Surface element distribution
Surface element distribution, Total:53 items.
The international standard classification for "Surface element distribution" includes: Chemical analysis , Fertilizers , Optics and optical measurements , Surface active agents , Steels .
The Chinese standard classification for "Surface element distribution" includes: Basic standards and general methods , Chemical fertilizer and chemical soil conditioner , Tooth paste, soap and detergent , Steel and iron alloy analysis method .
未注明发布机构
- FD CEN/TR 15739:2010 Prefabricated concrete products - Concrete surface and facings - Identification elements
- DIN 4000-191 E:2020-10 Tabular layouts of properties - Part 191: Clamping elements
- DIN 4000-192 E:2022-09 Tabular layouts of properties - Part 192: Positioning elements
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- GB/T 17420-2020 Foliar microelement fertilizer
- GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
Group Standards of the People's Republic of China
- T/CSTM 00012-2017 Laser-induced breakdown spectroscopy in-situ statistical distribution analysis method for multi-element composition and state distribution characterization of iron and steel
- T/CSTM 00012E-2021 Iron and steel--Characterization of distribution of multi-element contents and status--Original position statistic distribution analysis method of laser induced breakdown spectroscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 17420-1998 Foliar microelement fertilizer
- GB/T 22462-2008 Nano Sub-micron scale film on steel - Quantitative depth profile analysis - Glow discharge atomic emission spectrometry
- GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
- GB/T 21834-2008 Medium and low alloy steel - Determination of the distribution of multi-element contents - Original position statistic distribution analysis method
- GB/T 43548-2023 Determination of metallic element contents in surface active agents and detergents
Hubei Provincial Standard of the People's Republic of China
- DB42/ 239-2003 macronutrient foliar fertilizer
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34504-2017 Measurement method for surface metal contamination on sapphire polished substrate wafer
HU-MSZT
- MNOSZ 17616-1954 Surface active element detection
- MSZ 6230-1957 Detection of active elements. cover area
German Institute for Standardization
- DIN 4000-192:2023-05 Tabular layouts of properties - Part 192: Positioning elements
- DIN 4000-191:2021-06 Tabular layouts of properties - Part 191: Clamping elements
SCC
- DIN 4000-192:2023 Tabular layouts of properties - Part 192: Positioning elements
- DIN 4000-192 E:2022 Draft Document - Tabular layouts of properties - Part 192: Positioning elements
- DIN 4000-191 E:2020 Draft Document - Tabular layouts of properties - Part 191: Clamping elements
- NS 3451:2006 Table for building elements
- NS 3451:2009 Table of building elements
- NS 3451:1988 Table for building elements
- NS 3451:1984 Table for building elements
- ISO/IEC 15897:2011/COR1:2013 Corrigendum 1 - Information technology - User interfaces - Procedures for the registration of cultural elements
- AS U26:1956 Carbon case-hardening steel
- BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
Association Francaise de Normalisation
- FD P18-503:2023 Concrete surfaces and facings - Identification elements
- NF EN 13507:2018 Thermal spraying - Preliminary surface treatment of metal parts and elements for thermal spraying
- NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
American Society for Testing and Materials (ASTM)
- ASTM E3008/E3008M-16(2023) Standard Classification for Transportation Surface Elements—UNIFORMAT II
Korean Agency for Technology and Standards (KATS)
- KS D ISO 14706-2003(2018) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
- KS D ISO 17973-2021 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
- KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
- KS D ISO 17973-2011(2016) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KR-KS
- KS D ISO 14706-2003(2023) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
NO-SN
- NS 3451-2006 Table of building elements
International Telecommunication Union (ITU)
- ITU-T G.874 CORR 1-2011 (Pre-Published) Management aspects of optical transport network elements Corrigendum 1
International Organization for Standardization (ISO)
- ISO/TR 6306:1989 Chemical analysis of steel; order of listing elements
- ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
British Standards Institution (BSI)
- BS ISO 14706:2014 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 14706:2001 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
GSO
- BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- GSO ISO 14706:2013 Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
IT-UNI
- UNI 936-1986 Technical drawings. Specifications and distribution of drawing elements
AT-ON
- ONORM E 1276-1989 Diagrams, charts, tables for electrotechnics; unit wiring diagrams and tables
surface element,Element distribution measurement,Element distribution,eds element distribution,element surface,eds element distribution,Element Distribution Analysis,Element distribution measurement,eds element distribution,Surface pore size distribution,Element distribution,Surface element distribution,Element Distribution Analysis,surface element,surface distribution,Measuring elemental distribution,Element Spectral Distribution,Determination of elemental distribution,element distribution eds,surface distribution
