GB/T 33051-2016 in English
VALIDOptical functional films--Superficial hardening film--Determination of thickness of hardening coating
- Issued on:2016-10-13
- Implemented on:2017-05-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$156.00
《GB/T 33051-2016光学功能薄膜 表面硬化薄膜 硬化层厚度测定方法》由TC431(全国光学功能薄膜材料标准化技术委员会)归口,主管部门为中国石油和化学工业联合会。
Introduction
Interpretation of GB/T33051-2016 "Measurement Method for Thickness of Hardened Film on Surface of Optical Functional Film"
1. Background and Significance of Standard Formulation
With the wide application of optical functional films in the fields of electronics, automobiles, and construction, the hardness and thickness of the film layer have become important indicators for measuring its performance. The formulation of GB/T33051-2016 fills the gap in the domestic determination method of surface hardened film thickness and provides a technical basis for quality control in related industries.
2. Technical Principle and Analysis
This standard adopts reflection interference spectroscopy, and calculates the optical path difference to obtain the film thickness by analyzing the reflection coherence spectrum generated by vertical incident light at the upper and lower interfaces of the coating. The core formula is as follows:
- Formula (1): I = I₁ +I₂ +2 I₁ I₂cos(2πδ)
- Formula (2): δ = 2ndλ
Wherein, n is the refractive index of the film, d is the film thickness, and λ is the wavelength of the incident light.
| Determination method | Brief description of principle | Scope of application | Advantages |
|---|---|---|---|
| Reflection interference spectroscopy | Based on the principle of light interference, the film thickness is calculated by analyzing the reflection spectrum | Applicable to transparent coatings on the surface of polyester film | High-precision, non-destructive testing |
| Spectroscopic ellipsometry (EPS) | Analysis of film parameters using the elliptical polarization characteristics of light | Applicable to multi-layer coating systems | Simultaneous measurement of refractive index and thickness |
| X-ray reflectometry (XRR) | Analyze film thickness by X-ray reflection characteristics | Applicable to very thin coatings | High resolution, but complex equipment |
3. Implementation suggestions and precautions
Test device selection: Ensure that the light source wavelength range covers 380nm~780nm, and the spectrometer resolution is less than 3nm.
Sample preparation: The sample size is recommended to be 10cm×10cm, and the surface must be free of scratches and other defects. The back can be painted black to reduce secondary reflections.
Calibration requirements: Before each test, a standard wafer with known thickness and refractive index must be used for calibration.
4. Impact of Standard Implementation on the Industry
The implementation of GB/T33051-2016 will help improve the quality control level of optical thin film products and promote the technological upgrading of related industries. It is recommended that enterprises establish a complete film thickness detection system and regularly calibrate and maintain the test equipment.

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