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Database: 365,228(8 Aug 2026)

Temperature and humidity pressing chips

Temperature and humidity pressing chips, Total:143 items.

The international standard classification for "Temperature and humidity pressing chips" includes: Measurement of force, weight and pressure , Integrated circuits. Microelectronics , Medical equipment , Other materials for the reinforcement of composites , Motion picture films. Cartridges , Laboratory medicine , Mechanical testing , Waterproofing , Geology. Meteorology. Hydrology .

The Chinese standard classification for "Temperature and humidity pressing chips" includes: Material and component for instrument and meter , Papermaking in general , Microcircuit in general , Medical laboratory equipment , Fibre reinforced composites , Photosensitive material , Medical apparatus and devices in general , Mechanical vibration, impact equipment and dynamic balancing machine , Roof and pavement waterproof and barrier material , Meteorology , Daily-use hardware , Basic standards and general methods for photosensitive material .


Professional Standard - Agriculture

Professional Standard - Machinery

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 31295-2014 The core to wind turbine blade―Determination of dimensional stability at elevated temperatures with flexural load and with compressive load
  • GB/T 41407-2022 Technical requirement of nucleic acid isothermal amplification analyzer based on microfluidic chips
  • GB/T 22906.2-2008 Testing of cores—Part 2:Conditioning of test samples
  • GB/T 6848-1986 Dimensions of the cores for motion-picture film rolls
  • GB/T 41521-2022 General technical requirement of microfluidic chip for multi-index nucleic acid isothermal amplification and detection
  • GB/T 33752-2017 Aldehyde slide for microarrays
  • GB/T 44279-2024 Temperature-humdity-vibration-low pressure combined environmental testing system
  • GB/T 33922-2017 Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances
  • GB/T 28856-2012 Silicon piezoresistive pressure-sensitive chip

Group Standards of the People's Republic of China

  • T/SICA 003-2022 Technical specification for dual-frequency multi-interface temperature and humidity detection tag chip based on RFID transmission and storage technology
  • T/ZS 0646-2024 IC level flip chip die bonder
  • T/SBX 021-2019 Operation rules for automatic scribing and splitting of laser chips
  • T/CASME 53-2022 Temperature and humidity controller for high voltage switchgear
  • T/CSPSTC 11-2018 Rapid determination of pathogenic bacteria in food Biochip method
  • T/CIET 1002-2025 Biochip Analyzer
  • T/CECS 10173-2022 Thermally cross-linked polymer felt with skin-core structure based wet installed waterproofing sheets
  • T/ZSA 301-2025 Monolithic integrated coherent optical receiver chip

未注明发布机构

Professional Standard - Meteorology

  • QX/T 121-2010 Coding specifications for upper-level pressure, temperature, humidity and wind report
  • QX/T 626-2021 Digitization of pressure , air temperature , relative humidity autographic records

Professional Standard - Medicine

Professional Standard - Light Industry

National Metrological Technical Specifications of the People's Republic of China

  • JJF(纺织)104-2021 Calibration Specification for Textile Laboratory with Constant Temperature and Humidity
  • JJF(纺织) 104-2021 Calibration Specification for Textile Laboratory with Constant Temperature and Humidity

Professional Standard - Chemical Industry

  • HG/T 3558-1988 Method for determination of the moisture content of photographic film and film base
  • HG/T 3558-2019 Method for determination of moisture content of photographic film and film base

The American Society of Agricultural and Biological Engineers

General Motors Corporation (GM)

Japanese Industrial Standards Committee (JISC)

Korean Agency for Technology and Standards (KATS)

American Society of Heating, Refrigerating and Air-Conditioning Engineers (ASHRAE)

  • ASHRAE 3859-1995 Temperature and Humidity Control During Cooling and Dehumidifying by Compressor and Evaporator Fan Speed Variation
  • ASHRAE 3901-1995 Experimental Study of Temperature@ Pressure@ Humidity@ and/or Density Effects on Vane Anemometers

Institute of Electrical and Electronics Engineers (IEEE)

Defense Logistics Agency

ECIA - Electronic Components Industry Association

American National Standards Institute (ANSI)

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

Military Standards (MIL-STD)

International Organization for Standardization (ISO)

  • ISO 11093-2:1994 Paper and board - Testing of cores - Part 2: Conditioning of test samples
  • ISO 8756:1994 Air quality; handling of temperature, pressure and humidity data
  • ISO 1039:1995 Cinematography - Cores for motion-picture and magnetic film rolls - Dimensions

IPC - Association Connecting Electronics Industries

Indonesia Standards

British Standards Institution (BSI)

  • BS PD ES 59008-5-3:2001 Data requirements for semiconductor die. Particular requirements and recommendations for die types-Minimally-packaged die
  • PAS 62177-2000 Highly-Accelerated Temperature and Humidity Stress Test (HAST) (Edition 1.0)
  • PAS 62084-1998 Implementation of Flip Chip and Chip Scale Technology (Edition 1.0; No Replacement)
  • BS PD IEC/TR 62258-4:2007 Semiconductor die products-Questionnaire for die users and suppliers
  • BS EN IEC 63215-2:2023 Endurance test methods for die attach materials - Temperature cycling test method for die attach materials applied to discrete type power electronic devices
  • BS PD CLC/TR 62258-4:2013 Semiconductor die products. Questionnaire for die users and suppliers

Gosstandart of Russia

German Institute for Standardization

Magyar Szabványügyi Testület

  • MSZ 14593/4-1979 Dissolving cores for road vehicles, tablet dissolving cores (dissolving tablets)

Danish Standards Foundation

  • DS/ES 59008-5-1:2001 Data requirements for semiconductor die - Part 5-1: Particular requirements and recommendations for die types - Bare die
  • DANSK DS/EN IEC 63215-2:2023 Endurance test methods for die attach materials – Part 2: Temperature cycling test method for die attach materials applied to discrete type power electronic devices

CENELEC - European Committee for Electrotechnical Standardization

  • ES 59008-5-1-2001 Data Requirements for Semiconductor Die Part 5-1: Particular Requirements and Recommendations for Die Types - Bare Die
  • ES 59008-5-3-2001 Data Requirements for Semiconductor Die - Part 5-3: Particular Requirements and Recommendations for Die Types - Minimally-Packaged Die

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

VN-TCVN

  • TCVN 6752-2000 Air quality.Handling of temperature, pressure and humidity data

GCC Standardization Organization

Spanish Association for Standardization (UNE)

  • UNE 77233:1996 AIR QUALITY. HANDLING OF TEMPERATURE, PRESSURE AND HUMIDITY DATA.

Association Francaise de Normalisation

  • NF C93-745-2*NF EN IEC 63215-2:2023 Endurance test methods for die attach materials - Part 2 : temperature cycling test method for die attach materials applied to discrete type power electronic devices

The Directorate General of Specifications and Metrology (DGSM)

Swedish Institute for Standards

  • SS-ISO 8756:1997 Air quality - Handling of temperature, pressure and humidity data

TIA - Telecommunications Industry Association

  • J-STD-028-1999 Performance Standard for Construction of Flip Chip and Chip Scale Bumps (IPC/EIA J-STD-028)

YU-JUS

  • JUS N.R8.153-1982 Cores for inductors and transformers for telecommunications. ethods of expressing temperature dependence

CZ-CSN

U.S. Air Force