thickness change

thickness change, Total:11 items.

The international standard classification for "thickness change" includes: Semiconducting materials , Testing of metals .

The Chinese standard classification for "thickness change" includes: Semimetal and semiconductor material in general , Metal physical property test method , Compound semiconductor material .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 29507-2013 Test method for measuring flatness, thickness and total thickness vsriation on silicon wafers. Automated non-contact scanning
• GB/T 6618-1995 Test method for thickness and total thickness variation of silicon slices
• GB/T 30869-2014 Test method for thickness and total thickness variation of silicon wafers for solar cell
• GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices
• GB/T 30857-2014 Standard test method for thickness and thickness variation on sapphire substrates
• GB/T 30867-2014 Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers

Japanese Industrial Standards Committee (JISC)

• JIS H 0611:1994 Methods of measurement of thickness, thickness variation and bow for silicon wafer

Korean Agency for Technology and Standards (KATS)

• KS D 0259-2012(2022) Methods of measurement of thickness,thickness variation and bow for silicon wafer
• KS D 0259-2012 Methods of measurement of thickness,thickness variation and bow for silicon wafer

American Society for Testing and Materials (ASTM)

• ASTM F533-96 Standard Test Method for Thickness and Thickness Variation of Silicon Wafers
• ASTM F533-02 Standard Test Method for Thickness and Thickness Variation of Silicon Wafers

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