Four-probe method for testing resistivity
Four-probe method for testing resistivity, Total:27 items.
The international standard classification for "Four-probe method for testing resistivity" includes: Testing of metals , Carbon materials , Electricity. Magnetism. Electrical and magnetic measurements , Chemical analysis of metals , Other methods of testing of metals , Semiconducting materials .
The Chinese standard classification for "Four-probe method for testing resistivity" includes: Metal physical property test method , Oxide and elementary substance , Radio Measurement , Semimetal and semiconductor material analysis method , Semimetal and semiconductor material in general , Technical management .
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 39978-2021 Nanotechnology—Resistivity of carbon nanotube powder—Four probe method
- GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
National Metrological Verification Regulations of the People's Republic of China
- JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method
- JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method
Group Standards of the People's Republic of China
- T/CSTM 00252-2020 Test method for carbon fiber electrical resistivity by Four-probe method
- T/CASAS 019-2021 Test method for resistivity of micro and nano metal sintered compact: four probe method
- T/ZGIA 001-2019 Graphene test method for the determination of powder conductivity four-probe method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
- GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
- GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe
- GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
Professional Standard - Electron
- SJ/T 10314-1992 Generic specification of resistivity measuring instrument with four-point probe
Professional Standard - Non-ferrous Metal
- YS/T 602-2007 Test method for resistivity of zone-refined germanium ingot using a two-point probe
- YS/T 602-2017 Test method for resistivity of zone-refined germanium ingot using a two-point probe
Korean Agency for Technology and Standards (KATS)
- KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
- KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS L 1619-2013(2018) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
- KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS D 0260-1989(1994) TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
- KS L 1619-2023 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
- KS C 0256-2002(2017) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
Japanese Industrial Standards Committee (JISC)
- JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
- JIS H 0602:1995 Testing method of resistivity for silicon crystals and silicon wafers with four-point probe
- JIS K 7194:1994 Testing method for resistivity of conductive plastics with a four-point probe array
- JIS R 1637:1998 Test method for resistivity of conductive fine ceramic thin films with a four-point probe array
KR-KS
- KS L 1619-2013(2023) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
RU-GOST R
- GOST 24392-1980 Monocrystalline silicon and germanium. Measurement of the electrical resistivity by the four-probe method
