GB/T 23729-2009 in English
VALIDPhotodiodes for scintillation detectors - Test procedures
- Issued on:2009-05-06
- Implemented on:2009-12-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
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《GB/T 23729-2009闪烁探测器用光电二极管 试验方法》由TC30(全国核仪器仪表标准化技术委员会)归口,TC30SC1(全国核仪器仪表标准化技术委员会通用核仪器和辐射探测器分会)执行,主管部门为国家标准化管理委员会。
本标准适用于在闪烁探测器或切伦科夫探测器中使用的固态光电二极管(PD)或光电二极管阵列(PDA)。本标准推荐的试验方法也适用于雪崩二极管(APD),但需要附加本标准描述的特殊试验方法。本标准中描述的试验不是强制性的,但宜按这里描述的程序进行规定性能的试验。本标准的目的是为闪烁探测器中使用的光电二极管建立标准试验方法,同时规定了供应商应提供的每种型号光电二极管的数据。
Scope
This standard applies to solid-state photodiodes (PDs) or photodiode arrays (PDAs) used in scintillation detectors or Cerenkov detectors. The test methods recommended in this standard are also applicable to avalanche diodes (APD), but the special test methods described in this standard need to be added. The tests described in this standard are not mandatory, but tests for specified performance should be carried out in accordance with the procedures described here. The purpose of this standard is to establish standard test methods for photodiodes used in scintillation detectors, and to specify the data that suppliers should provide for each type of photodiode.

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