GB/T 2423.2-2001 in English

《GB/T 2423.2-2001电工电子产品环境试验 第2部分:试验方法 试验B:高温》由TC8（全国电工电子产品环境条件与环境试验标准化技术委员会）归口，主管部门为中国电器工业协会。
本标准叙述的高温试验适用于散热和非散热两类试验样品。对于非散热试验样品，试验Ba和Bb基本上不违背早期发行的标准。本高温试验的目的仅限于确定件、设备或其他产品在高温环境条件下使用或贮存的适应性。本高温试验不能用来评价试验样品的耐温度变化性和在温度变化期间的工作能力。在这种情况下。应当采用试验N:温度变化试验方法。高温试验方法分为:非散热试验样品高温试验:试验Ba:温度突变;试验Bb，温度渐变。散热试验样品高温试验:试验Bc:温度突变;试验Bd:温度渐变。本试验方法通常用于条件试验期间能达到温度稳定的试验样品。试验持续时间是从试验样品温度达到稳定时开始计算。在特殊情况下，如果条件试验期间试验样品达不到温度稳定。则试验持续时间从试验箱(室)达到规定试验温度时开始计算。相关规范应规定:a)试验箱(室)内温度变化速率;b)试验样品放人试验箱(室)的时间;c)试验样品在试验条件下暴露开始的时间;d)试验样品通电或加负载的时间。对于这些情况，相关规范的制定者可根据GB/T2424.1-1989导则选定以上4个参数(包含以上这些情况的修正件在考虑之中)。

Scope

The high temperature test described in this standard is applicable to both heat dissipation and non-heat dissipation test samples. For non-heat dissipation test samples, tests Ba and Bb do not substantially deviate from earlier published standards. The purpose of this high-temperature test is limited to determining the suitability of components, equipment or other products for use or storage under high-temperature environmental conditions. This high temperature test cannot be used to evaluate the resistance of the test sample to temperature changes and the ability to work during temperature changes. In this case, Test N: Temperature change test method should be used. The high-temperature test method is divided into: High-temperature test for non-radiation test samples: - Test Ba: sudden temperature change; - Test Bb: gradual temperature change. Heat dissipation test sample high-temperature test: ——Test Bc: sudden change in temperature; ——Test Bd: gradual temperature change. , this test method is generally used for test samples that achieve temperature stabilization during the conditioning test. The test duration is calculated from the time when the temperature of the test sample has stabilized. In special cases, if the test sample does not reach a stable temperature during the conditional test, the test duration shall be calculated from the time when the test chamber (chamber) reaches the specified test temperature. Relevant specifications should stipulate: a) The rate of temperature change in the test chamber (chamber); b) The time when the test sample is placed in the test chamber (chamber); c) The time when the test sample is exposed to the test conditions; d) The test sample is powered on or load time. For these situations, the makers of the relevant specifications can select the above 4 parameters according to the GB/T 2424.1-1989 guidelines (amendments including the above situations are under consideration).