GB/T 4586-1994 in English

VALID

Semiconductor devices－Discrete devices－Part 8: Field-effect transistors

Issued on:1994-12-31
Implemented on:1995-08-01
File Format:PDF
Delivery:Via email within 1~3 business days

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Standard No:	GB/T 4586-1994
Document status:	VALID
Title in English:	Semiconductor devices－Discrete devices－Part 8: Field-effect transistors
Title in Chinese:	半导体器件分立器件第8部分:场效应晶体管
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1994-12-31
Implemented on:	1995-08-01
Superseding:	GB 4586-1984 Measuring methods for field-effect transistors
ICS Classification:	31.080-Semiconductor devices
Chinese Classification:	L42-Semiconductor triode
Professional Classification:	GB-National Standard
Related Keywords:	semiconductor devices discrete devices field-effect transistors semiconductor integrated circuits part basic information
Related Topics:	field effect field effect transistor field effect transistor capacitive field effect transistor FET pb field effect GB/T 4586 photoelectric field effect GB 4586 effect transistor Hafnium Oxide Field Effect Transistor Transistor tester discrete device discrete device Oriental Hafnium Oxide Field Effect Transistor field effect transistor planar long-lived transistor dark field semiconductor Testing of Discrete Devices phase field crystal Super Junction Field Effect Transistor GBT4586 Semiconductor device effect-oriented analysis ICPms matrix effect APEX4 crystallography software Semiconductor Devices Discrete Devices Part 8-2: Superjunction Metal Oxide Semiconductor Field Effect Transistor Blank Details ferroelectric field effect transistor Semiconductor Discrete Devices International Semiconductor company file classification Semiconductor device response time gb/t 4586-94

《GB/T 4586-1994半导体器件分立器件第8部分:场效应晶体管》由TC78（全国半导体器件标准化技术委员会）归口，主管部门为工业和信息化部（电子）。
本标准等同采用IEC 747-8-1984《半导体器件分立器件第8部分：场效应晶体管》及其IEC 747-8第1次更改（1991）。本标准给出了下列类型场效应晶体管的标准：--A型：结栅型；--B型：绝缘栅耗尽型；--C型：绝缘栅增强型。

Scope

Generally, this standard needs to be used together with IEC 747-1-1983 "Semiconductor Devices Discrete Devices and Integrated Circuits Part 1: General Rules". In IEC 747-1, you can find all the basic information of the following: --Terms; --Letter symbols; --Basic ratings and characteristics; --Test methods;

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