Jingduo

Jingduo, Total:27 items.

The international standard classification for "Jingduo" includes: Semiconducting materials , Chemical analysis of metals , Sugar. Sugar products. Starch .

The Chinese standard classification for "Jingduo" includes: Elemental semiconductor material , Metal physical property test method , Compound semiconductor material , Processed sugar , Sugar refining .

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General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 4059-1983 Polycrystalline silicon; Examination method; Zone-melting on phosphorus under controlled atmosphere
• GB/T 25074-2017 Solar-grade polycrystalline silicon
• GB/T 12963-2022 Electronic-grade polycrystalline silicon
• GB/T 12963-1996 Polycrystalline silicon
• GB/T 12963-2009 Specification for Polycrystalline Silicon
• GB/T 29054-2012 Solar-grade casting multi-crystalline silicon brick
• GB/T 36706-2018 Polycrystalline indium phosphide
• GB/T 12963-2014 Electronic-grade polycrystalline silicon
• GB/T 25074-2010 Solar-grade polycrystalline silicon

Group Standards of the People's Republic of China

• T/CBCSA 36-2021 Corundum polycrystalline slab
• T/ZZB 0061-2016 Polycrystalline silicon ingot production furnace

Professional Standard - Light Industry

• QB/T 1174-1991 Multicrystal rock sugar
• QB/T 1174-2002 Multicrystal rock sugar
• QB 1174-1991 Multicrystal Rock Sugar

Professional Standard - Non-ferrous Metal

• YS/T 724-2016 Silicon power for polycrystalline
• YS/T 1359-2020 Lithium tantalate polycrystalline powder
• YS/T 1061-2024 Silicon cores for polysilicon

CZ-CSN

• CSN 42 4991-1970 Polycristallinic germanium
• CSN 34 5911-1986 Polycrystalline silicion

UNKNOWN

• YB 1601-83 Silicon polycrystalline
• YB 1601-1983 Silicon polycrystalline

American Society for Testing and Materials (ASTM)

• ASTM F574-88 Evaluating polysilicon
• ASTM RR-E04-1008 2013 E2627-Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials

Korean Agency for Technology and Standards (KATS)

• KS D 2715-2017 Tensile specimen of single- and poly-crystal nano/micro thin film materials
• KS D 2715-2006 Tensile specimen of single- and poly-crystal nano/micro thin film materials

International Electrotechnical Commission (IEC)

• IEC 63181-2:2020 LCD multi-screen display terminals - Part 2: Measuring methods

German Institute for Standardization

• DIN EN 63181-2 E:2019-11 LCD multi screen display terminals - Part 2: Measuring methods

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