YS/T 1061-2015 in English

SUPERSEDED

Silicon core for polysilicon by improved siemens method

Issued on:2015-04-30
Implemented on:2015-10-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $100.00
$97.00

Standard No:	YS/T 1061-2015
Document status:	SUPERSEDED
Superseded by:	YS/T 1061-2024 Silicon cores for polysilicon
Title in English:	Silicon core for polysilicon by improved siemens method
Title in Chinese:	改良西门子法多晶硅用硅芯
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2015-04-30
Implemented on:	2015-10-01
ICS Classification:	29.045-Semiconducting materials
Chinese Classification:	H82-Elemental semiconductor material
Professional Classification:	YS-Non-ferrous Metal
Related Keywords:	modified siemens method silicon core polycrystalline silicon cores silicon rods czochralski method
Related Topics:	polysilicon to improve Polycrystalline ys/t 1075.8-2015 m2 polycrystalline ys/t 1050.2-2015 ys/t 1075.4-2015 ys/t 1028.2-2015 ys/t 1028.5-2015 ys t 1075.4 2015 ys/t 1028.1-2015 Docetaxel Siemens ys/t1050.2-2015 ys/t1017-2015 ys/t1064-2015 Crystal core ys t 1028.1 2015 core level Wafer Diversity Crystal Core Optoelectronics Crystal core 48 Polycrystalline and Amorphous Hat multi-sector four only Crystal core system Silicon crystallization peak core level Crystal core 48 samples Improved version Siemens speed Multi-directional Crystal core p core level electronics Electronic grade silicon core Crystal Core 9 MilliSiemens Improved Fawu Crystal core equipment Crystal core equipment Molecular weight of silicone oil Siemens chemiluminescence Siemens 7200smart Siemens alarm 7994 Siemens 1500stop Siemens s2000abvs Standard silicon core Electronic silicon single crystal Polycrystalline Siemens standard thermal resistance Silicon powder for polycrystalline silicon Polycrystalline silicon atmospheric emissions silicon core Polycrystalline silicon powder In-wafer silicon citation Silicon wafer ys/t3503-2015

Scope

This standard specifies the requirements, inspection methods, inspection rules, marking, packaging, transportation, storage, quality certificate and order form (or contract) content for polycrystalline silicon cores produced by the modified Siemens method. This standard applies to polycrystalline silicon as raw material, silicon rods produced by the Czochralski method (CZ) and then processed by wire cutting or drawn by the pedestal method.

More samples: QC/T 942-2021 DL/T 5154-2012 GB 18306-2015

Sample only — not a preview of YS/T 1061-2015