Ground resistance test potential probe

Ground resistance test potential probe, Total:59 items.

The international standard classification for "Ground resistance test potential probe" includes: Electricity. Magnetism. Electrical and magnetic measurements , Semiconducting materials , Other methods of testing of metals , Electrical engineering in general , Chemical analysis of metals , Measurement of electrical and magnetic quantities , Testing of metals .

The Chinese standard classification for "Ground resistance test potential probe" includes: Radio Measurement , Electromagnetic Measurement , Semimetal and semiconductor material in general , Metal physical property test method , Semimetal and semiconductor material analysis method , Electrical equipment and tool in general , AC/DC electrical instrument recording instrument , Technical management , Technical management .

National Metrological Verification Regulations of the People's Republic of China

JJG 984-2004 Verification Regulation of Earth-Continuity Testers
JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method
JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe
GB/T 17949.1-2000 Guide for measuring earth resistivity, ground impedance and earth surface potentials of a ground system - Part 1: Normal measurements
GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
GB/T 1551-1995 Test method for resistivity of silicon and germanium bars using a two-point probe
GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
GB/T 28030-2011 Earth continuity tester

Professional Standard - Electron

SJ/T 10314-1992 Generic specification of resistivity measuring instrument with four-point probe
SJ/T 10481-1994 Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques

Professional Standard - Non-ferrous Metal

YS/T 602-2017 Test method for resistivity of zone-refined germanium ingot using a two-point probe
YS/T 602-2007 Test method for resistivity of zone-refined germanium ingot using a two-point probe

Professional Standard - Electricity

DL/T 2553-2022 Guide for measuring earth resistivity, ground impedance, and earth surface potentials of power grounding system
DL/T 253-2012 Measurement Method for Earth Resistance,Ground Potential Distribution,Step Voltage and Current Dividing on Earth Electrodes

Taiwan Provincial Standard of the People's Republic of China

CNS 5203-1994 Earth Testers

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method

未注明发布机构

ANSI/EIA 364-25E:2017 TP-25E Probe Damage Test Procedure for Electrical Connectors

Group Standards of the People's Republic of China

T/CSTM 00252-2020 Test method for carbon fiber electrical resistivity by Four-probe method
T/CASAS 019-2021 Test method for resistivity of micro and nano metal sintered compact: four probe method

Professional Standard - Ferrous Metallurgy

YB/T 6166-2024 Graphene film sheet resistance measurement four-probe method

Hebei Provincial Standard of the People's Republic of China

DB13/T 5255-2020 Determination of square resistance of graphene conductive ink by four-probe method

Institute of Electrical and Electronics Engineers (IEEE)

IEEE 81-1983 Guide for measuring earth resistivity, ground impedance, and earth surface potentials of a ground system
IEEE P81/D11, August 2012 IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
IEEE Std 81-2012 IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
IEEE 81-2012 IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
IEEE P81/D10, March, 2012 IEEE Draft Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
IEEE P81 IEEE Draft Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
IEEE P81/D2, December 2023 IEEE Draft Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
IEEE Std 81-1983 IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Ground System Part 1: Normal Measurements
IEEE Std 81-1962 IEEE Recommended Guide for Measuring Ground Resistance and Potential Gradients in the Earth

Society of Automotive Engineers (SAE)

SAE TS351-1-1985 TS351 Test for Electrical Connectors Test Probe Damage

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

IEEE 81-1962 Guide for Measuring Ground Resistance and Potential Gradients in the Earth

Korean Agency for Technology and Standards (KATS)

KS L 1619-2013(2018) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
KS L 1619-2023 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
KS D 0260-1989(1994) TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
KS L 1619-2003 Test methods for measuring resistivity of electrically conductive ceramic thin films with four point probe method
KS L 1619-2013 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
KS C 0256-2002(2017) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe

KR-KS

KS L 1619-2013(2023) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array

American Society for Testing and Materials (ASTM)

ASTM B667-97(2009) Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
ASTM B667-97(2014) Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
ASTM B667-97(2019) Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
ASTM F397-93(1999) Standard Test Method for Resistivity of Silicon Bars Using a Two-Point Probe
ASTM B667-97(2003)e1 Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance

ECIA - Electronic Components Industry Association

RS-364-25A-1983 TP-25A Probe Damage Test Procedure for Electrical Connectors

RU-GOST R

GOST 24392-1980 Monocrystalline silicon and germanium. Measurement of the electrical resistivity by the four-probe method

AENOR

UNE 22613:1986 GEOPHYSICAL TERRESTRIAL PROSPECTING. RESISTIVITY METHOD. VERTICAL ELECTRIC SOUNDINGS.

American National Standards Institute （ANSI)

ANSI/EIA 364-25C:1998 Electric Connectors – Probe Damage Test Procedure
ANSI/EIA 364-25D:2010 Probe Damage Test Procedure for Electrical Connectors

Japanese Industrial Standards Committee (JISC)

JIS K 7194:1994 Testing method for resistivity of conductive plastics with a four-point probe array
JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
JIS H 0602:1995 Testing method of resistivity for silicon crystals and silicon wafers with four-point probe

IEC - International Electrotechnical Commission

PAS 62203-2000 Guide for Standard Probe Pad Sizes and Layouts for Water-Level Electrical Testing (Edition 1.0)

ES-AENOR

UNE 22-613-1986 Geophysical survey. Resistivity method. Vertical electrical detection

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