GaN single crystal
GaN single crystal, Total:5 items.
The international standard classification for "GaN single crystal" includes: Testing of metals .
The Chinese standard classification for "GaN single crystal" includes: Metal physical property test method , Semimetal and semiconductor material analysis method .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 41751-2022 Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers
- GB/T 32188-2015 The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
- GB/T 32282-2015 Test method for disoclation density of GaN single crystal—Cathodoluminescence spectroscopy
- GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 39144-2020 Test method for magnesium content in gallium nitride materials—Secondary ion mass spectrometry
GaN substrate,GaN substrate,GaN,Gallium Nitride Single Crystal Substrate,GaN single crystal substrate,"Atomic Force Microscopy Examination Method for Surface Roughness of Gallium Nitride Single Crystal Substrate",Gallium Nitride Substrate,Measurement of Dislocation Density in Gallium Nitride Single Crystal by Cathodoluminescence Microscopy,GaN single crystal substrate,GaN single crystal,Gallium Nitride Substrate+,Gallium Nitride Substrate,Domestic Gallium Nitride,Gallium Nitride Substrate Abroad,GaN substrate downstream,Measuring GaN Substrate Sheet Carrier Concentration,Carriers in Gallium Nitride,Gallium Nitride Test,Gallium Arsenide Single Crystal,Gallium Arsenide Single Crystal for Solar Cells
