crystal structure defect
crystal structure defect, Total:34 items.
The international standard classification for "crystal structure defect" includes: Semiconducting materials , Chemical analysis of metals , Testing of metals in general .
The Chinese standard classification for "crystal structure defect" includes: Semimetal and semiconductor material in general , Metallographic testing method , Technical Management , Basic standards and general methods .
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 8756-2018 Collection of metallographs on defects of germanium crystal
- GB/T 37051-2018 Test method for determination of crystal defect density in PV silicon ingot and wafer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 1979-2001 STANDARD diagrams for macrostructure and defect of structural steels
- GB/T 43612-2023 Collection of metallographs on defects in silicon carbide crystal materials
- GB/T 8756-1988 Collection of metallographs on defects of crystalline germanium
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 35316-2017 Collection of metallographs on defects of sapphire crystal
Professional Standard-Ships
- CB/T 3761-1996 Technical requirements for repairing weld defects of hull structures
Professional Standard - Electron
- SJ/Z 2655-1986 Collection of single crystal Germaninm defects
Group Standards of the People's Republic of China
- T/SCBDIF 002-2023 LCD panel manufacturing process defect detection method
- T/CANSI 13-2019 Technical requirements of hull structure steel welds repair in offshore platform
- T/CZSBDTHYXH 001-2023 Wafer defects Automatic optical inspection equipment
Professional Standard - Aviation
- HB 5461-1990 Defect Type and Test Block of Metallic Honeycomb Cementing Structure
水利部
- SL/T 713-2015 Technical Regulations for Detection of Defects in Hydraulic Concrete Structures
Professional Standard - Water Conservancy
- SL 713-2015 Technical code for defect detection of hydraulic concrete structures
German Institute for Standardization
- DIN 50434:1986 Testing of materials for semiconductor technology; detection of crystal defects in monocrystalline silicon using etching techniques on {111} and {100} surfaces
- DIN 50446:1995 Testing of materials for semiconductor technology - Determination of defect types and defect densities of silicon epitaxial layers
RO-ASRO
- STAS SR ISO 8498:1996 Woven fabrics Description of defects. Vocabulary
Association Francaise de Normalisation
- NF ISO 5618-1:2023 Technical ceramics - Test method for surface defects of GaN crystals - Part 1: classification of defects
- FD CEN/TR 15235:2008 Soudage - Méthodes d'évaluation des défauts dans les constructions métalliques
- FD A89-270*FD CEN/TR 15235:2008 Welding . Methods for assessing imperfections in metallic structures
SCC
- BS PD CEN/TR 15235:2005 Welding. Methods for assessing imperfections in metallic structures
- DANSK DS/CEN/TR 15235:2005 Welding - Methods for assessing imperfections in metallic structures
- SN-CEN/TR 15235:2005 Welding — Methods for assessing imperfections in metallic structures
- AENOR UNE-CEN/TR 15235 IN:2006 Welding - Methods for assessing imperfections in metallic structures.
- BS PD 6493:1991 Guidance on methods for assessing the acceptability of flaws in fusion welded structures
- BS 7910:1999 Guide on methods for assessing the acceptability of flaws in metallic structures
Danish Standards Foundation
- DS/CEN/TR 15235:2005 Welding - Methods for assessing imperfections in metallic structures
AENOR
- UNE-CEN/TR 15235:2006 IN Welding - Methods for assessing imperfections in metallic structures.
European Committee for Standardization (CEN)
- PD CEN/TR 15235:2005 Welding - Methods for assessing imperfections in metallic structures
Korean Agency for Technology and Standards (KATS)
- KS D 0258-2012(2017) Test methods of crystalline defects in silicon by preferential etch techniques
- KS D 0258-2012(2022) Test methods of crystalline defects in silicon by preferential etch techniques
- KS D 0258-2022 Test methods of crystalline defects in silicon by preferential etch techniques
British Standards Institution (BSI)
- BS ISO 5618-1:2023 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects - Classification of defects
International Organization for Standardization (ISO)
- ISO/PRF 5618-1:2023 Fine ceramics (advanced ceramics, advanced technical ceramics) --Test method for GaN crystal surface defects — Part 1: Classification of defects
Structural defects,Crystal structure,sample defect,Phosphorus deficiency,high temperature defect,birth defect,ms defect,ms defect,material crystal structure,cause of defect,carbon defect,design flaw,birth defect,Die casting defects,Oxygen deficiency,defect nature,equipment defect,Regulatory flaws,Defect detection of various metal defects,crystal structure defect
