APEX4 crystallography software

APEX4 crystallography software, Total:234 items.

The international standard classification for "APEX4 crystallography software" includes: Optics and optical measurements , Ophthalmic equipment , Medical equipment , Non-metalliferous minerals , Optical measuring instruments , Piezoelectric and dielectric devices , Software development and system documentation , Semiconductor devices , Transistors , Thyristors .

The Chinese standard classification for "APEX4 crystallography software" includes: Material and component for instrument and meter , Medical optical instrument and endoscope , Ophthalmic and ENT surgical devices , Rubber tube, rubber belt and tape , Artificial lens , Quartz crystal and piezoelectric element , Optical Measurement , Software engineering , Semiconductor triode , Semiconductor discrete devices in general , Power semiconductor device and parts .

Professional Standard - Machinery

JB/T 9395.5-1999 Measuring method for scatter graininess of optical crystal
JB/T 9495.5-1999 Measuring method for scatter graininess of optical crystal
JB/T 9395.3-1999 Measuring method for transmittance of optical crystal
JB/T 9495.1-1999 Optical Crystals
JB/T 9495.3-1999 Measuring method for transmittance of optical crystal
JB/T 9495.6-1999 Measuring method for coefficient of optical absorption of optical crystal
JB/T 9495.7-1999 Measuring method for optical homogeneity of optical crystal
JB/T 9495.1-2015 Optical crystal - Part 1: Technical conditions
JB/T 9495.2-1999 Measuring method for refractive index of optical crystals
JB/T 9495.4-1999 Measuring method for stress-birefringence of optical crystal

Taiwan Provincial Standard of the People's Republic of China

CNS 1996-1978 Stannic Chloride, Crystal (Tin Tetraclrloride Crystals)

Professional Standard - Medicine

YY 0290.10-2009 Intraocular lenses—Part 10:Phakic intraocular lenses
YY 0290.9-2010 Ophthalmic implants—Intraocular lenses—Part 9:Multifocal intraocular lenses
YY/T 0942-2014 Ophthalmic optics―Injection system of intraocular lenses
YY 0290.1-2008 Ophthalmic implants - Intraocular lenses - Part 1: Terminology

Group Standards of the People's Republic of China

T/CPIA 0043-2022 Guidelines for scrapping crystalline silicon photovoltaic modules
T/ZZB 0091-2016 Crystalline silicon terrestrial photovoltaic(PV) modules
T/CESA 1222-2022 Technical specifications of thin film transistor optical fingerprint capture device
T/QGCML 4031-2024 Semiconductor optical wafer
T/SZBX 061-2021 Crystalline silicon photovoltaic module with low degradation
T/CRIA 15002-2021 Chemical resistant fluid hose
T/ZZB 0514-2018 Optical Reflector Film for TFT-LCD Panel Display
T/SHMHZQ 040-2021 Specification of software development process for commercial simulation of computational fluid dynamics
T/CZSBDTHYXH 001-2023 Wafer defects Automatic optical inspection equipment
T/ZPP 020-2022 Specifications of tuning fork crystal resonator
T/SCS 000021-2023 i-line lithography grade calcium fluoride crystal components

未注明发布机构

DIN EN 12115 E:2019-10 Rubber and thermoplastics hoses and hose assemblies for liquid or gaseous chemicals - Specification
DIN EN ISO 9242-110:2006 Software ergonomics and human-computer dialogues

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 7896-2008 Test method for optical grade synthetic quartz crystal
GB/T 15291-1994 Semiconductor devices Part 6 Thyristors
GB/T 4586-1994 Semiconductor devices－Discrete devices－Part 8: Field-effect transistors
GB/T 29421-2012 Vanadate birefringent crystal devices
GB/T 7896-1987 Testing method for optical; Grade synthetic quartz crystal
GB/T 7895-1987 Optical grade synthetic quartz crystal
GB/T 7895-2008 Optical grade synthetic quartz crystal
GB/T 4587-2023 Semiconductor devices—Discrete devices—Part 7:Bipolar transistors
GB/T 11297.12-2012 Test method for extinction ratio of optical crystal
GB/Z 31102-2014 Software engineering―Guide to the software engineering body of knowledge(SWEBOK)
GB/T 22319.7-2015 Measurement of quartz crystal unit parameters―Part 7:Measurement of activity dips of quartz crystal units

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 39865-2021 Method for measuring refractive index of uniaxial optical crystals

Professional Standard - Non-ferrous Metal

YS/T 1655-2023 Chemical vapor deposition of zinc sulfide crystals

Professional Standard - Electron

SJ/T 10639-1995 Quartz crystal unit terms
SJ/T 9570.1-1995 Quality grading standard for quartz crystal units

Military Standard of the People's Republic of China-General Armament Department

GJB 2138/4-2011 Detail specification for type JA500 quartz crystal unit
GJB 2138-1994 General specification for quartz crystal components
GJB 2138A-2015 General specification for quartz crystal components

Hebei Provincial Standard of the People's Republic of China

DB13/T 2255-2015 Crystalline silicon solar all-glass module
DB13/T 1289-2010 Ground-use crystalline silicon solar cell modules

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 22319.9-2018 Measurement of quartz crystal unit parameters—Part 9:Measurement of spurious resonances of piezoelectric crystal units

Ningxia Provincial Standard of the People's Republic of China

DB64/T 1971-2023 Crystalline silicon photovoltaic module recycling specifications

国家食品药品监督管理局

YY/T 0290.1-2008 Ophthalmic implants―Intraocular lenses―Part 1:Terminology

国家药监局

YY/T 0290.1-2021 Ophthalmic optics—Intraocular lenses—Part 1:Terminology

Xinjiang Provincial Standard of the People's Republic of China

DB65/T 3708-2015 Technical conditions for crystalline silicon photovoltaic modules for ground use

Professional Standard - Education

JY 6-1985 Transistor Characteristic Tracer Specifications

United States Navy

NAVY DI-SESS-81520 B VALID NOTICE 1-2006 INSTRUCTIONAL MEDIA DESIGN PACKAGE
NAVY DI-SESS-81520 B-2001 INSTRUCTIONAL MEDIA DESIGN PACKAGE

HU-MSZT

MNOSZ 24165-1952 chemical crystalline carbonate

SCC

AWWA WQTC71506 Improvement in Calcium Carbonate Crystal Growth and Precipitation Kinetics with a New Generation of Chemical Reactor during Water Softening
BS PD CEN ISO/TR 9241-100:2023 Ergonomics of human-system interaction-Overview of ISO 9241 software ergonomic standards
BS PD CEN ISO/TR 9241-100:2011 Ergonomics of human-system interaction-Introduction to standards related to software ergonomics
MIL MIL-S-19500/530-1979 SEMICONDUCTOR DEVICE, TRANSISTOR, SILICON TYPE 2N3906
MIL MIL-S-19500/529-1978 SEMICONDUCTOR DEVICE, TRANSISTOR, SILICON TYPE 2N3904
DANSK DS/ISO/TR 9241-100:2023 Ergonomics of human-system interaction – Part 100: Overview of ISO 9241 software ergonomic standards
MIL MIL-S-19500/288-1964 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON TYPE 2N2377
MIL MIL-S-19500/289-1964 Semiconductor Device, Transistor, PNP, Silicon Type 2N2378
DANSK DS/EN IEC 60122-4:2019 Quartz crystal units of assessed quality – Part 4: Crystal units with thermistors
DANSK DS/CEN ISO/TR 9241-100:2011 Ergonomics of human-system interaction – Part 100: Introduction to standards related to software ergonomics
BS IEC 60747-4-1:2000 Semiconductor devices. Discrete devices-Microwave diodes and transistors. Microwave field effect transistors. Blank detail specification-BDS for microwave field-effect transistors
BS 1000[54]:1972 Universal Decimal Classification. English full edition-Chemistry. Crystallography. Mineralogy
BS PD ISO/TR 9241-100:2010 Ergonomics of human-system interaction. Introduction to standards related to software ergonomics
MIL MIL-S-19500/303-1964 Semiconductor Device, Transistor, Types 2N2631 and 2N2876
MIL MIL-T-13366-1954 TUNGSTEN CARBIDE, CRYSTALLINE (NO S/S DOCUMENT)
MIL MIL-PRF-3098L-2017 Crystal Units, Quartz General Specification for
MIL MIL-PRF-3098K-2010 Crystal Units, Quartz General Specification for
MIL MIL-P-83763-1969 POWER SUPPLY, TRANSISTORIZED (NO S/S DOCUMENT)
BS 6493-1.7:1989 Semiconductor devices. Discrete devices-Recommendations for bipolar transistors
DANSK DS/EN ISO 14915-3:2002 Software ergonomics for multimedia user interfaces – Part 3: Media selection and combination
MIL MIL-S-19500/310-1965 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM TYPE 2N2834 (NO S/S DOCUMENT)
DANSK DS/ISO/IEC TR 19759:2015 Software Engineering – Guide to the software engineering body of knowledge (SWEBOK)
BS 2271-3:1965 Specification for quartz oscillator crystal units-Guide to the use of quartz oscillator crystals
BS IEC 60747-9:1998 Semiconductor devices. Discrete devices-Insulated-gate bipolar transistors (IGBTs)
MIL MIL-S-19500/360-1966 SEMICONDUCTOR DEVICE, TRANSISTOR TYPES 2N2996 AND 2N2997 (NO S/S DOCUMENT)
MIL MIL-S-19500/247-1962 SEMICONDUCTOR DEVICES TRANSISTOR, NPN, SILICON TYPE 2N1493 (NO S/S DOCUMENT)
BS 6493-1.8:1985 Semiconductor devices. Discrete devices-Recommendations for field-effect transistors
MIL MIL-S-19500/163-1961 SEMICONDUCTOR DEVICE TRANSISTOR, NPN, SILICON TYPE 2N1072 (NO S/S DOCUMENT)
AS 2547.1.7:1989 Semiconductor devices, Part 1.7: Discrete devices - Bipolar transistors
DANSK DS/EN ISO 14915-2:2003 Software ergonomics for multimedia user interfaces - Part 2: Multimedia navigation and control
MIL MIL-PRF-370L-2019 HOSE AND HOSE ASSEMBLIES, NONMETALLIC: ELASTOMERIC, LIQUID FUEL
MIL MIL-S-19500/215-1961 SEMICONDUCTOR DEVICE, TRANSISTOR, TYPES 2N1173 AND 2N1174 (NAVY)
MIL MIL-S-19500/340-1965 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH POWER TYPE 2N2079A
MIL MIL-PRF-370K-2017 HOSE AND HOSE ASSEMBLIES, NONMETALLIC: ELASTOMERIC, LIQUID FUEL
SN-CEN ISO/TR 9241-100:2023 Ergonomics of human-system interaction — Part 100: Overview of ISO 9241 software ergonomic standards (ISO/TR 9241-100:2023)
MIL MIL-S-19500/425-1969 SEMICONDUCTOR DEVICE, TRANSISTOR, PN, SILICON, UNIJUNCTION JAN2N5431, AND JANTX2N5431
MIL MIL-S-19500/338-1965 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP GERMANIUM, SWITCHING TYPE 2N3449
MIL MIL-O-55593-1969 OVEN ASSEMBLIES, WITH QUARTZ CRYSTAL UNITS (NO S/S DOCUMENT)
AS 2547.1.8:1986 Semiconductor devices, Part 1.8: Discrete devices - Field-effect transistors
MIL MIL-H-52992-1981 HOSE & HOSE ASSEMBLIES, CHEMICAL (INDUSTRIAL AND FIRE FIGHTING) (NO S/S DOCUMENT)
DANSK DS/EN 60444-8:2017 Measurement of quartz crystal unit parameters – Part 8 : Test fixture for surface mounted quartz crystal units
MIL MIL-S-19500/267-1963 TRANSISTOR, PNP, GERMANIUM TYPE 2N987 (NO S/S DOCUMENT)
BS 6493-1.6:1984 Semiconductor devices. Discrete devices-Recommendations for thyristors

PL-PKN

PN BN 8093-01-1965 Long-lasting sugar products. Crystallized gummy candies. total requirements
PN BN 8093-02-1965 Long-lasting sugar products. Non-crystalline gummies. total requirements
PN T01210-01-1992 Semiconductor devices Discrete devices Bipolar transistors Blank detail specification for case-rated bipolar transistors for low-frequency amplification

British Standards Institution (BSI)

BS EN 12115:2021 Rubber and thermoplastics hoses and hose assemblies for liquid or gaseous chemicals. Specification
PD CEN ISO/TR 9241-100:2023 Ergonomics of human-system interaction. Overview of ISO 9241 software ergonomic standards
BS EN 12115:2011 Rubber and thermoplastics hoses and hose assemblies for liquid or gaseous chemicals. Specification
BS EN 60444-9:2007 Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units
BS EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Crystal units with thermistors
BS IEC 60747-7:2010 Semiconductor devices. Discrete devices. Bipolar transistors
BS IEC 60747-7:2011 Semiconductor devices. Discrete devices. Bipolar transistors
BS EN 62149-8:2014 Fibre optic active components and devices. Performance standards. Seeded reflective semiconductor optical amplifier devices
BS IEC 60747-7:2010+A1:2019 Semiconductor devices. Discrete devices - Bipolar transistors
BS EN 62149-9:2014 Fibre optic active components and devices. Performance standards. Seeded reflective semiconductor optical amplifier transceivers
BS IEC 60747-8:2010+A1:2021 Semiconductor devices. Discrete devices - Field-effect transistors
BS EN 60444-8:2003 Measurement of quartz crystal unit parameters - Test fixture for surface mounted quartz crystal units
BS EN 60444-8:2017 Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
BS EN ISO 14915-2:2003 Software ergonomics for multimedia user interfaces - Multimedia navigation and control
BS EN ISO 14915-3:2002(2003) Software ergonomics for multimedia user interfaces — Part 3 : Media selection and combination
BS EN 60444-7:2004 Measurement of quartz crystal unit parameters - Measurement of activity and frequency dips of quartz crystal units
PD ISO/IEC TR 19759:2016 Software Engineering. Guide to the software engineering body of knowledge (SWEBOK)
BS ISO 12151-6:2009 Connections for hydraulic fluid power and general use - Hose fittings - Hose fittings with ISO 8434-6 60 ° cone ends
BS IEC 60747-4:2007+A1:2017 Semiconductor devices. Discrete devices - Microwave diodes and transistors
BS IEC 60747-9:2019 Semiconductor devices - Discrete devices. Insulated-gate bipolar transistors (IGBTs)
BS IEC 60747-8:2010 Semiconductor devices. Discrete devices. Field-effect transistors
BS EN 120003:1986 Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays

German Institute for Standardization

DIN 52341:1993 Testing of glass; chemical analysis of lead crystal glass and crystal glass
DIN SPEC 33441-100:2010-09*DIN ISO/TR 9241-100:2010-09 Ergonomics of human-system interaction - Part 100: Introduction to standards related to software ergonomics (ISO/TR 9241-100:2010)
DIN EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007
DIN EN 12115:2011 Rubber and thermoplastics hoses and hose assemblies for liquid or gaseous chemicals - Specification; German version EN 12115:2011
DIN EN 12115:2021 Rubber and thermoplastics hoses and hose assemblies for liquid or gaseous chemicals - Specification; German version EN 12115:2021
DIN EN ISO 14915-2:2003-11 Software ergonomics for multimedia user interfaces - Part 2: Multimedia navigation and control (ISO 14915-2:2003); German version EN ISO 14915-2:2003

ANSI - American National Standards Institute

Z80.7-2002 For Ophthalmic Optics - Intraocular Lenses (VC)
Z80.7-2013 Ophthalmic Optics – Intraocular Lenses (VC)
IT4.177-1983 Photography (Chemicals) - Sodium Thiocyanate Crystals and Solution (50%)

Japanese Industrial Standards Committee (JISC)

JIS C 8918:2013 Crystalline photovoltaic (PV) modules
JIS C 8939:1995 Amorphous solar PV modules
JIS C 8918 AMD 1:2005 Crystalline solar PV modules (Amendment 1)
JIS C 8939 AMD 1:2005 Amorphous solar PV modules (Amendment 1)
JIS C 6701:1999 Generic specification of quartz crystal units
JIS C 6701:2007 Generic specification of quartz crystal units
JIS Z 8531-3:2007 Ergonomics -- Software for multimedia user interfaces -- Part 3: Media selection and combination

Korean Agency for Technology and Standards (KATS)

KS C 8531-2005 Crystalline solar cell module
KS C 6504-1987(2017) Ovens for Quartz Crystal Units
KS X ISO/IEC 14764:2009 Information technology-Software engineering-Software life cycle processes-Maintenance
KS C 8531-1995 Crystalline solar cell module
KS C IEC 60444-8-2016(2021) Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
KS C IEC 60444-9-2016(2021) Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
KS C IEC 60444-8-2021 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
KS C IEC 60747-7:2006 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors
KS C IEC 60747-7:2017 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors
KS C IEC 60747-7:2022 Semiconductor devices — Discrete devices — Part 7: Bipolar transistors
KS C IEC 60747-8:2002 Discrete devices－Part 8：Field－effect transistors
KS C IEC 60444-7-2016(2021) Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
KS A ISO 14915-1-2005(2021) Software ergonomics for multimedia user interfaces－Part 1：Design principles and framework
KS C IEC 60747-6:2006 Semiconductor Devices－Discrete devices－Part 6：Thyristors

European Committee for Standardization (CEN)

EN 16643:2016 Rubber and plastics hoses and hose assemblies - Nonbonded fluoroplastic lined (e.g. PTFE) hoses and hose assemblies for liquid and gaseous chemicals - Specification
EN 12115:2011 Rubber and thermoplastics hoses and hose assemblies for liquid or gaseous chemicals - Specification

Association of German Mechanical Engineers

VDI/VDE 5575 Blatt 8-2013 X-ray optical systems - Monochromator crystals

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 BLATT 8-2019 Roentgenoptische Systeme - Monochromatorkristalle
VDI/VDE 5575 BLATT 8-2018 Roentgenoptische Systeme - Monochromatorkristalle
VDI/VDE 5575 Blatt 8-2011 Roentgenoptische Systeme - Monochromatorkristalle

DIN

DIN EN 12115:1999 Rubber and thermoplastics hoses and hose assemblies for liquid or gaseous chemicals - Specification

Defense Logistics Agency

DLA MIL-S-19500/529 VALID NOTICE 4-2011 Semiconductor Device, Transistor, Silicon Type 2N3904
DLA MIL-S-19500/303 VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N2631 and 2N2876
DLA MIL-S-19500/273 A VALID NOTICE 3-2011 Semiconductor Device, Transistor Type Type 2N744
DLA MIL-S-19500/170 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium Type 2N1499A
DLA MIL-S-19500/216 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, NPN, Silicon Type 2N1051
DLA MIL-S-19500/288 VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Silicon Type 2N2377
DLA MIL-S-19500/179 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Silicon Type 2N1234
DLA MIL-S-19500/215 VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N1173 and 2N1174 (Navy)
DLA MIL-S-19500/72 C VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium Types 2N499 and 2N499A
DLA MIL-S-19500/49 C VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, Types 2N464, 2N465, 2N467
DLA MIL-S-19500/425 VALID NOTICE 3-2011 Semiconductor Device, Transistor, PN, Silicon, Unijunction JAN2N5431, and JANTX2N5431
DLA MIL-S-19500/80 E VALID NOTICE 4-2011 Semiconductor Device, Transistor, NPN, Silicon, Low-Power Type 3N35
DLA MIL-S-19500/36 C VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, High-Power Type 2N297A
DLA DSCC-DWG-04030-2005 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH POWER TYPE 2N5926
DLA MIL-S-19500/68 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, Switching Type 2N1120
DLA MIL-S-19500/25 B VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, Low-Power Type 2N240
DLA MIL-S-19500/51 E VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, Low Power Type 2N466
DLA DSCC-DWG-04029-2005 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH POWER TYPE 2N5927
DLA MIL-S-19500/58 D VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, High-Power Type 2N665
DLA MIL-S-19500/330 A VALID NOTICE 4-2011 Semiconductor Device, Transistor PNP, Germanium Types 2N1557A through 2N1560A

YU-JUS

JUS N.R9.073-1986 Piezoelectrlc vibrators. Quartz crystal unlts. Two wire crystal holder outline, type 17
JUS N.R9.069-1986 Piezoelectric vibrators. Quartz crystal units. Two piri crystal holder outline, type 07
JUS N.R9.071-1986 Piezoelectric vibrators. Quartz crystal units. Two mre crystal holder outline, type 18
JUS N.R9.070-1986 Piezoelectric vibrators. Ouartz crystal units. Two pin crystal holder outlfne, type09
JUS N.R9.064-1986 Piezoelectric vibrators. Ctuartz crystal units. Two wire crystal holder outline. Types 11, 14 and 15
JUS N.R9.077-1986 Piezoelectric vibrators. Quartz crystal units. Two wire crystal holder outline, type 20

ESDU - Engineering Sciences Data Unit

TRIBSW-2006 Tribology Series - Software.
AEROSW-2006 Aerodynamics Series - Software.

Association Francaise de Normalisation

NF C93-601/AM1:1976 COMPONENTS FOR ELECTRONIC EQUIPMENT. PIEZOELECTRIC DEVICES. CRYSTAL HOLDERS.
NF C93-621-9*NF EN 60444-9:2014 Measurement of quartz crystal unit parameters - Part 9 : measurement of spurious resonances of piezoelectric crystal units
NF EN ISO 14915-2:2004 Ergonomie des logiciels pour les interfaces utilisateur multimédias - Partie 2 : navigation et contrôle multimédias
NF C96-822:1981 Semiconductor Devices High Power Thyristors
FD CEN ISO/TR 9241-100:2023 Ergonomics of human-system interaction - Part 100: overview of ISO 9241 standards relating to software ergonomics

International Organization for Standardization (ISO)

ISO 11979-8:2006/Amd 1:2011 Ophthalmic implants - Intraocular lenses - Part 8: Fundamental requirements; Amendment 1
ISO 11979-10:2006/Amd 1:2014 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses; Amendment 1

ES-UNE

UNE-CEN ISO/TR 9241-100:2023 Ergonomics of human-system interaction - Part 100: Overview of ISO 9241 software ergonomic standards (ISO/TR 9241-100:2023) (Endorsed by Asociación Española de Normalización in May of 2023.)
UNE-EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (Endorsed by Asociación Española de Normalización in May of 2019.)
UNE-EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units (Endorsed by Asociación Española de Normalización in May of 2017.)

GSO

BH GSO ISO/TR 9241-100:2017 Ergonomics of human-system interaction -- Part 100: Introduction to standards related to software ergonomics
GSO ISO/TR 9241-100:2016 Ergonomics of human-system interaction -- Part 100: Introduction to standards related to software ergonomics
OS GSO ISO/TR 9241-100:2016 Ergonomics of human-system interaction -- Part 100: Introduction to standards related to software ergonomics
OS GSO ISO/IEC TR 19759:2017 Software Engineering -- Guide to the Software Engineering Body of Knowledge (SWEBOK)
GSO ISO/IEC TR 19759:2017 Software Engineering -- Guide to the Software Engineering Body of Knowledge (SWEBOK)
BH GSO IEC 60747-7:2016 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
GSO IEC 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

International Electrotechnical Commission (IEC)

IEC 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
IEC 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
IEC 60747-7:2010 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
IEC 60747-7:2010/AMD1:2019 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
IEC 60747-7:2010+AMD1:2019 CSV Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
IEC 60747-7:2019 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
IEC 60747-8:2010/AMD1:2021 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
IEC 60747-6:2016 Semiconductor devices - Part 6: Thyristors

RO-ASRO

STAS 11079-1978 SILICON, PLANAR, POWER TRANSISTORS FOR AUDIO FREQUENCY APPLICATIONS. General technical requirements for quality.

European Committee for Electrotechnical Standardization（CENELEC）

EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors

GOSTR

GOST R ISO 14915-3-2016 Software ergonomics for multimedia user interfaces. Part 3. Media selection and combination

VDE - VDE Verlag GmbH@ Berlin@ Germany

VDE 0472-621-1983 Testing of cables@ wires and flexible cords; crystallite melting point [VDE Specification]

ZA-SANS

SANS 19759:2007 Software Engineering - Guide to the Software Engineering Body of Knowledge (SWEBOK)

RU-GOST R

GOST R 52038-2003 Ophthalmic implants. Intraocular lenses. Part 2. Optical properties and test methods
GOST 5279-1974 Crystal graphite for foundry purposes. Specifications

Standard Association of Australia （SAA）

AS/NZS ISO/IEC 19759:2007 Software Engineering - Guide to the Software Engineering Body of Knowledge (SWEBOK)

CZ-CSN

CSN 35 8740-1973 Semiconduotor deviees. Transistore. Measurement of saturation voltage

Danish Standards Foundation

DS/ISO/IEC TR 19759:2005 Software Engineering - Guide to the Software Engineering Body of Knowledge (SWEBOK)

Institute of Electrical and Electronics Engineers (IEEE)

IEEE 1002-1987 Taxonomy for software engineering standards

GOST

GOST 25734-1983 Alumina. Method for the crystallooptic determination of monocrystals in non metallurgical alumina

KR-KS

KS C IEC 60747-7-2017 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors
KS C IEC 60747-7-2022 Semiconductor devices — Discrete devices — Part 7: Bipolar transistors
KS C IEC 60444-8-2016 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units

TH-TISI

TIS 1864-2009 Semiconductor devices.part 7: bipolar transistors
TIS 2121-2002 Semiconductor devices.discrete devices.part 8: field.effect transistors

Others: