Organic semiconductors are unstable
Organic semiconductors are unstable, Total:21 items.
The international standard classification for "Organic semiconductors are unstable" includes: Lubricants, industrial oils and related products .
The Chinese standard classification for "Organic semiconductors are unstable" includes: Technical management , Electrical insulating material and its products , Lubricating oil .
Professional Standard - Electron
- SJ 909-1974 Detail specification for silicon voltage regulator diodes,Type 2CW50~149
- SJ 910-1974 Detail specification for silicon voltage regulator diodes,Type 3DW50~202
Professional Standard - Machinery
- JB/T 7622-1994 Organosilicone Lacquer Intended to Be Used in Power Semiconductor Device Production Process
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 23800-2009 Heat transfer fluids—Determination of thermal stability
Professional Standard - Aerospace
- QJ 259-1977 器件
RU-GOST R
- GOST 18986.21-1978 Reference diodes and stabistors. Method for measuring time drift of working voltage
- GOST 18986.15-1975 Reference diodes. Method of measuring stabilization voltage
- GOST 18986.17-1973 Reference diodes. Method of measuring of temperature coefficient of working voltage
- GOST 18986.7-1973 Semiconductor diodes. Methods for measuring life time
American Society for Testing and Materials (ASTM)
- ASTM D6743-11(2015) Standard Test Method for Thermal Stability of Organic Heat Transfer Fluids
- ASTM D6743-06 Standard Test Method for Thermal Stability of Organic Heat Transfer Fluids
SCC
- AWWA JAW26103 Journal AWWA — Effects of Natural Organic Matter and Calcium on Ozone-Induced Particle Destabilization
- MIL MIL-S-19500/335-1965 SEMICONDUCTOR DEVICE, SILICON, VOLTAGE REFERENCE (TEMPERATURE-STABLE) TYPE 1N430A, 1N430B
- AWWA JAW30318 Journal AWWA — A Mechanistic Study of Ozone-Induced Particle Destabilization
British Standards Institution (BSI)
- BS IEC 63275-1:2022 Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Test method for bias temperature instability
- BS EN 60749-36:2003 Semiconductor devices - Mechanical and climatic test methods - Acceleration, steady state
- BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
International Electrotechnical Commission (IEC)
- IEC 63275-1:2022 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
GSO
- GSO IEC 63275-1:2024 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
Defense Logistics Agency
- DLA MIL-S-19500/335 VALID NOTICE 4-2011 Semiconductor Device, Silicon, Voltage Reference (Temperature- Stable) Type 1N430A, 1N430B
- DLA DSCC-DWG-90025 REV C-2013 SEMICONDUCTOR DEVICE, POWER SWITCHING REGULATOR ASSEMBLY
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