electrical engineering in general , Measurement of electrical and magnetic quantities , Testing of metals .

The Chinese standard classification for "Ground resistance meter probe location" includes: Radio Measurement , Electromagnetic Measurement , Technical management , Technical management , Electric power testing technique , Semimetal and semiconductor material in general , Metal physical property test method , Semimetal and semiconductor material analysis method , Electrical equipment and tool in general , AC/DC electrical instrument recording instrument .


National Metrological Verification Regulations of the People's Republic of China

  • JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method
  • JJG 984-2004 Verification Regulation of Earth-Continuity Testers
  • JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method

Professional Standard - Electron

  • SJ/T 10481-1994 Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques
  • SJ/T 10314-1992 Generic specification of resistivity measuring instrument with four-point probe

Professional Standard - Energy and Power Planning

  • DL/T 845.6-2022 General technical conditions for resistance measuring devices Part 6: Ground down conductor conduction resistance tester
  • DL/T 845.2-2020 General specifications for measuring resistance equipment-Part 2:Power frequency ground resistance testers
  • DL/T 2553-2022 Guide for measuring earth resistivity, ground impedance, and earth surface potentials of power grounding system
  • DL/T 845.2-2004 General specifications for measuring resistance equipments Part 2: Power frequency earth resistance testers

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
  • GB/T 28030-2011 Earth continuity tester
  • GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe
  • GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
  • GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
  • GB/T 17949.1-2000 Guide for measuring earth resistivity, ground impedance and earth surface potentials of a ground system - Part 1: Normal measurements

Institute of Electrical and Electronics Engineers (IEEE)

  • IEEE 81-1983 Guide for measuring earth resistivity, ground impedance, and earth surface potentials of a ground system
  • IEEE Std 81-2012 IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
  • IEEE P81/D11, August 2012 IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
  • IEEE P81/D4, January 2025 IEEE Draft Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
  • IEEE 81-2012 IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
  • IEEE 81-1962 Guide for Measuring Ground Resistance and Potential Gradients in the Earth
  • IEEE P81/D10, March, 2012 IEEE Draft Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
  • IEEE Std 81-1983 IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Ground System Part 1: Normal Measurements
  • IEEE P81 IEEE Draft Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
  • IEEE P81/D2, December 2023 IEEE Draft Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
  • IEEE Std 81-1962 IEEE Recommended Guide for Measuring Ground Resistance and Potential Gradients in the Earth
  • IEEE P81/D3, November 2024 IEEE Draft Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System

RO-ASRO

  • STAS 10432-1976 EARTHING DEVICES Methods for measuring the dissipation resistance of the earth plate and the earth resistivity

American Society for Testing and Materials (ASTM)

  • ASTM F525-00a Standard Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe
  • ASTM F84-99 Method for measuring resistivity of silicon wafers - online four-point probe
  • ASTM B667-97(2009) Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
  • ASTM B667-97(2014) Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
  • ASTM B667-97(2024) Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
  • ASTM B667-97(2003)e1 Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
  • ASTM B667-97(2019) Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
  • ASTM F84-02 On-line four-point probe test method for measuring silicon wafer resistivity