Semiconductor contact angle

Semiconductor contact angle, Total:73 items.

The international standard classification for "Semiconductor contact angle" includes: Testing of metals , Plug-and-socket devices. Connectors , Rectifiers. Convertors. Stabilized power supply .

The Chinese standard classification for "Semiconductor contact angle" includes: Technical management , Metal physical property test method , Connector , Power semiconductor device and parts , Clamping fixtures .

Professional Standard - Electron

SJ 50597.2-1994 Detail specification for types JH2014 HTL flip-flop of semiconductor integrated circuits
SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 6616-1995 Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy-current gage
GB/T 15872-2013 Power supply interface for semiconductor equipment
GB/T 15872-1995 Power supply interface for semiconductor equipment
GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
GB/T 7677-1987 Semiconductor direct d. c. convertors

工业和信息化部/国家能源局

JB/T 13349-2017 Rolling bearings-Angular contact ball bearings- Measuring methods for contact angle

机械电子工业部

JB 5843-1991 Connectors for power semiconductor devices

Professional Standard - Aviation

HB 7027.8-1994 Interchangeable Parts and Guiding Piece of Fixture - Rotating Guide Bush with Horizontal-type Angular Contact Ball Bearing

Professional Standard - Machinery

JB/T 5843-2005 Connectors for power semiconductor devices
JB/T 5843-1991 Connectors for Power Semiconductor Devices

BE-NBN

NBN C 63-158-2-1989 Low-voltage controlgear Semiconductor contactors (solid state contactors)

Spanish Association for Standardization (UNE)

UNE 20-109 Pt.2-1989 Low voltage control device. Contactors with semiconductors (static contactors)
UNE-EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (Endorsed by AENOR in July of 2016.)
UNE-EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (Endorsed by AENOR in July of 2016.)

CZ-CSN

CSN 35 4102-1997 Low-voltage controlgear Part 2: Semiconductor contactors (solid state contactors)
CSN 34 5910-1986 Gold bonding wire for semiconductor devices
CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices

International Electrotechnical Commission (IEC)

IEC 60158-2:1982 Low-voltage controlgear. Part 2 : Semiconductor contactors (solid state contactors)
IEC 60947-4-3:2020 Low-voltage switchgear and controlgear - Part 4-3: Contactors and motor-starters - Semiconductor controllers and semiconductor contactors for non-motor loads
IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
IEC 62830-6:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices

European Committee for Standardization (CEN)

HD 419.2 S1-1987 Low-voltage controlgear; part 2: semiconductor contactors (solid state contactors)

British Standards Institution (BSI)

BS 5424-2:1987(1999) Low - voltage controlgear — Part 2 : Specification for semiconductor contactors (solid state contactors)
BS EN 62779-2:2016 Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
18/30375223 DC BS EN 60947-4-3. Low-voltage switchgear and controlgear. Part 4-3. Contactors and motor-starters. Semiconductor controllers and semiconductor contactors for non-motor loads
18/30383448 DC BS EN 60947-4-3. Low-voltage switchgear and controlgear. Part 4-3. Contactors and motor-starters. Semiconductor controllers and semiconductor contactors for non-motor loads
BS IEC 62779-4:2020 Semiconductor devices. Semiconductor interface for human body communication - Capsule endoscope
18/30363340 DC BS IEC 62779-4. Semiconductor devices. Semiconductor interface for human body communication. Part 4. Semiconductor interface for capsule endoscopy using human body communication
BS EN IEC 62969-1:2018 Semiconductor devices. Semiconductor interface for automotive vehicles. General requirements of power interface for automotive vehicle sensors
BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
BS EN IEC 62969-4:2018 Semiconductor devices. Semiconductor interface for automotive vehicles. Evaluation method of data interface for automotive vehicle sensors
BS ISO 27448:2009 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for self-cleaning performance of semiconducting photocatalytic materials - Measurement of water contact angle
BS IEC 62830-6:2019 Semiconductor devices. Semiconductor devices for energy harvesting and generation - Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices

RU-GOST R

GOST R 50471-1993 Semiconductor photoemitters. Measuring method for halfintensity angle

German Institute for Standardization

DIN 50445:1992 Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers
DIN 50448:1998 Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe
DIN EN 153000:1999-01 Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval); German version EN 153000:1998
DIN 50441-2:1998 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 2: Testing of edge profile

European Committee for Electrotechnical Standardization（CENELEC）

FprEN IEC 60947-4-3:2020 Low-voltage switchgear and controlgear - Part 4-3: Contactors and motor-starters - Semiconductor controllers and semiconductor contactors for non-motor loads
EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances

SCC

12/30261676 DC BS EN 62779-2. Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
12/30258683 DC BS EN 62779-1. Semiconductor devices. Semiconductor interface for human body communication. General requirements
CEI EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication Part 2: Characterization of interfacing performances
DANSK DS/EN 153000:1999 General specification: Discrete pressure contact power semiconductor devices (Qualification approval)
CEI EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication Part 1: General requirements

Danish Standards Foundation

DS/EN 153000:1999 General specification: Discrete pressure contact power semiconductor devices (Qualification approval)

KR-KS

KS C 3134-2008(2023) Contact conductors with insulating covers

Korean Agency for Technology and Standards (KATS)

KS C 3134-2023 Contact conductors with insulating covers
KS L ISO 27448-2021 Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for self-cleaning performance of semiconducting photocatalytic materials－Measurement of water contact angle
KS C 3134-2008(2018) Contact conductors with insulating covers
KS L ISO 27448-2011(2016) Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for self-cleaning performance of semiconducting photocatalytic materials－Measurement of water contact angle
KS L ISO 27448-2011(2021) Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for self-cleaning performance of semiconducting photocatalytic materials－Measurement of water contact angle
KS B 2024-2016 Angular contact ball bearings
KS B 2024-2021 Angular contact ball bearings
KS B 2024-1986 Angular contact ball bearings
KS B 2024-2016(2021) Angular contact ball bearings

GSO

GSO IEC 62779-2:2021 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
GSO IEC 62779-1:2021 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
BH GSO IEC 62779-1:2022 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements

Association Francaise de Normalisation

NF C96-779-2*NF EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2 : characterization of interfacing performances
NF EN 62779-2:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 2 : caractérisation des performances d'interfaçage
NF EN 62779-1:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 1 : exigences générales

Defense Logistics Agency

DLA DSCC-DWG-04015-2004 CONNECTOR, RECEPTACLE, ELECTRICAL, SERIES BMZ, PIN CONTACT, RIGHT ANGLE, FOR SEMIRIGID CABLE
DLA SMD-5962-96813 REV A-2007 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, HEX INVERTER SCHMITT TRIGGER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

Standard Association of Australia （SAA）

AS 1029.2:1982 Low voltage contactors - Semiconductor (solid state) (up to and including 1000 V a.c. and 1500 V d.c.)
AS 60146.2:2001/Amdt 1:2001 Semiconductor converters Self-commutated semiconductor converters include direct-to-dc converters
AS 60146.2:2001(R2013) Semiconductor converters Self-commutated semiconductor converters include direct-to-dc converters

American Society for Testing and Materials (ASTM)

ASTM F673-90(1996)e1 Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage

IEC - International Electrotechnical Commission

IEC 62779-2:2016 Dispositifs à semiconducteurs – Interface à semiconducteurs pour les communications via le corps humain – Partie 2: Caractérisation des performances d'interfa?age (Edition 1.0)
IEC 62779-1:2016 Dispositifs à semiconducteurs – Interface à semiconducteurs pour les communications via le corps humain – Partie 1: Exigences générales (Edition 1.0)

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