Warpage standard sheet

Warpage standard sheet, Total:6 items.

The international standard classification for "Warpage standard sheet" includes: Testing of metals , Other methods of testing of metals , Semiconducting materials .

The Chinese standard classification for "Warpage standard sheet" includes: Metal physical property test method , Elemental semiconductor material .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 6620-2009 Test method for measuring warp on silicon slices by noncontact scanning
• GB/T 30859-2014 Test method for warp and waviness of silicon wafers for solar cells
• GB/T 32280-2015 Test method for warp of silicon wafers—Automated non-contact scanning method
• GB/T 31352-2014 Test methods for warp of sapphire substrates
• GB/T 6620-1995 Test method for measuring warp on silicon slices by noncontact scanning

国家市场监督管理总局、中国国家标准化管理委员会

• GB/T 32280-2022 Test method for warp and bow of silicon wafers—Automated non-contact scanning method

Others: