Silicon wafer flatness SEMI
Silicon wafer flatness SEMI, Total:5 items.
The international standard classification for "Silicon wafer flatness SEMI" includes: Semiconducting materials , Testing of metals , Testing of metals in general .
The Chinese standard classification for "Silicon wafer flatness SEMI" includes: Semimetal and semiconductor material in general , Metal physical property test method , Semimetal and semiconductor material analysis method .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 19922-2005 Standard test methods for measuring site flatness on silicon wafers by noncontact scanning
- GB/T 29507-2013 Test method for measuring flatness, thickness and total thickness vsriation on silicon wafers. Automated non-contact scanning
- GB/T 6621-1995 Test methods for surface flatness of silicon polished slices
- GB/T 32278-2015 Test methods for flatness of monocrystalline silicon carbide wafers
- GB/T 6621-2009 Testing methods for surface flatness of silicon slices
