Mass spectrometer ionization method

Mass spectrometer ionization method, Total:96 items.

The international standard classification for "Mass spectrometer ionization method" includes: Chemical analysis , Other standards related to optics and optical measurements , Chemical reagents , Measuring instruments , Chemical laboratories. Laboratory equipment , Semiconducting materials , Other non-ferrous metals and their alloys , Laboratory medicine .

The Chinese standard classification for "Mass spectrometer ionization method" includes: Basic standards and general methods , chromatograph , Chemical reagent in general , Chemical Measurement , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Electrochemical, thermochemistry and optical profile type analyzer , Hygiene, safety and labor protection , Semimetal and semiconductor material in general , Analysis methods for toxic substances in water , Hydrogeological survey , Light metals and their alloys analysis method , Medical laboratory equipment .

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
GB/T 36240-2018 Ion chromatographs
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
GB/T 40798-2021 Chemical analysis method of ion-adsorption rare earth ore—Determination of total rare earth contents—Inductively coupled plasma mass spectrometry
GB/T 39486-2020 Chemical reagent—General rules for inductively coupled plasma mass spectrometry

Professional Standard - Medicine

YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry

National Metrological Technical Specifications of the People's Republic of China

JJF 1159-2006 Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers
JJF 1715-2018 Program of Pattern Evaluation of Ion Chromatographs

Group Standards of the People's Republic of China

T/CIS 17004-2020 Ambient ionization device
T/CIMA 0023-2020 Technical requirements for vehicle-mounted inductively coupled plasma quadrupole mass spectrometer
T/SDZDH 001-2020 Calibration method of portable volatile organic compound hydrogen flame ionization analyzer
T/CAIA YQ006-2018 Performance testing method of Ion chromatography
T/CIMA 0019-2019 Proton transfer reaction mass spectrometers
T/ZJATA 0023-2024 Determination of perchlorate in water Ion chromatography-mass spectrometry/mass spectrometry

工业和信息化部

YS/T 1380-2020 Method for chemical analysis of rhodium compounds. Determination of the chloride ion and nitrate ion contents. Ion chromatography method
YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
SJ/T 11637-2016 General principles of inductively coupled plasma mass spectrometry for electronic chemicals

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34826-2017 Method of performance testing for quadrupole inductively coupled plasma mass spectrometer
GB/T 35925-2018 Determination of impurity fluorine ion in water soluble chemicals—Ion chromatography method

National Metrological Verification Regulations of the People's Republic of China

JJG(地质) 1008-1990 Verification Regulations for Ion Chromatography
JJG 823-1993 Verification Regulation of Ion Chromatograph
JJG 823-2014 Verification regulation for ion chromatograph

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GB/T 36244-2018 Inductively coupled plasma atomic emission spectrometer
GB/T 31197-2014 Inorganic chemicals for industrial use-Determination of impurity anions - Ion chromatography method
GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry
GB/T 25186-2010 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of relative sensitivity factors from ion-implanted reference materials

Professional Standard - Agriculture

JJF 2115-2024 Liquid chromatography-inductively coupled plasma mass spectrometry instrument calibration specification
JJG(教委) 020-1996 Verification Regulations for Ion Chromatography

Professional Standard - Environmental Protection

HJ 778-2015 Water quality - Determination of iodide - Ion chromatiography
HJ/T 84-2001 Water quality -- Determination of inorangic anions -- Ion chromatography method

Professional Standard - Geology

DZ/T 0064.51-1993 Groundwater quality test methods - the determination of chloridion, fluorinion, bromide ion, nitrate radical and sulfate radical with ion chromatography method

Professional Standard - Non-ferrous Metal

YS/T 742-2010 Methods for chemical analysis of gallium oxide Determination of impurities Inductively coupled plasma mass spectrometer method

国家药监局

YY/T 1740.2-2021 Clinical mass spectrometer—Part 2:Matrix-assisted laser desorption ionization-time of flight mass spectrometer

Jiangxi Provincial Standard of the People's Republic of China

DB36/T 1839-2023 Determination of iodide in water quality by inductively coupled plasma mass spectrometry

International Organization for Standardization (ISO)

ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

GSO

GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
OS GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
BH GSO ISO 22048:2016 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
BH GSO ISO 12010:2016 Water quality -- Determination of short-chain polychlorinated alkanes (SCCPs) in water -- Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
BH GSO ISO 23830:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GSO ISO 26062:2013 Nuclear technology -- Nuclear fuels -- Procedures for the measurement of elemental impurities in uranium- and plutonium-based materials by inductively coupled plasma mass spectrometry
GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

British Standards Institution (BSI)

BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry
BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers

Japanese Industrial Standards Committee (JISC)

JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
JIS K 0127:1992 General rules for ion chromatographic analysis
JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon

SCC

10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
NS-EN ISO 12010:2019 Water quality — Determination of short-chain polychlorinated alkanes (SCCP) in water — Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019)
NS-EN ISO 12010:2014 Water quality — Determination of short-chain polychlorinated alkanes (SCCPs) in water — Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2012)
BS EN ISO 12010:2014 Water quality. Determination of short-chain polychlorinated alkanes (SCCPs) in water. Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)

Korean Agency for Technology and Standards (KATS)

KS D ISO 22048-2020 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 22048-2005(2020) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 18114-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS D ISO 18114-2005(2020) Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials

Semiconductor Equipment and Materials International (SEMI)

SEMI F33-0708-2008 TEST METHOD FOR CALIBRATION OF ATMOSPHERIC PRESSURE IONIZATION MASS SPECTROMETER (APIMS)

Standard Association of Australia （SAA）

AS ISO 22048:2006 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
AS ISO 22048:2006(R2016) Surface chemical analysis - Information format for static secondary-ion mass spectrometry

KR-KS

KS I ISO 12010-2014 Water quality — Determination of short-chain polychlorinated alkanes(SCCPs) in water — Method using gas chromatography-mass spectrometry(GC-MS) and negative-ion chemical ionization(NCI)

American Society for Testing and Materials (ASTM)

ASTM D5673-03 Standard Test Method for Elements in Water by Inductively Coupled Plasma8212;Mass Spectrometry
ASTM D5673-05 Standard Test Method for Elements in Water by Inductively Coupled Plasma-Mass Spectrometry
ASTM D5673-96 Standard Test Method for Elements in Water by Inductively Coupled Plasma8212;Mass Spectrometry
ASTM D5673-02 Standard Test Method for Elements in Water by Inductively Coupled Plasma8212;Mass Spectrometry
ASTM F1366-92(1997)e1 Standard Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry
ASTM C1413-05(2011) Standard Test Method for Isotopic Analysis of Hydrolyzed Uranium Hexafluoride and Uranyl Nitrate Solutions by Thermal Ionization Mass Spectrometry

German Institute for Standardization

DIN EN ISO 12010:2019-09 Water quality - Determination of short-chain polychlorinated alkanes (SCCP) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019); German version EN ISO 12010:2019

Association Francaise de Normalisation

NF T90-048*NF EN ISO 14911:1999 Water quality - Determination of dissolved Li+, Na+, NH 4+, K+, Mn 2+, Ca 2+, Mg 2+, Sr 2+ and Ba 2+ using ion chromatography - Method for water and waste water.
NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions

Spanish Association for Standardization (UNE)

UNE-EN ISO 12010:2020 Water quality - Determination of short-chain polychlorinated alkanes (SCCP) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019)

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