Semiconductor equipment testing

Semiconductor equipment testing, Total:148 items.

The international standard classification for "Semiconductor equipment testing" includes: Plug-and-socket devices. Connectors , Electrical equipment of ships and of marine structures , Optoelectronics. Laser equipment , Therapy equipment .

The Chinese standard classification for "Semiconductor equipment testing" includes: Connector , Electrical, observation/communication and navigation equipment for vessel in general , Dedicated processing equipment , Telephone communication equipment , Power semiconductor device and parts , Thermal Measurement , Laser device .

Group Standards of the People's Republic of China

T/CIE 120-2021 Semiconductor Integrated Circuit Hardware Trojan Horse Detection Method
T/ZZB Q041-2022 Mixed signal semiconductor device test equipment
T/ZZB Q063-2022 Intermittent working life test equipment for semiconductor devices
T/IAWBS 019-2023 Equipment front end module
T/ZACA 041-2022 Mixed signal semiconductor device test equipment
T/SZBSIA 007-2022 Semiconductor die bonder test specification
T/CASME 929-2023 Technical requirements for precision structural components of semiconductor equipment
T/ZAQ 10113-2022 Intermittent working life test equipment for semiconductor devices
T/ZSA 224-2024 Equipment front end module
T/CI 334-2024 Design and technical requirements for isolation systems in semiconductor equipments
T/GVS 014-2024 Evaluation specification for cryogenic vacuum pumps used in semiconductor equipment
T/CZSBDTHYXH 001-2023 Wafer defects Automatic optical inspection equipment

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 15872-2013 Power supply interface for semiconductor equipment
GB/T 15872-1995 Power supply interface for semiconductor equipment
GB/T 44375-2024 Requirements for load ports of 300mm semiconductor equipment
GB 10292-1988 Semiconductor rectifier equipments for telecommunicat-ions
GB/T 22193-2008 Electrical installations in ships - Equipment - Semiconductor convertors

Professional Standard - Post and Telecommunication

YD 576-1992 Semiconductor rectifier equipments For telecommunications
YD/T 940-1999 Semiconductor arrester for The over-voltage protection of telecommunications installations

Professional Standard - Medicine

YY/T 0998-2015 Semiconductor heating and/or cooling therapy equipment

国家质量监督检验检疫总局

SN/T 3480.4-2016 Technical requirements for the inspection of complete set of equipment in electronic and electrical industry for import--Part4:Semiconductor package and final test equipment

Professional Standard - Machinery

JB/T 4219-1999 Type Designation of Measuring Equipments for Power Semiconductor Devices

工业和信息化部

SJ/T 11762-2020 Requirements for semiconductor equipment manufacturing information tagging
SJ/T 11763-2020 Specification for human interface for semiconductor manufacturing equipment

National Metrological Verification Regulations of the People's Republic of China

JJG 363-1984 Semiconductor Themistor Themometer

Taiwan Provincial Standard of the People's Republic of China

CNS 11900-1987 Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor)

National Metrological Technical Specifications of the People's Republic of China

JJF 1895-2021 Calibration Specification for Semiconductor Devices DC and Low Frequency Parameters Test Equipments

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 36005-2018 Measuring methods of optical radiation safety for semiconductor lighting equipments and systems

SE-SIS

SIS SS-IEC 747:1991 Semiconductor devices — Discrete devices
SIS SEN 01 03 51-1976 Semiconductor devices Terminology
SIS SEN 01 03 51-1966 Semiconductor devices Terminology
SIS SS-IEC 748:1991 Semiconductor devices — Integrated circuits
SIS SS-IEC 749:1991 Semiconductor devices - Mechanical and climatic test methods
SIS SEN 27 06-1962 Polycrystalline semiconductor rectifier stacks and equipments
SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers

Defense Logistics Agency

DLA MIL-DTL-19491 H-2002 SEMICONDUCTOR DEVICES, PACKAGING OF
DLA MIL-S-19500/173 A VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N389 and 2N424 (Navy)

CZ-CSN

CSN 35 8720 Cast.1-1987 Semiconductor devices. Dimensions
CSN 35 8754-1973 Semiconductor devices. Transistors. Measurement of short-circuit output admittance
CSN 35 8756-1973 Semiconductor devices. Transistors Measurement of y-parameters
CSN 35 8742-1973 Semiconductor devices. Transistors. Measurement of cut-oíf currents
CSN IEC 749:1994 Semiconductor devices.Mechanical and climatic test methods
CSN 35 8759-1977 Semiconductor devices. Transistors. Methods of measurement of switching times
CSN 35 8737-1975 Semiconductor devices. Diodes. Measurement of differential rosistanoe
CSN 35 8749-1973 Semiconductor devices. Transistors. Measurement of absolute value of short-circuit forward transfer admittance
CSN 35 8797 Cast.8 IEC 747-8 ZA1+A2:1996 Semiconductor devices. Discrete devices. Part 8: Field-effect transistore
CSN 35 8731-1975 Semiconductor devices. Diodes Measurement of d. c. forward voltage
CSN 35 8763-1973 Semiconductor devices. Diodes. Measurement o? reverse breakdown voltage
CSN 35 8752-1976 Semiconductor devices. Transistors. Measuring methods for common base output capacitance.
CSN 34 0415-1973 Screwless terminals for connecting copper of eonductors
CSN 35 8761-1973 Semiconductor devices. Phototransistors photodíodes. Measurement of photoelectric current
CSN 35 8762-1973 Semiconductor devices. Phototransistors photodiodes. Measurement of dark current
CSN 35 8785-1975 Semiconductor devices. Varicaps. Measurement of thermal capacitance coefflcient.
CSN IEC 92-304:1993 Electrical installations in ships. Equipment. Semiconductor convertors
CSN 35 8764-1976 Semicoaductor devices. Switching diodes. Measurement o? reverse recovery time.
CSN 35 8765-1976 Semiconductor devices. Switching diodes. Measurement of reverse recovery charge.
CSN 35 8733-1975 Semiconductor devices. Diodes. Measurement of reverse voltago (working voltago)
CSN IEC 748-1:1993 Semiconductor devices. Integrated circuits. Part 1: General

BE-NBN

NBN C 95-001-1977 Semiconductor equipment. the term

British Standards Institution (BSI)

BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
BS EN IEC 63364-1:2022 Semiconductor devices. Semiconductor devices for IoT system - Test method of sound variation detection
24/30497113 DC BS EN IEC 63567-1 Semiconductor devices. Performance evaluation of semiconductor processing components and inspection equipment - Part 1. Transmittance evaluation method of EUV pellicle
BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
BS EN 60747-2:2016 Semiconductor devices. Discrete devices. Rectifier diodes
BS IEC 60092-304:2022 Electrical installations in ships. Equipment. Semiconductor converters
BS IEC 60092-304:2002 Electrical installation in ships - Equipment - Semiconductor convertors
BS EN 60204-33:2011 Safety of machinery. Electrical equipment of machines. Requirements for semiconductor fabrication equipment

HU-MSZT

MNOSZ 700-16.lap-1955 Detection of Nickel Content in Semiconductors
MNOSZ 700-18.lap-1956 Detection of chlorine content in semiconductors
MSZ 5380-1970 Inspection of semi-finished products in paper industry. For basic equipment testing

YU-JUS

JUS N.A3.500-1980 Semiconductor devices. Graphical symbols
JUS N.R1.520-1988 Seml?ouductor devices. Preparat ion of draurings

SCC

BS 4417:1969 Specification for semiconductor rectifier equipments
12/30258683 DC BS EN 62779-1. Semiconductor devices. Semiconductor interface for human body communication. General requirements
DANSK DS/IEC 60092-304 ED4:2022 Electrical installations in ships – Part 304: Equipment – Semiconductor converters
BS IEC 60092-304:1980 Electrical installation in ships-Equipment. Semiconductor convertors
DANSK DS/EN IEC 63364-1:2023 Semiconductor devices – Semiconductor devices for IoT system – Part 1: Test method of sound variation detection
CEI EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IoT system Part 1: Test method of sound variation detection
MIL MIL-STD-989-1991 CERTIFICATION REQUIREMENTS FOR JAN SEMICONDUCTOR DEVICES (NO S/S DOCUMENT)
BS IEC 60747-4:2007 Semiconductor devices. Discrete devices. Microwave diodes and transistors

RO-ASRO

STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties
STAS 6360-1974 SEMICONDUCTOR MATERIALS AND DEVICES Terminology
STAS 12124/1-1982 Semiconductor devices BIPOLAR TRANZISTORS Methods for measuring electrical static parameters
SR CEI 748-11-1-1992 Semiconductor devices Integrated circuits Part 11: Section 1: Internai visual examination for semiconductor integrated circuits excluding hybrid circuits
STAS 12124/4-1983 Semiconductor devices FIELD-EFECT TRANZISTORS Methods for measuring electrical static parameters
STAS 12124/3-1983 Semiconductor devices FIFL D-EFFECT TRANZISTORS Methods for measuring electrical static parameters

Electronic Components, Assemblies and Materials Association

ECA CB 5-1969 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
ECA CB 5-1-1971 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices Addendum to CB5

RU-GOST R

GOST R IEC 748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

Korean Agency for Technology and Standards (KATS)

KS C IEC 60204-33-2020 Safety guideline for semiconductor fabrication equipment
KS C IEC 60204-33-2010(2020) Safety guideline for semiconductor fabrication equipment
KS C IEC 62047-5:2015 Semiconductor devices - MEMS devices - Part 5: RF MEMS switches
KS C IEC 60119-2019 Recommendations for polycrystalline semiconductor rectifier stacks and equipments
KS V 8209-2007 Electrical installations in ships Part 304：Equipment－Semiconductor convertors

NEMA - National Electrical Manufacturers Association

NEMA RI 6-1959 ELECTROCHEMICAL PROCESSING SEMICONDUCTOR RECTIFIER EQUIPMENT

Lithuanian Standards Office

LST EN 62417-2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)

GSO

GSO IEC 60333:2009 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

IN-BIS

IS 6619-1972 Safety Specifications for Semiconductor Rectifier Equipment
IS 3136-1965 Polycrystalline Semiconductor Rectifier Equipment Specification
IS 5000 OC.1-1969 Dimensions of Semiconductor Equipment Case Outline OC1
IS 5000 OC.5-1969 Dimensions of Semiconductor Equipment Case Outline OC5
IS 5000 OC.3-1969 Dimensions of Semiconductor Equipment Case Outline OC3
IS 4540-1968 Specification for monocrystalline semiconductor rectifier components and equipment

American National Standards Institute （ANSI)

ANSI/NFPA 318-2011 Standard for the Protection of Semiconductor Fabrication Facilities
ANSI/IEEE 300:1988 Test Procedures for Semiconductor Charged-Particle Detectors

European Committee for Electrotechnical Standardization（CENELEC）

EN 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
EN 62047-5:2012 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
EN 62047-5:2011 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
EN 62047-4:2010 Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS

Standard Association of Australia （SAA）

AS 1054:1973 Electromagnetic interference limits and measurements for semiconductor control devices

Association Francaise de Normalisation

NF EN 62779-1:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 1 : exigences générales
NF EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IDO system - Part 1: Acoustic variation detection test method
NF C63-244-1*NF EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1 : general requirements and specifications
NF C96-779-2*NF EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2 : characterization of interfacing performances
NF C96-005-5*NF EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5 : optoelectronic devices - Photocouplers
NF C96-005-5/A1*NF EN 60747-5-5/A1:2015 Semiconductor devices - Discrete devices - Part 5-5 : optoelectronic devices - Photocouplers

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD30E-2008 Descriptive Designation System for Semiconductor-device Packages
JEDEC JEP104C.01-2003 Reference Guide to Letter Symbols for Semiconductor Devices

Semiconductor Equipment and Materials International (SEMI)

SEMI S22-1110b-2011 SAFETY GUIDELINE FOR THE ELECTRICAL DESIGN OF SEMICONDUCTOR MANUFACTURING EQUIPMENT
SEMI S8-0308-2008 SAFETY GUIDELINES FOR ERGONOMICS ENGINEERING OF SEMICONDUCTOR MANUFACTURING EQUIPMENT
SEMI S6-0707-2007 EHS GUIDELINE FOR EXHAUST VENTILATION OF SEMICONDUCTOR MANUFACTURING EQUIPMENT

International Electrotechnical Commission (IEC)

IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
IEC 60747-5-6:2021 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
IEC 60747-5-6:2016 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

Danish Standards Foundation

DS/EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
DS/EN 62047-5:2011 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
DS/EN 62047-4:2010 Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
DS/EN 62047-9:2011 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS

TR-TSE

TS 2643-1977 Test Procedures For Bemiconductor Detectors For Ionizing Radiation

CH-SNV

VSM 10336.10-1939 Polycrystalline semiconductor. Rules for Rectifier Columns and Equipment
VSM 11105-1971 Standard for the detection and evaluation of insulated conductors in household equipment (SEV Conductor Standard)

IECQ - IEC: Quality Assessment System for Electronic Components

PQC 82-1989 Semiconductors for Use in Electronic Equipment: Sectional Specification: Semiconductor Integrated Circuits Excluding Hybrid Circuits

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

IEEE 216-1960 STANDARDS ON SOLID STATE DEVICES: DEFINITIONS OF SEMICONDUCTOR TERMS

Spanish Association for Standardization (UNE)

UNE 21135-304:1993 ELECTRICAL INSTALLATIONS IN SHIPS. EQUIPMENT. SEMICONDUCTOR CONVERTORS

German Institute for Standardization

DIN EN 62047-20 E:2012-07 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
DIN 50447:1995 Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method
DIN 50445:1992 Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers

PL-PKN

PN T01208-01-1992 Semiconductor devices Bipolar transistors Terminology and letter symbols
PN T01501 ArkusZ4-1973 Semiconductor deyictj Letter symbols of field-effect transistors porameters

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Std 216-1960(R1980) IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms
IEEE Std 216-1960 IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms
IEEE 216*61 IRE 28 S1 IEEE Standards on Solid-State Devices: Definitions of Semiconductor Terms 1960

BELST

STB 2340-2013 Cooling radiators of semiconductor devices. General specifications
STB 2365-2014 Cooling radiators of semiconductor devices. Methods of calculation