Measure warpage
Measure warpage, Total:5 items.
The international standard classification for "Measure warpage" includes: Semiconducting materials , Testing of metals , Other methods of testing of metals .
The Chinese standard classification for "Measure warpage" includes: Metal physical property test method , Elemental semiconductor material .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 6620-1995 Test method for measuring warp on silicon slices by noncontact scanning
- GB/T 32280-2015 Test method for warp of silicon wafers—Automated non-contact scanning method
- GB/T 31352-2014 Test methods for warp of sapphire substrates
- GB/T 6620-2009 Test method for measuring warp on silicon slices by noncontact scanning
- GB/T 32280-2022 Test method for warp and bow of silicon wafers—Automated non-contact scanning method
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