GB/T 10592-2008 in English

SUPERSEDED

Specification for low/high temperature test chambers

Issued on:2008-04-11
Implemented on:2008-11-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $240.00
$233.00

Standard No:	GB/T 10592-2008
Document status:	SUPERSEDED
Superseded by:	GB/T 10592-2023 Specifications for high/low temperature testing chambers
Superseded on:	2023-10-01
Title in English:	Specification for low/high temperature test chambers
Title in Chinese:	高低温试验箱技术条件
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2008-04-11
Implemented on:	2008-11-01
Superseding:	GB/T 10592-1989 Specification for low/high temperature test chambers
ICS Classification:	19.040-Environmental testing
Chinese Classification:	N04-Basic standards and general methods
Professional Classification:	GB-National Standard
Related Keywords:	low temperature test chambers low/high temperature test chambers scopethis standard test chambers high temperature low temperature tests
Related Topics:	Low temperature test temperature high and low temperature High temperature test chamber ultra low temperature freezer High and low temperature test chamber High and low temperature test Isothermal experimental conditions High temperature test system combined with low temperature box Plastic high and low temperature test Plastic high and low temperature test Low temperature box parameters test chamber ultra-low temperature refrigerator Chamber Temperature Test Strips Low temperature test chamber Low temperature box parameters Low temperature test chamber high temperature test Low temperature test High-efficiency incubator High pressure test technical conditions Test method of high and low temperature test chamber High temperature test chamber high and low Industrial low temperature box High and low temperature humidity box -100 degree low temperature test box Industrial low temperature box Low temperature test box Low temperature test bench Low temperature assembly box Hesheng high and low temperature test chamber box inspection Low temperature test chamber operation Low temperature test conditions Micro low temperature test chamber Room temperature and high temperature conditions low temperature Rapid high and low temperature test chamber Low temperature assembly box High temperature test box Low temperature test conditions High temperature test + box high temperature test High temperature, low temperature, high temperature and high humidity test Low temperature heating box High temperature aging test box High temperature test furnace Gel high temperature test High temperature test box series High-quality high-temperature test box High temperature and high humidity box High temperature test water Medical low temperature box low temperature refrigerator low temperature refrigerator Low temperature treatment box Low temperature environment box r9 high and low temperature test chamber Low temperature chamber test method Low temperature environment box Laboratory high temperature box High and low temperature test chamber High temperature box exhaust Coal high temperature box Freezer installation Cryogenic Testing Technology Freezer installation High and low test chamber Cryobox Validation High and low temperature environment box High temperature vacuum box Principle of low temperature box High and low temperature test Casing low temperature test Principle of low temperature box Cryobox accessories Uses of Cryogenic Technology High temperature test box Low temperature box parameters Hot Air Technology High and low temperature test plastic High and low temperature test High and low temperature test High and low temperature test methods and Micro high and low temperature test chamber Small high and low temperature test chamber High and low temperature test High and low temperature test Temperature test chamber Ultra-low temperature cryogenic technology Cryogenic technology use Low temperature cryogenic box technology Low temperature cryogenic technology Low temperature treatment box Fluorine-free high and low temperature test chamber A high and low temperature test chamber Cryobox Procedures Double 85 test chamber temperature test point High temperature box Temperature box technical conditions Freezer Frosting Ultra-low temperature cryogenic box technology Low temperature test box High and low test chamber high and low temperature test High and low temperature test box Ultra-low temperature cryogenic box technology Cryogenic Engineering Technology Temperature chamber temperature Low temperature box system High and low temperature conditions High and low temperature accessories Wen+ High temperature acceptance High and low temperature series test chamber High-voltage laboratory technical conditions High and low temperature alternating test High and low temperature alternating test chamber GBT10592 GBT10592-1989 GB/T 10592-2008 High and low temperature temperature test chamber High temperature oven Principles of cryo-electron microscopy technology Application of cryogenic technology Nanjing high and low temperature test chamber High temperature and high humidity test chamber inspection list High and low temperature humidity and heat test chamber operation High and low temperature test chamber calibration Low temperature test chamber calibration High and low temperature test High and low temperature impact test chamber calibration High and low temperature alternating test methods High and low temperature testing of plastic products Standard high and low temperature test chamber High and low temperature testing of rubber parts Calibration of high and low temperature and low pressure test chambers High and low temperature test chamber test High and low temperature testing of coatings gb 10592 gb/t 10592 High and low temperature chamber calibration gbt10592-2023 gb/t10592 gb10592 gbt10592 gb/t-10592 gb/t 10592-2023

《GB/T 10592-2008高低温试验箱技术条件》由TC526（全国实验室仪器及设备标准化技术委员会）归口，主管部门为中国机械工业联合会。
本标准代替ＧＢ／Ｔ１０５９２―１９８９《高低温试验箱技术条件》。本标准规定了高低温试验箱相关的术语和定义、使用条件、技术要求、试验方法、检验规则以及标志、包装、贮存。
本标准适用于对电工、电子及其他产品、零部件、材料进行高温或低温试验，以及高低温循环试验的试验箱。本标准与ＧＢ／Ｔ１０５９２―１９８９的主要变化如下：
―――增加了“术语和定义”一章，内容采用ＩＥＣ６００６８-３-５的相关部分；
―――按ＩＥＣ６００６８?３?５的温度波动度的概念，温度波动度指标改为１℃（见５．１）；
―――按ＩＥＣ６００６８?３?５的温度数据记录要求，改为每分钟记录一次数据（见６．３）；
―――按ＩＥＣ６００６８?３?５的升降温速率测试方法修改了升、降温速率测试方法（见６．５）；
―――扩大了使用环境条件中大气压的范围（见４．１）；
―――修改了风速要求（见表１）；
―――修改了安全保护要求，增加了电绝缘强度的要求（见５．３）；
―――增加了升降温速率等级（见表１）；
―――试验条件改在空载条件下进行（见６．２）；
―――增加了温度偏差测量不确定度评定方法及其应用的信息（见附

Scope

This standard specifies the terms and definitions, conditions of use, technical requirements, test methods, inspection rules, signs, packaging, and storage related to high and low temperature test chambers ("test chambers" for short). This standard applies to test chambers for high temperature or low temperature tests and high and low temperature cycle tests for electrical, electronic and other products, parts and materials.

More samples: GB 18306-2015 YD/T 3934-2021 QC/T 942-2021

Sample only — not a preview of GB/T 10592-2008