Figure thickness

Figure thickness, Total:21 items.

The international standard classification for "Figure thickness" includes: Semiconducting materials , Testing of metals .

The Chinese standard classification for "Figure thickness" includes: Semimetal and semiconductor material in general , Metal physical property test method .

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Professional Standard - Nuclear Industry

• EJ/T 20003.14-2014 Specification for series of geological maps for in-situ leaching sandstone type uranium deposits.Part 14: stratum contour map

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices
• GB/T 30869-2014 Test method for thickness and total thickness variation of silicon wafers for solar cell
• GB/T 5753-2008 Steel cord conveyor belts - Methods for the determination of total thickness and cover thickness

SCC

• BS 3983:1966 Determination of the thickness and bulk of paper
• BS ISO 6342:1993 Micrographics. Aperture cards. Method of measuring thickness of buildup area
• NS 1961:1982 Conveyor belts — Tolerances on total thickness and thickness of covers

Korean Agency for Technology and Standards (KATS)

• KS X ISO 6342-2022 Micrographics－Aperture cards－Method of measuring thickness of buildup area
• KS D 0259-2012 Methods of measurement of thickness,thickness variation and bow for silicon wafer
• KS D 0259-2022 Methods of measurement of thickness,thickness variation and bow for silicon wafer
• KS D 0259-2012(2017) Methods of measurement of thickness,thickness variation and bow for silicon wafer
• KS D 0259-2012(2022) Methods of measurement of thickness,thickness variation and bow for silicon wafer

PL-PKN

• PN P22211-1988 Leathers Determination of thickness and decrease of thickness

German Institute for Standardization

• DIN 21918-2:2004 Mine plans - Mineral deposits - Part 2: Thicknesses

VE-FONDONORMA

• NORVEN 24-25-1965 Difference in conveyor belt thickness and cover thickness difference

American Society for Testing and Materials (ASTM)

• ASTM E2868-22 Standard Digital Reference Images for Steel Castings up to 2 in. (50.8 mm) in Thickness
• ASTM F533-02 Standard Test Method for Thickness and Thickness Variation of Silicon Wafers
• ASTM F533-96 Standard Test Method for Thickness and Thickness Variation of Silicon Wafers

AR-IRAM

• IRAM 507-N.I.O.-1946 Steel plates with a thickness exceeding 4.75mm (thick steel plates)

International Organization for Standardization (ISO)

• ISO 3616:2001 Textile glass - Chopped-strand and continuous-filament mats - Determination of average thickness, thickness under load and recovery after compression

Japanese Industrial Standards Committee (JISC)

• JIS H 0611:1994 Methods of measurement of thickness, thickness variation and bow for silicon wafer

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