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Database: 365,228(8 Aug 2026)

X electron microscope sample preparation

X electron microscope sample preparation, Total:58 items.

The international standard classification for "X electron microscope sample preparation" includes: Optical equipment , Other standards related to analytical chemistry , Optical measuring instruments , Protection against crime .

The Chinese standard classification for "X electron microscope sample preparation" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Crime judging technology .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 17507-1998 General specification of thin biological STANDARDs for X-ray EDS microanalysis in electron microscope
  • GB/T 18735-2002 General specification of nanometer thin STANDARD specimen for analytical transmission electron microscopy (AEM/EDS)
  • GB 7667-1996 The dose of X-rays leakage from electron microscope
  • GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
  • GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
  • GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
  • GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
  • GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
  • GB 7667-2003 The dose of X-rays leakage from electron microscope
  • GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope

Taiwan Provincial Standard of the People's Republic of China

  • CNS 11018-1984 Method of Preparing Coal Samples for Microscopical Analysis by Reflected Light

Professional Standard - Judicatory

  • SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Professional Standard - Petroleum

  • SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
  • SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
  • SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

国家能源局

  • SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Public Safety Standards

  • GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
  • GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
  • GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry

Fujian Provincial Standard of the People's Republic of China

  • DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Group Standards of the People's Republic of China

VDI - Verein Deutscher Ingenieure

SCC

  • VDI/VDE 5575 BLATT 4:2018 X-ray optical systems — X-ray mirrors and X-ray mirror systems — Total reflection and multilayer mirrors
  • VDI/VDE 5575 BLATT 7-2019 X-ray optical systems - Refractive X-ray lenses
  • BS ISO 8038-2:2001 Optics and optical instruments. Screw threads for microscope objectives and related nosepieces-Screw thread type M25 x 0,75 mm

Standard Association of Australia (SAA)

  • AS 2061:1989 Preparation of coal samples for incident light microscopy
  • AS 2856.1:2000(R2013) Preparation of coal samples for incident light microscopy of coal petrography
  • AS 2856.1:2000 Coal petrography - Preparation of coal samples for incident light microscopy
  • AS 2061:1977 Code of practice for preparation of hard coal samples for microscopical examination by reflected light

Society of Automotive Engineers (SAE)

  • SAE AS8568-2006 Binoculars, Prismatic, Hand-Held (for Aeronautical Use) (7 x 50 and 6 x 42 (Wide Field))
  • SAE AS8568-1999 Binoculars, Prismatic, Hand-Held (for Aeronautical Use) (7 x 50 and 6 x 42 (Wide Field))

Association of German Mechanical Engineers

Japanese Industrial Standards Committee (JISC)

  • JIS B 7140:1986 Microscope test specimens
  • JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
  • JIS T 8146:1971 Eye protector with tempered glass lenses

Korean Agency for Technology and Standards (KATS)

American Society for Testing and Materials (ASTM)

  • ASTM D3997-97(2004) Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
  • ASTM D2797/D2797M-09 Standard Practice for Preparing Coal Samples for Microscopical Analysis by Reflected Light
  • ASTM D3997-97 Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
  • ASTM D2797/D2797M-11 Standard Practice for Preparing Coal Samples for Microscopical Analysis by Reflected Light
  • ASTM D3997/D3997M-24 Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
  • ASTM D3997/D3997M-16 Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
  • ASTM D3997/D3997M-97(2009) Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light

Military Standards (MIL-STD)

PL-PKN

  • PN H87903-1972 Irwestigations o? copper alloys castings Preparation and sampling ot ?es? pieces for microscopis examinations

SAE - SAE International

  • SAE AS8568A-2012 Binoculars@ Prismatic@ Hand-Held (for Aeronautical Use) (7 x 50 and 6 x 42 (Wide Field))

CZ-CSN

IX-IX-IEC

  • IEC TS 62607-6-17:2023 Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy