GB/T 35306-2017 in English

SUPERSEDED

Test method for carbon and oxygen content of single crystal silicon―Low temperature fourier transform infrared spectrometry

Issued on:2017-12-29
Implemented on:2018-07-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $160.00
$156.00

Standard No:	GB/T 35306-2017
Document status:	SUPERSEDED
Superseded by:	GB/T 35306-2023 Determination of carbon and oxygen content in single crystal silicon—Low temperature fourier transform infrared spectrometry method
Superseded on:	2024-03-01
Title in English:	Test method for carbon and oxygen content of single crystal silicon―Low temperature fourier transform infrared spectrometry
Title in Chinese:	硅单晶中碳、氧含量的测定低温傅立叶变换红外光谱法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2017-12-29
Implemented on:	2018-07-01
ICS Classification:	77.040-Testing of metals
Chinese Classification:	H17-Semimetal and semiconductor material analysis method
Professional Classification:	GB-National Standard
Related Keywords:	single crystal silicon ― low temperature fourier transform oxygen content low-temperature fourier transform test method single crystals
Related Topics:	Silica silicon infrared Infrared of silica Infrared spectrum detection content Infrared spectrum detection content Ferrite Infrared Spectroscopy Infrared Peak Silica Infrared Spectroscopy Silica Cryogenic Fourier Cryogenic Fourier Fourier infrared method Fourier transform infrared test method State-of-the-art FTIR High quality of Fourier transform infrared Fourier transform infrared test method One-stop FTIR Infrared Carbon Monoxide Content Two methods of FT-IR variable infrared spectrum Fourier method GB/T35306-2017 Silica silicon infrared Infrared Spectrum of Silica cryo-mass spectrometry Infrared Silica Infrared peaks of silica Silica Peak Infrared SiO infrared peak Silicon oxide + infrared peak Cryogenic Fourier Transform Infrared peak + content Infrared Spectroscopy Silica Determination of Biomass Content in Wood Plastic Composites by Fourier Transform Infrared Spectroscopy Infrared Spectrum Carbon Oxygen Why Carbon Monoxide Infrared Spectroscopy Infrared Spectroscopy Determination Conditions Silica + infrared Infrared Silica Peak Content in the mid-infrared spectrum Mid-infrared quantification Silicon oxide silicon infrared peak SiO infrared peak SLR infrared spectroscopy Infrared Spectrum of Gallium Oxide Fourier infrared spectroscopy Infrared spectrum mass content How much is infrared spectrum measured Cryogenic Fourier Transform Infrared Spectroscopy Siloxane Infrared Infrared peaks of silicon oxide GB/T 35306-2017 Infrared measurement of silica Carbon silicon infrared peak Infrared peaks of silicon Infrared silicon-carbon peak Infrared silicon carbon peak Spectrum of crystalline silicon Fourier Transform Infrared Spectroscopy Where is the iron oxide peak in the infrared spectrum? Mid-infrared optical rotation Infrared silica peak Infrared Silica Infrared Spectrum Relative Content Fourier Transform Infrared Spectroscopy content and infrared spectrum Infrared Silica Infrared spectrum test Mid-infrared spectrum of ketones Low Temperature Infrared Spectroscopy Mid-infrared quantification SiO infrared peak What does Fourier transform infrared spectroscopy detect What does FTIR detect? low temperature spectroscopy what in the infrared spectrum Infrared Spectrum of Fe3O4 Carbon Infrared Spectroscopy Silicon oxide silicon infrared peak Silica mid-infrared The peak of silica in the infrared spectrum Fourier infrared measurement Infrared Carbon Oxycarbon Infrared Carbon Oxygen Fourier Transform Infrared Spectroscopy Detection Infrared spectrum carbon peak Infrared Spectrum Carbon Oxygen Infrared Silica Content What does Fourier Transform Infrared Spectroscopy test Silicon carbon infrared peak wavelength in the infrared spectrum Reverse peak in infrared spectrum Infrared Oxycarbon Infrared Spectrum Test Content Outdoor spectral measurement Infrared Spectrum of Lithium Oxide Outdoor spectral measurement Method of Spectral Transformation Silicon oxide silicon infrared peak Authentic FTIR Oxycarbon in silicon How to Measure Infrared Spectrum Infrared Fourier Oxygen Content Oxygen and carbon content in silicon Carbon and oxygen content Carbon Infrared Spectroscopy Oxygen Infrared Spectroscopy Infrared Oxycarbon Carbon Infrared Spectroscopy Mid-infrared method measurement system Infrared Silica Peak low temperature spectroscopy Standard Infrared Spectrum of Carbon Monoxide Spectral Oxygen Content Silicon carbon oxygen content Infrared Carbon Oxygen Epoxy Infrared Spectroscopy Infrared Spectrum Trace Spectral term for carbon Infrared spectrum carbon peak Infrared silicon carbon peaks Spectrum mid-infrared spectroscopy Carbon Oxygen in Silicon Oxygen and carbon content in silicon wafer Infrared Carbon Oxygen Fourier infrared test Infrared quantitative semi-quantitative Fourier transform infrared spectroscopy detects seven peaks Oxygen and carbon measurement in silicon wafer Oxygen and carbon measurement in silicon Infrared Oxygen Measurement mid-infrared crystal The lower the oxygen content red edge of the spectrum Infrared relative content Mid-infrared spectroscopy measurement What does Fourier transform infrared spectroscopy measure? Infrared carbon and oxygen content Determination of carbon and oxygen in silicon Oxygen, carbon and their content in silicon Oxygen, carbon and content in silicon Folic Acid Content by Ultraviolet Determination Determination of mid-infrared Association Peaks in Infrared Spectra Infrared Spectrum of an Oxygenated Compound Infrared determination of silicon Carbon and oxygen content in silicon single crystal What does infrared spectroscopy measure Silicon carbon oxygen content SiC spectrometer Silicon single crystal carbon and oxygen content cryo-mass spectrometry GB/T35306 GBT35306 GB/T 35306-2017 Low Temperature Infrared Spectroscopy Calculate content from infrared spectrum The position of the carbon dioxide peak in the infrared spectrum The role of salt windows in infrared spectroscopy Silica emulsion infrared spectrum Silicone carbon resin crystal phase content gb/t 24581-2009 Test method for measuring the content of group III and V impurities in silicon single crystals by low-temperature Fourier transform infrared spectroscopy Infrared method to test oxygen content Method for determination of oxygen content in silicon crystals Oxygen and carbon content of silicon wafer Determination of oxygen content by infrared method Single crystal silicon seed crystal standard project establishment Standard silica infrared spectrum Methods to remove carbon dioxide from infrared spectroscopy gb/t 35306

《GB/T 35306-2017硅单晶中碳、氧含量的测定低温傅立叶变换红外光谱法》由TC203（全国半导体设备和材料标准化技术委员会）归口，TC203SC2（全国半导体设备和材料标准化技术委员会材料分会）执行，主管部门为国家标准化管理委员会。

Introduction

This standard provides a method for determining the carbon and oxygen content in silicon single crystals using low-temperature Fourier transform infrared spectroscopy. The procedure outlines the principles, equipment requirements, and operational steps necessary for accurate measurement. It specifies the conditions under which the analysis should be conducted to ensure consistency and reliability. The standard also includes details on sample preparation, calibration procedures, and data interpretation. It serves as a reference for laboratories involved in the analysis of silicon materials, ensuring that measurements are performed in a standardized manner. The method is applicable to silicon single crystals used in semiconductor manufacturing and related industries.

*** Please note: This description may not be accurate, please refer to the official documentation.

More samples: GB 50021-2001(2009) GB 18306-2015 DL/T 5154-2012

Sample only — not a preview of GB/T 35306-2017

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