Scanning Electron Microscopy
Scanning Electron Microscopy, Total:18 items.
The international standard classification for "Scanning Electron Microscopy" includes: Linear and angular measurements in general , Metallic coatings , Optical equipment , Protection against crime .
The Chinese standard classification for "Scanning Electron Microscopy" includes: Optical Measurement , Electron optics and other physical optics instrument , Material Protection , Chemical Measurement , Crime judging technology .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
- GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effects on topography induced by nanoparticles
- GB/T 16594-1996 Micron grade lenght measurement by SEM
- GB/T 17722-1999 Gold-plated thickness measurement by SEM
National Metrological Verification Regulations of the People's Republic of China
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms
Professional Standard - Judicatory
- SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
Professional Standard - Machinery
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Fujian Provincial Standard of the People's Republic of China
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
Association of German Mechanical Engineers
- VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method
SCC
- VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
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