crystal precursor
crystal precursor, Total:200 items.
The international standard classification for "crystal precursor" includes: Ophthalmic equipment , Optoelectronics. Laser equipment , Pesticides and other agrochemicals , Testing of metals , Piezoelectric and dielectric devices , Semiconducting materials , Nuclear energy in general , Chemical analysis of metals , Electric furnaces , Sugar. Sugar products. Starch , Components and accessories for telecommunications equipment .
The Chinese standard classification for "crystal precursor" includes: Medical optical instrument and endoscope , Special electronic technology material , Pesticide , Metal physical property test method , Quartz crystal and piezoelectric element , Semimetal and semiconductor material in general , Material and component for instrument and meter , Metallographic testing method , Industrial electric heating equipment , Processed sugar , Sugar refining , Nuclear detector , Artificial lens , Technical management .
Professional Standard - Medicine
- YY/T 0295.11-1997 Capsulotomy forceps
- YY 0290.9-2010 Ophthalmic implants—Intraocular lenses—Part 9:Multifocal intraocular lenses
- YY 0290.10-2009 Intraocular lenses—Part 10:Phakic intraocular lenses
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
- GB/T 9558-2001 Crystallo-dimethoate
- GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
- GB/T 3351~353-1982 artificial quartz crystal
- GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
- GB/T 37398-2019 Barium fluoride scintillation crystal
- GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
- GB/T 8756-1988 Collection of metallographs on defects of crystalline germanium
- GB/T 44567-2024 Optics crystal—Ultraviolet grade calcium fluride crystal
- GB/T 8553-1987 Holders (Enclosures), crystal, general specification for
- GB/T 3352-1994 Synthetic quartz crystal
- GB/T 8756-2018 Collection of metallographs on defects of germanium crystal
- GB 9558-2001 Crystallo-dimethoate
- GB/T 8553-2023 Generic specification for enclosures for crystal units
Taiwan Provincial Standard of the People's Republic of China
- CNS 1996-1978 Stannic Chloride, Crystal (Tin Tetraclrloride Crystals)
- CNS 11763-1986 Transistor Megaphones
- CNS 12257-1988 Crystal Filters
- CNS 3997-1989 Method of Test for Transistors
- CNS 6808-1989 General Rules for Transistors
Professional Standard - Machinery
- JB/T 10789-2007 High pressure crystal growing funaces-TDR-GY-series high pressure crystal growing furnaces by liquid-encapsulated Czohralski method
- JB/T 9495.1-1999 Optical Crystals
Professional Standard - Light Industry
- QB/T 1173-1991 Monocrystal rock sugar
- QB 1174-1991 Multicrystal Rock Sugar
- QB/T 1174-1991 Multicrystal rock sugar
- QB/T 1173-2002 Monocrystal rock sugar
- QB/T 1174-2002 Multicrystal rock sugar
- QB 1173-1991 Monocrystal Rock Sugar
Professional Standard - Building Materials
- JC/T 2023-2010 Lead Tungstate Scintillation Crystals
- JC/T 2613-2021 Titanium doped sapphire laser crystal
- JC/T 2017-2010 Lead fluoride crystal
Group Standards of the People's Republic of China
- T/QGCML 1655-2023 Thin film transistor LCD
- T/ZZB 0916-2018 Gyromagnetic polycrystalline ferrite
- T/CECA 48-2021 Quartz Crystal Microbalance Element
- T/CSTM 00316-2022 Optoelectric single crystals - Lithium tantalate single crystals for pyroelectric infrared detection
- T/QGCML 4031-2024 Semiconductor optical wafer
- T/CEMIA 049-2025 High-purity silicon carbide powder for crystal growth
- T/CASME 1061-2023 Ultra high nickel precursor material
Guizhou Provincial Standard of the People's Republic of China
- DB52/ 455-2004 capsaicin crystals
Professional Standard - Education
- JY 200-1985 Transistor millivoltmeter
Hebei Provincial Standard of the People's Republic of China
- DB13/T 1288-2010 Crystalline silicon solar cells
Professional Standard - Electron
- SJ/T 11199-2016 Piezoelectric quartz crystal sheet
- SJ/Z 9155.1-1987 Quartz crystal controlled oscillators-Part 1: General information,test conditions and methods
- SJ/T 11199-1999 Piezoelectric quartz crystal blank
Ente Nazionale Italiano di Unificazione
- UNI EN ISO 11979-10:2007 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses
- UNI EN ISO 11979-10:2015 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses
- UNI EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
- UNI EN ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses - Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
Polski Komitet Normalizacyjny (PKN)
- PN T01504-24-1987 Transistors Measurement of the |h21E| module in the RF and fT frequency ranges
- PN T01504-01-1987 Transistors Measuring methods Static value of the forward current transfer ratio hus and base-emitter voltage Ube
- PN T01504 ArkusZ30-1975 Information processing Standards for data transmission in wireless networks
Magyar Szabványügyi Testület
- MSZ 4749-1970 crystalline asbestos
- MSZ 8531-1961 Crystal Industrial Explosives
American National Standards Institute (ANSI)
- ANSI Z80.13-2007 Phakic Intraocular Lenses
- ANSI Z80.13-2007(R2017) Ophthalmics - Phakic Intraocular Lenses
- ANSI/EIA 417-A:1991 Crystal Outlines
- ANSI Z80.7-2013(R2018) Ophthalmics - Intraocular Lenses
German Institute for Standardization
- DIN EN ISO 11979-10 A1 E:2013-06 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses
- DIN EN 120003:1996 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
- DIN EN 120003:1996-11 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
- DIN EN ISO 11979-9 A1 E:2013-06 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses
- DIN EN ISO 11979-10/A1 E:2013-06 Draft Document - Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006/DAM1:2013); German version EN ISO 11979-10:2006/prA1:2013
- DIN EN ISO 11979-10/A1 E:2013 Draft Document - Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006/DAM1:2013); German version EN ISO 11979-10:2006/prA1:2013
- DIN EN ISO 11979-7:2018-08 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018); German version EN ISO 11979-7:2018
- DIN EN ISO 11979-7:2024 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2024); German version EN ISO 11979-7:2024
- DIN 52341:1993 Testing of glass; chemical analysis of lead crystal glass and crystal glass
- DIN EN ISO 11979-7 E:2017-03 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)
- DIN EN ISO 11979-7 E:2023-04 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)
- DIN EN ISO 11979-7 E:2013-07 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)
- DIN EN ISO 11979-7:2023-04 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO/DIS 11979-7:2023); German and English version prEN ISO 11979-7:2023 / Note: Date of issue 2023-03-03*Intended as replace...
- DIN EN ISO 11979-7 E:2012-07 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)
- DIN EN ISO 11979-10:2018-08 Ophthalmic implants - Intraocular lenses - Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes (ISO 11979-10:2018); German version EN ISO 11979-10:2018
British Standards Institution (BSI)
- BS EN ISO 11979-10:2006+A1:2014 Ophthalmic implants. Intraocular lenses-Phakic intraocular lenses
- BS EN ISO 11979-7:2018 Ophthalmic implants. Intraocular lenses. Clinical investigations of intraocular lenses for the correction of aphakia
- BS EN ISO 11979-7:2024 Ophthalmic implants. Intraocular lenses - Clinical investigations of intraocular lenses for the correction of aphakia
- BS EN ISO 11979-10:2018 Ophthalmic implants. Intraocular lenses. Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
- BS EN 120003:1986 Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays
- BS EN ISO 11979-10:2006 Ophthalmic implants - Intraocular lenses - Phakic intraocular lenses
- 23/30453001 DC BS EN ISO 11979-7. Ophthalmic implants. Intraocular lenses - Part 7. Clinical investigations of intraocular lenses for the correction of aphakia
- BS IEC 60747-4-1:2000 Semiconductor devices. Discrete devices-Microwave diodes and transistors. Microwave field effect transistors. Blank detail specification-BDS for microwave field-effect transistors
- BS EN ISO 11979-9:2006+A1:2014 Ophthalmic implants — Intraocular lenses — Part 9 : Multifocal intraocular lenses
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC EIA-371-1970 Measurement of Small-Signal VHF-UHF Transistor Short-Circuit Forward Current Transfer Ratio
- JEDEC JES2-1992 Transistor, Gallium Arsenide Power Fet, Generic Specification
- JEDEC JESD313B-1975 Conduction Cooled Power Transistors, Thermal Resistance Measurements of Revision of EIA-313-B formerly RS-313-B
- JEDEC JESD10-1976 Low Frequency Power Transistors
Spanish Association for Standardization (UNE)
- UNE-EN 120003:1992 BDS: PHOTOTRANSISTORS, PHOTOCARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS. (Endorsed by AENOR in September of 1996.)
- UNE-EN ISO 11979-10:2007 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006)
- UNE-EN ISO 11979-10:2007/A1:2014 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006/Amd 1:2014)
- UNE-EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018) (Endorsed by Asociación Española de Normalización in June of 2018.)
- UNE-EN 168100:1993 SS: QUARTZ CRYSTAL UNITS. (Endorsed by AENOR in November of 1996.)
Swedish Institute for Standards
- SIS SS CECC 20003-1988 Blank detail specification: Phototransistors, photodar/ington transistors, phototransistor arrays
National Standardisation Body (ASRO)
- STAS 9675-1974 CRYSTALLINE SILICON
- STAS 11418-1980 Semiconductor devices UNIJUNCTION TRANSISTORS Terminology
Asociación Española de Normalización (AENOR)
- AENOR UNE-EN 120003:1996 Blank Detail Specification: Phototransistors, photodarlington transistors, phototransistor arrays
GCC Standardization Organization
- GSO ISO 11979-10:2014 Ophthalmic implants -- Intraocular lenses -- Part 10: Phakic intraocular lenses
- GSO ISO 11979-9:2014 Ophthalmic implants -- Intraocular lenses -- Part 9: Multifocal intraocular lenses
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 11979-10:2016 Ophthalmic implants -- Intraocular lenses -- Part 10: Phakic intraocular lenses
- BH GSO ISO 11979-9:2016 Ophthalmic implants -- Intraocular lenses -- Part 9: Multifocal intraocular lenses
Danish Standards Foundation
- DS/EN ISO 11979-10:2006 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses
- DANSK DS/EN ISO 11979-10/A1:2006 Ophthalmic implants – Intraocular lenses – Part 10: Phakic intraocular lenses
- DANSK DS/EN 120003:2016 Blank Detail Specification: Phototransistors, photodarlington transistors, phototransistor arrays
- DANSK DS/ISO 11979-7:2024 Ophthalmic implants – Intraocular lenses – Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
- DANSK DS/EN ISO 11979-7:2018 Ophthalmic implants – Intraocular lenses – Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018)
- DANSK DS/EN ISO 11979-9/A1:2006 Ophthalmic implants – Intraocular lenses – Part 9: Multifocal intraocular lenses
- DS/EN ISO 11979-9:2007 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses
American Society for Testing and Materials (ASTM)
- ASTM STP 283-1961 Properties of crystalline solids
- ASTM F47-94 Crystalline Silicon Crystal Defect Detection Method
- ASTM F1726-02 Silicon Wafer Crystal Defect Analysis Guide
Association Francaise de Normalisation
- NF EN 120003:1992 Special framework specification: phototransistors, photodarlington transistors, phototransistor networks
- NF C93-120-003*NF EN 120003:1992 Blank detail specification : phototransistors, photodarlington transistors, phototransistor arrays
- NF EN ISO 11979-7:2024 Ophthalmic implants - Intraocular lenses - Part 7 : clinical investigations of intraocular lenses for the correction of aphakia
- NF EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7: clinical investigations of intraocular lenses for the correction of aphakia
- NF B30-004:1974 GLASS.CRYSTAL,CRYSTAL GLASS,CRYSTALLIN.
- NF S94-750-7*NF EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7 : clinical investigations of intraocular lenses for the correction of aphakia
- NF EN ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses - Part 10: Clinical investigations of intraocular lenses for the correction of ametropia in phakic eyes
- NF C96-611/A1:1972 Semiconductors Junction transistors Particular Standard Sheets
Lithuanian Standards Office
- LST EN 120003-2001 Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
- LST EN ISO 11979-10:2007 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006)
European Standard for Electrical and Electronic Components
- EN 120003:1992 Blank detail specification: phototransistors, photodarlington transistors, phototransistor arrays
Standards Norway
- NS-EN ISO 11979-10:2006 Ophthalmic implants — Intraocular lenses — Part 10: Phakic intraocular lenses (ISO 11979-10:2006)
- NS-EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018)
Korean Agency for Technology and Standards (KATS)
- KS C 7021-1974(2001) GENERAL RULES FOR TRANSISTORS
- KS C 7021-1985 GENERAL RULES FOR TRANSISTORS
- KS P ISO 11979-7-2021 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
- KS C 6506-1983 Synthetic Quartz Crysta1
- KS M 1401-2022 Sodium sulfite(crystal)
- KS P ISO 11979-7:2021 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
- KS C 6506-1983(2008) Synthetic Quartz Crysta1
- KS M 1401-2017(2022) Sodium sulfite(crystal)
- KS P ISO 11979-10:2019 Ophthalmic implants — Intraocular lenses — Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
- KS C 8531-2005 Crystalline solar cell module
- KS P ISO 11979-10-2019(2024) Ophthalmic implants — Intraocular lenses — Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
- KS P ISO 11979-10-2019 Ophthalmic implants — Intraocular lenses — Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
- KS C 6024-1995(2000) MEASURING METHODS FOR TRANSISTORS
- KS C 6503-1984 Quartz crystal units for oscillators
- KS C 6503-1999 Quartz crystal units for oscillators
- KS C 6024-1985 MEASURING METHODS FOR TRANSISTORS
U.S. Military Regulations and Norms
- ARMY MIL-PRF-55310/18 F-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 Hz THROUGH 15.0 MHz, HERMETIC SEAL, SQUARE WAVE, CMOS
- ARMY MIL-PRF-55310/8 J-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 50 Hz THROUGH 50 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
- ARMY MIL-P-46320 C (4)-1972 POWER SUPPLY: 10516158 (TRANSISTORIZED)
- ARMY MIL-PRF-55310/28 C-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 85 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
- ARMY MIL-P-46320 C-1963 POWER SUPPLY: 10516158 (TRANSISTORIZED)
Japanese Industrial Standards Committee (JISC)
- JIS C 6703:2008 Crystal filters
- JIS C 6704:2005 Synthetic quartz crystal
- JIS C 6704:2009 Synthetic quartz crystal
- JIS C 6704:1997 Synthetic quartz crystal
- JIS C 5513:1970 Transistor megaphones
- JIS C 6704:2017 Synthetic quartz crystal
- JIS C 8918:2013 Crystalline photovoltaic (PV) modules
- JIS C 6703:1995 General rules of crystal filters
- JIS C 8918:2023 Crystalline photovoltaic (PV) modules
- JIS C 6701:1995 Quartz crystal units for oscillators
International Organization for Standardization (ISO)
- ISO/FDIS 11979-7:2011 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
- ISO/DIS 11979-7 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
- ISO 11979-10:2006 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses
- ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses- Part 10:Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
- ISO 11979-1:2018 Ophthalmic implants — Intraocular lenses — Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
International Electrotechnical Commission (IEC)
- IEC 60758:1983 Synthetic quartz crystal - Chapter I: Specification for synthetic quartz crystal - Chapter II: Guide to the use of synthetic quartz crystal
- IEC 60758:1983/AMD1:1983 Amendment 1 - Synthetic quartz crystal - Chapter I: Specification for synthetic quartz crystal - Chapter II: Guide to the use of synthetic quartz crystal
- IEC 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
- IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
American Water Works Association (AWWA)
- AWWA ACE68690 Control of N-DBP Precursors: How Does That Compare to the Control of THM Precursors?
Czech Standards Institute (UNMZ)
- CSN 68 5401-1981 Sodium sulphate rystalliform
- CSN 68 5367-1974 Potassium hydrogensulphate crystallic
- CSN 35 8813-1979 Tranaiators KU 611, KU 612
- CSN 65 3460-1961 Zinc sulphate, crystalic. technical
- CSN 35 8812-1979 Transistore KU 601, KU 602
- CSN 65 3127-1963 Crystallic sodium sulphate, technical
Yugoslav Association for Standardization
- JUS N.R9.073-1986 Piezoelectrlc vibrators. Quartz crystal unlts. Two wire crystal holder outline, type 17
- JUS N.R9.069-1986 Piezoelectric vibrators. Quartz crystal units. Two piri crystal holder outline, type 07
- JUS N.R9.071-1986 Piezoelectric vibrators. Quartz crystal units. Two mre crystal holder outline, type 18
- JUS N.R9.070-1986 Piezoelectric vibrators. Ouartz crystal units. Two pin crystal holder outlfne, type09
- JUS N.R1.352-1979 Letter symbohfor semkonductor devices. Thyristors.
- JUS N.R9.064-1986 Piezoelectric vibrators. Ctuartz crystal units. Two wire crystal holder outline. Types 11, 14 and 15
Military Standards (MIL-STD)
- MIL MIL-S-19500/530-1979 SEMICONDUCTOR DEVICE, TRANSISTOR, SILICON TYPE 2N3906
- MIL MIL-S-19500/529-1978 SEMICONDUCTOR DEVICE, TRANSISTOR, SILICON TYPE 2N3904
- MIL MIL-S-19500/288-1964 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON TYPE 2N2377
- MIL MIL-S-19500/289-1964 Semiconductor Device, Transistor, PNP, Silicon Type 2N2378
- MIL MIL-S-19500/303-1964 Semiconductor Device, Transistor, Types 2N2631 and 2N2876
Defense Logistics Agency
- DLA MIL-S-19500/529 VALID NOTICE 4-2011 Semiconductor Device, Transistor, Silicon Type 2N3904
- DLA MIL-S-19500/216 A VALID NOTICE 3-2004 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON TYPE 2N1051
- DLA MIL-S-19500/303 VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N2631 and 2N2876
- DLA MIL-S-19500/273 A VALID NOTICE 3-2011 Semiconductor Device, Transistor Type Type 2N744
- DLA MIL-S-19500/288 (2)-1966 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON TYPE 2N2377
- DLA MIL-S-19500/216 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, NPN, Silicon Type 2N1051
- DLA MIL-S-19500/40 B VALID NOTICE 3-2011 Semiconductor, Transistor, NPN, Germanium, Power Type 2N326
- DLA MIL-S-19500/170 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium Type 2N1499A
- DLA MIL-S-19500/288 VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Silicon Type 2N2377
- DLA MIL-PRF-19500/139 B NOTICE 2-1999 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON TYPE JAN-2N1119
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE 176-1949 STANDARDS ON PIEZOELECTRIC CRYSTALS
Electronic Components, Assemblies and Materials Association
- ECA 417-A-1991 Crystal Outlines
European Committee for Standardization (CEN)
- EN ISO 11979-7:2024 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2024)
Argentine Institute of Standardization
- IRAM 17 724-1963 Boric acid crystals for photography
Indonesia Standards
- SNI 06-3491-1994 Perak nitrat kristal, Mutu
Türk Standardları Enstitüsü
- TS 2319-1976 Quartz Crystal Units For Oscilators
Society of Automotive Engineers (SAE)
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 11979-9:2014 Ophthalmic implants -- Intraocular lenses -- Part 9: Multifocal intraocular lenses
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