Discrete device reliability testing
Discrete device reliability testing, Total:475 items.
The international standard classification for "Discrete device reliability testing" includes: Electronic components in general , Fiber optic interconnecting devices , Measurement of electrical and magnetic quantities , Switches , Quality management and quality assurance , Other electrical accessories , Test conditions and procedures in general , Electrical engineering in general , Relays , Fuses and other overcurrent protection devices , Lamps in general , Road equipment and installations , Equipment for petroleum and natural gas industries in general , Road vehicles in general , Integrated circuits. Microelectronics , Semiconductor devices in general , Internal combustion engines for road vehicles in general , Cranes , Construction equipment , Other standards related to lamps , Watches , Domestic electrical appliances in general , Software development and system documentation , Agricultural tractors and trailed vehicles , Electronic display devices , Domestic refrigerating appliances , Earth-moving machinery , Moulding equipment , Exploratory and extraction equipment , General standards related to shipbuilding and marine structures .
The Chinese standard classification for "Discrete device reliability testing" includes: Reliability and maintainability , Carrier communication equipment , Electronic measurement and equipment in general , Low-voltage distribution electrical equipment , Control circuit apparatus , Control relay , Relay protection and automatic device , Electric light source products , Architectural engineering construction machinery , Petroleum exploration, development, gathering and transportation equipment in general , Basic standards and general methods , Semiconductor discrete devices in general , Motorcycles in general , Engines and accessory devices , Hoisting machinery , Automotive engines in general , Electric lighting in general , Horology , Basic standards and general methods for household appliances , Software engineering , Tractor , Semiconductor emitting device , Household air conditioning and cooling appliances , Reliability , Pump , Basic standards and general methods , Casting equipment , Magnetic measurement instrument , Technical management , Petroleum drilling & production equipment and instrument , Petroleum exploration logging equipment and instrument , Basic standards and general methods , Measurement in general , Dump truck , Truck .
Professional Standard - Nuclear Industry
- EJ/T 436-1989 Nuclear Instrument Reliability Test
Group Standards of the People's Republic of China
- T/SXS 63-2024 Environmental reliability test service specification
- T/CAAMTB 114-2023 Reliability and durability test and evaluation methods for methanol fuel range extenders
- T/CAMDI 153-2025 Reliability test method for cochlear implant sound processor
- T/CIE 144-2022 Reliability enhancement test of semiconductor devices
- T/CECA 38-2020 Reliability test specification of fixed inductors for electronic equipment
- T/GDCKCJH 015-2020 Method for reliability enhancement testing for servomechanism of industrial robot
- T/ZMDS 10010-2019 Reliability Testing and Assessment for Medical Electron Linear Accelerator Part 6: Methods of Accelerated Testing and Fast Assessment of Reliability for Modulator
- T/CIS 03002.1-2020 Reliability of electric system in instrument or equipment -- Enhance test method
- T/SHDSGY 077-2023 Standard for Reliability Testing of Vehicle Power Devices
- T/CAAMTB 100-2022 Reliability test methods and evaluation rules for methanol fuel injectors
- T/GQDA 00005-2021 Accelerated test and reliability index verification method of robot controller
- T/ZMDS 10006-2019 Reliability Testing and Assessment for Medical Electron Linear Accelerator Part 2:Method of Reliability Index Verification for Power Supply of Electron Gun
- T/CEEIA 286-2017 Reliability test method of universal circuit breaker
- T/CECA 100-2024 Reliability test of quartz crystal oscillators for automobiles
- T/SHLED 001-2021 Reliability Test Methods for NB-IoT Single Luminaire Controller
- T/CEA 0033-2022 Test method for reliability of traction machine brake with load
- T/CEEIA 556-2021 Reliability Enhancement Test Method of Robot Control Components
- T/ZPP 042-2023 Overall technical conditions of electronic component reliability test equipment
- T/CAMDI 127-2024 Guidance for reliability design and verification testing of powered stapler
- T/ZSA 47-2020 Reliability test methods for power semiconductor devices in electric vehicle applications
- T/CRSS 0006-2021 Precision reducer reliability test method
- T/GDCKCJH 014-2020 The Reliability Simulation Guide of Servo System for Industry Robot
- T/CSBME 049-2022 Reliability test methods for ultrasonic transducer
- T/ZMDS 10007-2019 Reliability Testing and Assessment for Medical Electron Linear Accelerator Part 3: Method of Reliability Enhancement Testing for Electrical Equipment
- T/CSBME 024-2021 Reliability test methods for ultrasonic diagnostic equipment
- T/CASAS 028-2023 Reliability screening and acceptance method for Sub-6GHz GaN radio-frequency devices
- T/CECA 99-2024 Reliability test of quartz crystal units for automobiles
- T/GDCKCJH 016-2020 Reliability acceleration test specification for industrial robot servo system
- T/CECA 26-2019 Reliability test methods for piezoelectric ceramic electro-acoustic components
Military Standard of the People's Republic of China-General Armament Department
- GJB 546-1988 Reliability Guarantee Outline for Electronic Components
- GJB 128-1986 Aerial photographic specification for military topographic mapping
- GJB 8698.9-2015 Grenade Launcher Test Methods Part 9: Reliability Test
- GJB 522.5-1988 Reliability test method for technical conditions of meteorological information receiving equipment
- GJB 8699.21-2015 Aerial Bomb Test Methods Part 21: Safety and Reliability Test Parachute Deployment Reliability
- GJB 473.8-1988 Reliability test of boat bridge equipment design finalization test procedures
- GJB 349.33-1990 Conventional weapons finalization test method anti-tank missile system reliability test
- GJB 74.7-1985 Reliability test method for general technical conditions of military ground radar
- GJB 403.6-1987 Reliability test method for general technical conditions of shipborne radar
- GJB 128A-1997 Semiconductor discrete device test methods
- GJB 8699.22-2015 Aviation Bomb Test Methods Part 22: Safety and Reliability Test Unpacking Reliability of Aircraft Carrier Bombs
- GJB 1407-1992 reliability growth test
- GJB 899-1990 Reliability Qualification and Acceptance Test Modification Sheet 1-98
- GJB 16-1984 Ground gun aiming radar reliability test method
- GJB 813-1990 General specification for anti-ship-missile semi-armor-piercing warhead
- GJB 570.6-1988 Meteorological instrument finalization test method reliability test
- GJB 899A-2009 Reliability testing for qualification and production acceptance
- GJB 796.8-1990 Reliability test of design and finalization test procedures for military fixed bridge beam equipment
- GJB 128B-2021 Semiconductor discrete device test methods
Professional Standard - Post and Telecommunication
- YD/T 2342-2011 Reliability Test Method for Optoelectronic Devices Used in Telecommunications
- YD/T 2152-2010 The requirement of reliability and test methods for optical fiber connectors
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 10675-1989 Hydraulic excavators--Test methods for reliability
- GB/T 29832.3-2013 Reliability of system and software—Part 3:Testing method
- GB/T 13751-1992 Backhoe loaders-Test methods for reliability
- GB/Z 22074-2008 Reliability test method for moulded case circuit-breakers
- GB 5080.1-1986 Equipment reliability testing General requirements
- GB/T 34434-2017 Household and similar electrical appliances - Accelerating test method for reliability
- GB/Z 22201-2016 Reliability test method for contactor relay
- GB 5080.5-1985 Equipment reliability testing - Compliance test plans for success ratio
- GB 5374-1985 Test method of reliability and durability for motorcycles
- GB/T 12678-2021 Reliability running test method for motor vehicles
- GB 5080.4-1985 Equipment reliability testing--Procedure for point estimates and confidence intervals from reliability determination tests(Exponental distribution)
- GB/Z 45268-2025 Guidelines for principal component reliability testing for LED light sources and LED luminaires
- GB/T 42947-2023 Test methods of reliability for watch movements
- GB/Z 22074-2016 Reliability test method for moulded-case circuit-breakers
- GB/T 8422-1987 Methods of reliability test for vibratory rollers
- GB/Z 22204-2016 Reliability test method for overload relay
- GB 11463-1989 Reliability test for electronic measuring instruments
- GB/T 12678-1990 Reliability Running Test Method for Automobiles
- GB 5080.2 86 Equipment reliability testing Guidance for the design of test cycles
- GB/T 5080.2-2012 Reliability testing - Part 2: Design of test cycles
- GB/T 35218-2017 Tractor reliability―Bench test procedures
- GB/T 19055-2024 Reliability test methods for motor vehicle engines
- GB/T 5080.4-1985 Equipment reliability testing--Procedure for point estimates and confidence intervals from reliability determination tests(Exponential distribution)
- GB/T 4937.30-2018 Semiconductor devices—Mechanical and climatic test methods—Part 30:Preconditioning of non-hermetic surface mount devices prior to reliability testing
- GB/Z 22200-2008 Reliability test method for lower capacity alternating current contactors
- GB/Z 22200-2016 Reliability test method for lower capacity alternating current contactors
- GB/T 17806-1999 Method of reliability test for tower cranes
- GB/T 19055-2003 Reliability test methods for motor vehicle engines
- GB/Z 22201-2008 Reliability test method for contactor relay
- GB/T 11463-1989 Reliability test for electronic measuring instruments
- GB 5080.2-1986 Equipment reliability testing - Guidance for the design of test cycles
- GB/T 7288.1-1987 Equipment reliability testing--Preferred test conditions--Indoor portable equipment--Low degree of simulation
- GB/T 16278-1996 Grader―The method of reliablity test
- GB/T 8508-1987 Pneumatic tyre roller--Test method for reliability
- GB/T 5080.1-2012 Reliability testing - Part 1: Test conditions and statistical test principles
- GB/T 5080.2-1986 Equipment reliability testing--Guidance for the design of test cycles
- GB/T 15510-2008 General rules for reliability test of electromagnetic relay for control circuits
- GB 7288.1-1987 Equipment reliability testing; Preferred test conditions; Indoor portable equipment; Low degree of simulation
- GB/T 28171-2011 Embedded software reliability testing method
- GB/T 5080.1-1986 Equipment reliability testing--General requirements
- GB/T 18910.103-2025 Liquid crystal display devices—Part 10-3:Environmental, endurance and mechanical test methods—Glass strength and reliability
- GB/Z 22204-2008 Reliability test method for overload relay
- GB/T 15510-1995 General rules for reliability test of electromagnetic relay for control circuits
- GB/T 33768-2017 Rfeliability test method for optoelectronic devices used in telecommunications
- GB/T 38341-2019 Micro-electromechanical system technology—The reliability test methods of MEMS in integrated environments
- GB/T 33721-2017 Reliability test methods for LED luminaries
- GB/T 22759-2008 Test methods for reliability of household and similar refrigerating appliances
- GB/T 24262-2009 Environmental tests and reliability for petroleum geophysical exploration instrument
- GB/T 5080.5-1985 Equipment reliability testing--Compliance test plans for success ratio
- GB/T 28878.7-2016 Rotating components for space science experiments - Part 7: Reliability tests
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB 5489.13-2005 Test method of aircraft machine gun Part 13:Reliability
- GJB 6462-2008 Reliability testing for qualification and production acceptance of aircraft gun
- GJB 5496.21-2005 Test method of aerial bomb Part 21:Safe and Reliability Test-Parachute depoyment reliability
- GJB 5495.9-2005 Test method of grenade launcher Part 9:Reliability test
- GJB 5496.22-2005 Test method of aerial bomb Part 22:Safty and Reliability Test-Unpacking reliability of aerial dispenser and bomblet
- GJB 6458.30-2008 Test method of rocket launcher. Part 30: Reliability test
Professional Standard - Aviation
- HB 6158-1988 Classification of Reliability Test Faults
- HB/Z 214.3-1992 Reliability growth test for aviation product
Professional Standard - Machinery
- JB/T 13425-2018 Reliability assessment test methods for thresher
- JB/T 13098-2017 Reliability testing method of electromagnetic relay for machine tool use
- JB/T 12021.4-2014 Reliability test and evaluation for intelligent instrument . Part 4: Reliability test and evaluation for intelligent temperature transmitters
- JB/T 12021.3-2014 Reliability test and evaluation for intelligent instrument . Part 3: Reliability test and evaluation for intelligent pressure transmitter
- JB/T 6882-1993 Pump reliability verification test
- JB/T 13642-2019 Power chucks-Reliability test specification
- JB/T 13813.3-2020 Rolling functional unit reliability and life-Part 3:Liner rolling relibility functional test specification
- JB/T 13644-2019 Rotating hydraulic cylinders-Reliability test specification
- JB/T 54308-1994 AC contactors. Reliability requirement and test method
- JB/T 13820-2020 Chain-type tool changer-Reliability test specifications
- JB/T 11682-2013 Reliability test method for ATSE
- JB/T 12021.2-2014 Reliability test and evaluation for intelligent instrument . Part 2: Reliability test and evaluation for intelligent vortex flowmeter
- JB/T 13824-2020 High-frequency spindles-Reliability test specification
- JB/T 6214-1992 Guideline for Reliability Validation Test and Determination Test (Exponential Distribution) for Instrumentation
- JB/T 56214-1992 Guidelines for instrument reliability verification tests and measurement tests (exponential distribution)
- JB/T 10408-2004 Internal combustion engines - Test method for reliability of exchangers
- JB/T 13819-2020 Disc-type tool changer -Reliability test specifications
- JB/T 10914-2008 Shakeout—Test methods for reliability
- JB/T 13687-2019 Grating encoders-Reliability test method
- JB/T 6881-2006 Pump reliability determining test
- JB/T 6881-1993 Pump reliability test
- JB/T 10711-2007 Reliability test method of moulded case circuit-breakers
- JB/T 6768-1993 Industrial boiler reliability test specifications
- JB/T 10914-2021 Shakeout - Test methods for reliability
- JB/T 10522-2005 Reliability test method for lower capacity alternating current contactors
- JB/T 6882-2006 Pump reliability verification test
- JB/T 14210-2021 Reliability requirements and test methods for machine tool electrical apparatus
- JB/T 56015-2002 Reliablilty index and test method for magnetic auxiliary relay
- JB/T 13646-2019 NC turret-Reliability test specification
- JB/T 10712-2007 Reliability test method of overload relay
- JB/T 10408-2014 Internal Combustion Engines - Heat Exchangers - Reliability Test Method
- JB/T 13827-2020 Mechanical spindle-units-Reliability test specification
- JB/T 6871-1993 Reliability test method of hydraulic universal testing machine
- JB/T 10762-2007 Torque converters - Test methods for reliability
- JB/T 11853-2014 Reliability Requirements and Test Methods of Overhead Projectors
- JB/T 13648-2019 NC table-Reliability test specification
- JB/T 13813.2-2020 Rolling functional unit reliability and life-Part 2:Ball screw relibility functional test specification
- JB/T 5464-1991 Technical Requirement and Test Method for Reliability of Electronic Magnetometer
- JB/T 6214-2014 Guide to the Reliability Compliance Test and Determination Test(Exponential Distribution)of Instrumentation
工业和信息化部
- JBT13687-2019 Grating encoder reliability test method
Professional Standard - Energy and Power Planning
- DL/T 1641-2016 General rules for reliability test of magnetic latching relay
- DL/T 2234-2021 Rules for reliability test of cost-control circuit breaker
Professional Standard - Aerospace
- QJ 1589-1989 Reliability Growth Test
- QJ 932-1985 元件
- QJ 3127-2000 The guidance for reliability growth test of aerospace product
Professional Standard - Electron
- SJ 20496-1995 Reliability requirement and test methods for military communication electro-acoustic transducers
- SJ 2586-1985 Reliability test method for shipborne navigation radar
- SJ/T 11378.7-2015 Plasma display devices Part 7: Reliability test methods for plasma display devices for digital televisions
- SJ/T 10601-1994 Reliability requirement and testing methods for loudspeakers
- SJ 2584-1985 Qualification test and acception test for reliability of radar equipment
- SJ/Z 9110-1987 Equipment reliability testing - Part 4: Procedures for determining point estimates and confidence limits in equipment reliability testing
- SJ 2901-1988 Test methods for reliability of facsimile
Professional Standard - Petroleum
- SY 5099-2007 Environmental Test and Reliability Requirements for Petroleum Logging Instruments
- SY/T 6541-2003 Environmental test and reliability for geophysical exploration instrument
- SY/T 5099-2007 Environmental test and reliability requirements for petroleum well-logging instruments
Professional Standard-Ships
- CB 1379-2005 Failure classification of reliability test for ship products
- CB 20076-2012 Reliability acceptance test of navigation production.MTBF assurance test
Professional Standard - Construction Industry
- JG/T 5062.1-1995 Test method for the reliability of concrete mixer
- JG/T 5040.3-1995 Scraper—The method of reliability test
- JG/T 5013.4-1992 Vibratory plate compactor-Testing method for reliability
- JG/T 5014.4-1992 Vibratory rammer-Testing method for reliability
Professional Standard - Railway
- TB/T 3219-2010 General Rules for Raliability Test on Board Relays and Contactors
Professional Standard - Energy
- SY/T 5099-2024 Petrology logging instrument environmental tests and reliability requirements
Professional Standard - Medicine
- YY/T 0195-1994 Test method for reliability of electrocardiogram machine
National Metrological Technical Specifications of the People's Republic of China
- JJF 1024-2006 Reliability Analysis for Measuring Instruments
Chongqing Provincial Standard of the People's Republic of China
- DB50/T 383-2011 Gasoline Engine Water Pump Reliability Test
Professional Standard - Automobile
- QC/T 76.11-1993 Test methods for mining dump trucks - Use reliability test
- QC/T 525-1999 Reliability of motor vehicle engines - Test method
- QC/T 29037-1991 Reliability driving test method for minivans
Professional Standard - Urban Construction
- CJ/T 91-1999 Vacuum sewer cleaner.Methods of reliability test
Japanese Industrial Standards Committee (JISC)
- JIS C 7210:1977 General rules for reliability assured discrete semiconductor devices
- JIS C 5750-3-5:2006 Dependability management -- Part 3-5: Application guide -- Reliability test conditions and statistical test principles
- JIS C 5750-3-6:2003 Dependability management -- Part 3-6: Application guide -- Software aspects of dependability
- JIS C 5750-4-1:2008 Dependability management -- Part 4-1: Application guide -- Dependability of products containing reused parts -- Requirements for functionality and test
- JIS C 5750-4-2:2008 Dependability management -- Part 4-2: Software dependability through the software life-cycle processes -- Application guide
Defense Logistics Agency
- DLA MIL-PRF-39005/8 C-2008 RESISTORS, FIXED, WIRE-WOUND (ACCURATE), NONESTABLISHED RELIABILITY AND ESTABLISHED RELIABILITY STYLE RBR74
- DLA MIL-PRF-39005/11 C-2008 RESISTORS, FIXED, WIRE-WOUND (ACCURATE), NONESTABLISHED RELIABILITY AND ESTABLISHED RELIABILITY STYLE RBR80 AND RBR81
- DLA MIL-PRF-39035 E (1)-2011 RESISTOR, VARIABLE, NONWIREWOUND (ADJUSTMENT TYPE), NONESTABLISHED RELIABILITY, AND ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
- DLA QPL-28776-2011 RELAYS, HYBRID, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
- DLA MIL-PRF-28776 E SUPP 1-2012 RELAYS, HYBRID, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
- DLA MIL-PRF-28776 D VALID NOTICE 1-2011 Relays, Hybrid, Established Reliability, General Specification for
- DLA QPL-28776-2012 Relays, Hybrid, Established Reliability, General Specification for
- DLA QPL-28776-QPD-2010 Relays, Hybrid, Established Reliability, General Specification for
- DLA QPL-28776-QPD-2011 Relays, Hybrid, Established Reliability, General Specification for
- DLA QPL-20-136-2006 CAPACITOR, FIXED, CERAMIC DIELECTRIC (TEMPERATURE COMPENSATING), ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
Military Standards (MIL-STD)
- MIL MIL-PRF-55365/11C-2011 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability and High Reliability, Styles CWR19 and CWR29
- MIL MIL-PRF-55365/4J-2014 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability, and High Reliability Styles CWR06 and CWR09
- MIL MIL-PRF-55365/8H-2011 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability and High Reliability, Style CWR11 (Metric)
- MIL MIL-PRF-55365/4H-2011 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability, and High Reliability Styles CWR06 and CWR09
- MIL MIL-PRF-55365/8J-2014 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability and High Reliability, Style CWR11 (Metric)
- MIL MIL-PRF-55365/11D-2014 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability and High Reliability, Styles CWR19 and CWR29
- MIL MIL-PRF-55365/8F-2006 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY AND HIGH RELIABILITY, STYLE CWR11 (METRIC)(SUPERSEDING MIL-PRF-55365/8E)
- MIL MIL-PRF-55365/11B-2006 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY AND HIGH RELIABILITY, STYLES CWR19 AND CWR29(SUPERSEDING MIL-PRF-55365/11A)
- MIL MIL-PRF-55365/4G-2006 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY, AND HIGH RELIABILITY STYLES CWR06 AND CWR09(SUPERSEDING MIL-PRF-55365/4F)
- MIL MIL-PRF-39014J-2016 Capacitor, Fixed, Ceramic Dielectric (General Purpose), Established Reliability and Non-Established Reliability, General Specification for
- MIL MIL-PRF-55365/13-2005 PERFORMANCE SPECIFICATION SHEET CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, STYLE CWR16
- MIL MIL-PRF-55365/13A-2011 Capacitors, Chip, Fixed, Tantalum, Polarized, Established Reliability and Nonestablished Reliability, Styles CWR16 and CWR26
- MIL MIL-PRF-55365/13B-2012 Capacitors, Chip, Fixed, Tantalum, Polarized, Established Reliability and Nonestablished Reliability, Styles CWR16 and CWR26
- MIL MIL-PRF-39014H-2010 Capacitor, Fixed, Ceramic Dielectric (General Purpose), Established Reliability and Non-Established Reliability, General Specification for
- MIL MIL-PRF-39001E-2009 CAPACITORS, FIXED, MICA DELECTRIC, ESTABLISHED RELIALBILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-PRF-39001D)
- MIL-PRF-83536H SUP 1 Relays, Electromagnetic, Established Reliability, General Requirements For
- MIL MIL-PRF-55681/12-2016 Capacitor, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR36
- MIL MIL-PRF-55681/13-2016 Capacitor, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR37
- MIL MIL-PRF-55365/12-2003 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, STYLE CWR15 (S/S BY MIL-PRF-55365/12A)
- MIL MIL-PRF-39014G-2005 CAPACITOR, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE), ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-PRF-39014F)
- MIL MIL-PRF-39001D-2004 CAPACITORS, FIXED, MICA DELECTRIC, ESTABLISHED RELIALBILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-PRF-39001C AND MIL-PRF-87164A)
- MIL MIL-PRF-39001C-1997 CAPACITORS, FIXED, MICA DIELECTRIC, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-C-39001/6)
- MIL MIL-PRF-39010E-1997 Coil, Radio Frequency, Fixed, Molded, Established Reliability and Nonestablished Reliability, General Specification for
- MIL MIL-PRF-55365/11-2003 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, STYLES CWR19 AND CWR29 (S/S BY MIL-PRF-55365/11A)
- MIL MIL-R-39017/4D-1980 RESISTORS, FIXED FILM (INSULATED), ESTABLISHED RELIABLITY STYLE RLR42 (NO S/S DOCUMENT)
- MIL MIL-PRF-28776E-2012 Relays, Hybrid, Established Reliability, General Specification for
- MIL MIL-PRF-28776F-2014 Relays, Hybrid, Established Reliability, General Specification for
- MIL MIL-C-55365/9-1990 CAPACITORS, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, STYLE CWR12 ( NO S/S DOCUMENT)
- MIL MIL-PRF-28776H-2017 Relays, Hybrid, Established Reliability, General Specification for
- MIL MIL-PRF-39010/18-2013 Coils, Radio Frequency, Shielded, Molded, Fixed, Surface Mount Established Reliability and Non-Established Reliability
- MIL MIL-PRF-39010/17-2013 Coils, Radio Frequency, Shielded, Molded, Fixed, Surface Mount Established Reliability and Non-Established Reliability
- MIL MIL-PRF-55681/4H-2015 Capacitor, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Styles CDR11, CDR12, CDR13, and CDR14 (High Frequency)
- MIL MIL-PRF-39010/20-2013 Coils, Radio Frequency, Molded, Iron Core, Fixed, Surface Mount Established Reliability and Non-Established Reliability
- MIL MIL-PRF-39010/19-2013 Coils, Radio Frequency, Molded, Phenolic Core, Fixed, Surface Mount Established Reliability and Non-Established Reliability
- MIL MIL-PRF-55681F-2004 CAPACITOR, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY, AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-PRF-55681E)
- MIL MIL-PRF-20K-2003 CAPACITOR, FIXED, CERAMIC DIELECTRIC,(TEMPERATURE COMPENSATING), ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY,GENERAL SPECIFICATION FOR (SUPERSEDING MIL-PRF-20J)
- MIL MIL-PRF-55681/4G-2010 Capacitor, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Styles CDR11, CDR12, CDR13, and CDR14 (High Frequency)
- MIL MIL-R-122/4B-1985 RESISTOR, FIXED, FILM, PRECISION, ESTABLISHED RELIABLITY, STYLE RFP04 (NO S/S DOCUMENT)
- MIL MIL-PRF-55365/12A-2005 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, STYLE CWR15 (SUPERSEDING MIL-PRF-55365/12)(S/S BY MIL-PRF-55365/12B)
- MIL MIL-PRF-39014F-1997 CAPACITOR, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE) ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-C-39014E) (S/S BY MIL-PRF-39014G)
- MIL MIL-PRF-39018E-2004 CAPACITORS, FIXED, ELECTROLYTIC 9ALUMINUM OXIDE), ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-PRF-39018D)(S/S BY MIL-PRF-39018F)
- MIL MIL-STD-790G-2011 Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications
- MIL MIL-PRF-55681/6A-1997 CAPACITOR, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, STYLES CDR11, CDR 12, CDR13 AND CDR14 (HIGH FREQUENCY) (SUPERSEDING MIL-C-55681/6) (NO S/S DOCUMENT)
- MIL MIL-PRF-32085-2001 RELAYS, ELECTROMAGNETIC, 270 V DC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
- MIL MIL-PRF-55182/11F-2020 RESISTORS, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RN*_51 1_/
- MIL MIL-R-39016/56-1993 RELAY, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2.0 AMPERE (NO S/S DOCUMENT)
- MIL MIL-PRF-39014/2L-2004 CAPACITORS, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE)), ESTABLISHED RELIABILTY AND NONESTABLISHED RELIABILITY, STYLE CKR06, NATO TYPE DESIGNATION NCC62 (SUPERSEDING MIL-PRF-39014/2K)
- MIL MIL-R-39035/7A-1975 RESISTORS, VARIABLE, NONWIRE-WOUND (ADJUSTMENT TYPE, LEAD-SCREW ACTUATED), ESTABLISHED RELIABLITY, STYLE RFR32 (NO S/S DOCUMENT)
- MIL MIL-PRF-55365/4F-2003 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELAIBILITY AND NONESTABLISHED RELIABILITY, STYLES CWR06 AND CWR09 (SUPERSEDING MIL-PRF-55365/4E)(S/S BY MIL-PRF-55365/4G)
- MIL MIL-PRF-55365/8E-2003 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, STYLE CWR11 (METRIC) (SUPERSEDING MIL-PRF-55365/8D)(S/S BY MIL-PRF-55365/8F)
- MIL MIL-C-39014/24A-1985 CAPACITOR, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE), ESTABLISHED RELIABILITY STYLE CKR03 (NO S/S DOCUMENT)
- MIL MIL-PRF-39010/15-2013 Coils, Radio Frequency, Open Construction, Ceramic Core, Fixed, Surface Mount Established Reliability and Non-Established Reliability
- MIL MIL-PRF-39010/16-2013 Coils, Radio Frequency, Open Construction, Ferrite Core, Fixed, Surface Mount Established Reliability and Non-Established Reliability
- MIL MIL-R-874/4-1990 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RZR40, 6 PIN SIP (NO S/S DOCUMENT)
- MIL MIL-R-874/14-1992 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RZR41, 6 PIN SIP (NO S/S DOCUMENT)
- MIL MIL-PRF-55365F-2004 CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR (SEE BASE FOR INACTIVATION NOTICE) (SUPERSEDING MIL-PRF-55365E)
- MIL MIL-PRF-55681/5E-2006 CAPACITORS, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, STYLES CDR21, CDR22, CDR23, CDR24, AND CDR25 (HIGH FREQUENCY)(SUPERSEDING MIL-PRF-55681/5D)
- MIL MIL-R-874/8-1990 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RZR80, 8 PIN SIP (NO S/S DOCUMENT)
- MIL MIL-R-874/17-1992 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RZR71, 6 PIN SIP (NO S/S DOCUMENT)
- MIL MIL-R-874/19-1992 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RZR91, 10 PIN SIP (NO S/S DOCUMENT)
- MIL MIL-R-874/15-1992 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RZR51, 8 PIN SIP (NO S/S DOCUMENT)
- MIL MIL-PRF-55681/3D-1997 CAPACITORS, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, STYLE CDR06 (SUPERSEDING MIL-C-55681/3C)(S/S BY MIL-PRF-55681/3E)
- MIL MIL-C-55365/10-1993 CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, STYLES CWR13 AND CWR14 ( NO S/S DOCUMENT)
- MIL MIL-R-874/11-1992 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE, RZR11, 14 PIN DIP (NO S/S DOCUMENT)
- MIL MIL-C-49467/6-1990 CAPACITORS, CERAMIC, MULTILAYER, HIGH VOLTAGE, 10,000 V DC, ESTABLISHED RELIABILITY, STYLE HVR10 (NO S/S DOCUMENT)
- MIL MIL-R-874/2-1990 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RZR20, 16 PIN DIP (NO S/S DOCUMENT)
- MIL MIL-R-39016/58-1993 RELAY, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 2.0 AMPERE (LATCHING) (NO S/S DOCUMENT)
- MIL MIL-PRF-55365/11A-2003 PERFORMANCE SPECIFICATION SHEET CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, STYLES CWR19 AND CWR29 (SUPERSEDING MIL-PRF-55365/11)(S/S BY MIL-PRF-55365/11B)
- MIL MIL-R-874/18-1992 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RZR81, 8 PIN SIP (NO S/S DOCUMENT)
- MIL MIL-R-874/6-1990 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RZR60, 10 PIN SIP (NO S/S DOCUMENT)
- MIL MIL-PRF-32140-2004 PERFORMANCE SPECIFICATION RELAYS, ELECTROMAGNETIC, RADIO FREQUENCY, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
- MIL MIL-PRF-39016F-2002 RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-PRF-39016E)
- MIL MIL-R-874/7-1990 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RZR70, 6 PIN SIP (NO S/S DOCUMENT)
- MIL MIL-R-874/12-1992 RESISTOR NETWORK, FIXED, FILM, ESTABLISHED RELIABILITY, STYLE RZR21, 16 PIN DIP (NO S/S DOCUMENT)
- MIL MIL-PRF-28776D-2002 RELAYS, HYBRID, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-PRF-28776C)
- MIL MIL-PRF-39003/10D-2009 Capacitors, Fixed, Electrolytic (Solid Electrolyte), Tantalum, (Polarized, Sintered Slug), Established Reliability, Styles CSS13 and CSS33 (High Reliability Applications)
- MIL MIL-PRF-55365/7B-1997 CAPACITORS, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, STYLE CWR10 (SUPERSEDING MIL-C-55365/7A) (NO S/S DOCUMENT)
- MIL MIL-C-20/32-1973 CAPACITORS, FIXED, CERAMIC DIELECTRIC (TEMPERATURE COMPENSATING) ESTABLISHED AND NON-ESTABLISHED RELIABILITY, STYLES CCR81 AND CC81 (NO S/S DOCUMENT)
- MIL MIL-PRF-83536G-2019 RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, 25 AMPERES AND BELOW, GENERAL SPECIFICATION FOR
- MIL MIL-PRF-39003/11-2016 Capacitor, Fixed, Electrolytic (Solid Electrolyte), Tantalum (Polarized, Sintered Slug), High Frequency, Established Reliability, Style CSS21 (High Reliability Applications)
- MIL MIL-PRF-55681/2C-1997 CAPACITORS, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, STYLE CDR05 (SUPERSEDING MIL-C-55681/2B)(S/S BY MIL-PRF-55681/2D)
- MIL MIL-PRF-55514/4F-2002 CAPACITORS FIXED METALLIZED PLASTIC DIELECTRIC DC IN NONMETAL CASES ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, STYLES CFR05 AND CFR06 (SUPERSEDING MIL-PRF-55514/4E)
- MIL MIL-PRF-39018/13-1996 CAPACITOR, FIXED, ELECTROLYTIC (ALUMINUM OXIDE) (POLARIZED), ESTABLISHED RELIABILITY, STYLE CUR22 (INSULATED) (NO S/S DOCUMENT)
- MIL MIL-PRF-39010/21-2013 Coils, Radio Frequency, Molded, Ferrite Core, Fixed, Surface Mount Established Reliability and Non-Reliability
- MIL MIL-C-20/34B-1988 CAPACITOR FIXED, CERAMIC DIELECTRIC (TEMPERATURE COMPENSATING), ESTABLISHED AND NON-ESTABLISHED RELIABILITY, STYLES CCR83 AND CC83 (NO S/S DOCUMENT)
- MIL MIL-PRF-83536B-2003 RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, 25 AMPERES AND BELOW, GENERAL SPECIFICATION FOR
- MIL MIL-R-83536-1990 RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, 25 AMPERES AND BELOW, GENERAL SPECIFICATION FOR
- MIL MIL-PRF-55681/10B-1997 CAPACITORS, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, STYLE CDR34, METRIC (SUPERSEDING MIL-C-55681/10A)(S/S BY MIL-PRF-55681/10C)
- MIL MIL-PRF-39018/10C-2019 CAPACITOR, FIXED, ELECTROLYTIC (ALUMINUM OXIDE), (POLARIZED), ESTABLISHED RELIABILITY, STYLE CUR92 (INSULATED)
- MIL MIL-PRF-39016/8J-2016 Relays, Electromagnetic, Established Reliability, SPDT, Low Level to 0.5 Ampere (Latching)
- MIL MIL-PRF-55681/8B-1997 CAPACITORS, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, STYLE CDR32, METRIC (SUPERSEDING MIL-C-55681/8A)(S/S BY MIL-PRF-55681/8C)
- MIL MIL-PRF-39016/45E-2013 Relays, Electromagnetic, Established Reliability, DPDT, Low Level to 2 Amperes (Latching)
U.S. Military Regulations and Norms
- ARMY MIL-PRF-55365/4 H-2011 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY, AND HIGH RELIABILITY STYLES CWR06 AND CWR09
- ARMY MIL-PRF-55365/11 C-2011 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY AND HIGH RELIABILITY, STYLES CWR19 AND CWR29
- ARMY MIL-PRF-55342/8 E (3)-2012 RESISTORS, CHIP, FIXED, FILM, NONESTABLISHED RELIABILITY, ESTABLISHED RELIABILITY, SPACE LEVEL, STYLE RM2010
- ARMY MIL-PRF-39010/20-2013 COILS, RADIO FREQUENCY, MOLDED, IRON CORE, FIXED, SURFACE MOUNT ESTABLISHED RELIABILITY& NON-ESTABLISHED RELIABILITY
- ARMY MIL-PRF-39007/5 J VALID NOTICE 1-2013 Resistor, Fixed, Wire-Wound(Power Type), Nonreliability, Established Reliability, and Space Level Style RWR71
- ARMY MIL-PRF-914/4 B-2008 RESISTOR NETWORK, FIXED, FILM, SURFACE MOUNT, 20-PIN, LEADLESS CHIP CARRIER, NONESTABLISHED RELIABILITY AND ESTABLISHED RELIABILITY, STYLE RNS040
- ARMY MIL-PRF-914/5 B-2008 RESISTOR NETWORK, FIXED, FILM, SURFACE MOUNT, 16-PIN, LEADLESS CHIP CARRIER, NONESTABLISHED RELIABILITY AND ESTABLISHED RELIABILITY, STYLE RNS050
- ARMY MIL-PRF-39010/16-2013 COILS, RADIO FREQUENCY, OPEN CONSTRUCTION, FERRITE CORE, FIXED, SURFACE MOUNT ESTABLISHED RELIABILITY& NON-ESTABLISHED RELIABILITY
CZ-CSN
- CSN 36 7001-1967 Reliability tests of eleotronic instrumenta
- CSN 01 0643-1986 Dependability engineering. Plans of reliability tests. Characteristics
- CSN 35 8001-1971 Electronic components. Reliability testing
- CSN IEC 605-3-4:1994 Equipment reliability testing.Part 3-4:Preferred test conditions for equipment reliability testing.Equipment for portable and non-stationary use-Low degree of simulation
- CSN IEC 1070:1994 Compliance test procedures for steady-state availability
- CSN IEC 1123:1994 Reliability testing. Compliance test plans for success ratio
British Standards Institution (BSI)
- BS 5760-13.2:1993(1999)*IEC 605-3-2:1986 Reliability Test Conditions Guide
- BS IEC 60300-3-5:2001 Dependability management - Application guide - Application guide - Reliability test conditions and statistical test principles
- BS EN 993-15:2005(2010) Reliability test methods for electronic components
- BS 5760-10.1:1993 Reliability of systems, equipment and components. Guide to reliability testing-General requirements
- BS 5760-10.5:1993 Reliability of systems, equipment and components - Guide to reliability testing - Compliance test plans for success ratio
- BS 5760 Sec.10.5:1993 Reliability of systems, equipment and components. Guide to reliability testing. Compliance test plans for success ratio
- BS 5760 Sec.10.3:1993 Reliability of systems, equipment and components. Guide to reliability testing. Compliance test procedures for steady-state availability
- BS ISO 19973-4:2014 Pneumatic fluid power. Assessment of component reliability by testing. Pressure regulators
- BS 5760-13.1:1993 Reliability of systems, equipment and components - Guide to reliability test conditions for consumer equipment - Conditions providing a low degree of simulation for indoor portable equipment
- BS 5760-0:1986 Reliability of systems, equipment and components - Introductory guide to reliability
- BS EN 62309:2004 Dependability of products containing reused parts - Requriements for functionality and tests
- BS 5760-10.3:1993 Reliability of systems, equipment and components. Guide to reliability testing. Compliance test procedures for steady-state availability
- BS 5760-10.2:1995 Reliability of systems, equipment and components. Guide to reliability testing. Design of test cycles
- BS 5760-2:1994 Reliability of systems, equipment and components - Guide to the assessment of reliability
- BS 5760-13.5:1996 Reliability of systems, equipment and components - Guide to reliability test conditions for consumer equipment - Ground mobile equipment - Low degree of simulation
- BS EN 62315-1:2003 DTV profiles for uncompressed digital video interfaces-Part 1:General
- BS PD IEC/TR 62627-03-04:2013 Fibre optic interconnecting devices and passive components-Reliability. Guideline for high power reliability of passive optical components
- PD IEC/TR 62627-03-04:2013 Fibre optic interconnecting devices and passive components. Reliability. Guideline for high power reliability of passive optical components
- BS 5760-0:2014 Reliability of systems, equipment and components. Guide to reliability and maintainability
- BS IEC 61163-2:1998 Reliability stress screening-Electronic components
- BS 5760-13.6:1997 Reliability of systems, equipment and components. Guide to reliability test conditions for consumer equipment-Outdoor transportable equipment. Low degree of simulation
- BS 5760-10.3:1993(1999)*IEC 1070:1991 Reliability of systems, equipment and components — Part 10 : Guide to reliability testing — Section 10.3 Compliance test procedures for steady - state availability
- BS 5760-17:1995 Reliability of systems, equipment and components-Reliability growth. Statistical test and estimation methods
- BS PD IEC TS 62876-2-1:2018 Nanotechnology. Reliability assessment-Nano-enabled photovoltaic devices. Stability test
- BS 5760-18:2010 Reliability of systems, equipment and components - Guide to the demonstration of dependability requirements - The dependability case
- BS 5760-9:1992 Analysis techniques for dependability. Reliability block diagram method
- PD IEC TS 62876-2-1:2018 Nanotechnology. Reliability assessment. Nano-enabled photovoltaic devices. Stability test
- BS IEC 60300-3-6:1997 Dependability management. Application guide - Software aspects of dependability
- 20/30409285 DC BS IEC 63284. Semiconductor devices. Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors
- BS EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- BS 5760-3:1982 Reliability of systems, equipment and components - Guide to reliability practices: examples
- 09/30202368 DC BS 5760-18. Reliability of systems, equipment and components. Part 18. Guide to the demonstration of dependability requirements. The dependability case
- BS 5760-2:1981 Reliability of systems, equipment and components-Guide to the assessment of reliability
- BS 5760-10.1:1993(1999)*IEC 605-1:1978 Reliability of systems, equipment and components — Part 10 : Guide to reliability testing — Section 10.1 General requirements
- BS 5760-17:1995(1999)*IEC 1164:1995 Reliability of systems, equipment and components — Part 17 : Reliability growth : statistical test and estimation methods
GB-REG
- REG NASA-LLIS-0786--2000 Lessons Learned — Independent Review of Reliability Analyses
Gosstandart of Russia
- GOST R 27.403-2009 Dependability in technics. Compliance tests plans for reliability
- GOST R 27.605-2013 Reliability in technique. Maintainability of equipment. Diagnostic testing
- GOST R 27.404-2009 Dependability in technics. Compliance test plans for steady-state availability
- GOST R IEC 62628-2021 Dependability in technics. Guidance on provision of software dependability
- GOST R 27.301-2011 Dependability in technics. Dependability management. Analysis techniques for reliability. General principles
Association of German Mechanical Engineers
- VDI 4009-2022 Reliability tests
- VDI 4009 BLATT 1-1998 Overview of reliability tests
- VDI 4011 E:2019-09 Software reliability
- VDI 4011-2021 Software reliability
- VDI 4009 E:2020-12 Reliability tests
- VDI 4009-2022 Reliability tests
- VDI 4010 Blatt 4-1980 Implementation and use of a reliability data system
- VDI 4010 Blatt 4-1984 Implementation and use of a reliability data system
Korean Agency for Technology and Standards (KATS)
- KS C IEC 62005-2-2002(2017) Reliability of fiber optic interconnecting devices and passive components - Part 2: Quantitative assessment of reliability based on accelerated ageing test - Temperature and humidity, steady state
- KS B 5265-2019 Reliability test method for the calculator of heat meter
- KS B 5265-2024 Reliability test method for the calculator of heat meter
- KS B 5265-2019(2024) Reliability test method for the calculator of heat meter
- KS C IEC 62005-2-2002(2022) Reliability of fiber optic interconnecting devices and passive components-Part 2:Quantitative assessment of reliability based on accelerated ageing test-Temperature and humidity, steady state
- KS C IEC 62005-2-2022 Reliability of fiber optic interconnecting devices and passive components - Part 2: Quantitative assessment of reliability based on accelerated ageing test - Temperature and humidity, steady state
- KS C IEC TS 62876-2-1:2021 Nanotechnology — Reliability Assessment —Part 2-1: Nano-enabled photovoltaic devices — Stability test
- KS C IEC TS 62876-2-1-2021 Nanotechnology — Reliability Assessment —Part 2-1: Nano-enabled photovoltaic devices — Stability test
- KS A IEC 60605-2-2002(2017) Equipment reliability testing - Part 2: Design of test cycles
- KS A IEC 60605-2-2002(2022) Equipment reliability testing - Part 2: Design of test cycles
- KS A IEC 60300-3-5:2003 Dependability management - Part 3: Application guide - Section 5: Reliability test conditions and statistical test principles
- KS A IEC 61078-2002(2017) Analysis techniques for dependability-Reliability block diagram method
- KS A IEC 61078-2002(2022) Analysis techniques for dependability-Reliability block diagram method
- KS A IEC 60605-3-1-2002(2022) Equipment reliability testing - Part 3: Preferred test conditions - Indoor portable equipment - Law degree of simulation
- KS A IEC 61078-2022 Analysis techniques for dependability-Reliability block diagram method
- KS B 6967-2008(2018) Reliability test method for the vacuum valves - Part 2: Gate valves
- KS A IEC 60300-3-6:2004 Dependability management - Part 3 - 6 Application guide Software aspects of dependability
- KS B 6967-2008(2023) Reliability test method for the vacuum valves-Part 2:Gate valves
- KS B 6387-2008(2018) Reliability test method for the vacuum valves-Part 1:Angle valves
- KS B 6387-2008(2023) Reliability test method for the vacuum valves - Part 1: Angle valves
- KS A IEC 60300-3-6-2014(2019) Dependability management — Part 3-6: Application guide — Software aspects of dependability
- KS A IEC 60605-3-1-2002(2017) Equipment reliability testing - Part 3: Preferred test conditions - Indoor portable equipment - Law degree of simulation
- KS A IEC 60605-3-6-2002(2017) Equipment reliability testing-Part 3:Preferred test conditions-Section 6:Test cycle 6:Outdoor transportable equipment-Low degree of simulation
- KS C 6430-2004 General rules for reliability assured electronic components
- KS A IEC 60300-3-6-2014(2024) Dependability management — Part 3-6: Application guide — Software aspects of dependability
- KS A IEC 60300-3-6-2019 Dependability management — Part 3-6: Application guide — Software aspects of dependability
- KS A IEC 60300-3-6:2014 Dependability management — Part 3-6: Application guide — Software aspects of dependability
- KS A IEC 60300-3-5-2003(2023) Reliability Management - Part 3 - Section 5: Application Guidelines - Reliability Test Conditions and Statistical Test Principles
- KS C IEC 62005-3-2002(2017) Reliability of fiber optic interconnecting devices and passive components - Part 3: Relevant tests for evaluating failure modes and failure mechanisms for passive components
International Electrotechnical Commission (IEC)
- IEC PAS 62182:2000 Preconditioning of nonhermetic surface mount devices prior to reliability testing
- IEC 60749-41:2020 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
- IEC TS 62876-2-1:2018 Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test
- IEC 63275-1:2022 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
- IEC 60300-3-5:2001 Dependability management - Part 3-5: Application guide; Reliability test conditions and statistical test principles
- IEC 61123:1991 Reliability testing; compliance test plans for success ratio
- IEC 62005-2:2001 Reliability of fibre optic interconnecting devices and passive components - Part 2: Quantitative assessment of reliability based on accelerated ageing tests; Temperature and humidity; Steady state
- IEC 60749-30:2005+AMD1:2011 CSV Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- IEC 60605-6:1986 Equipment reliability testing. Part 6 : Tests for the validity of a constant failure rate assumption
- IEC PAS 62814:2012 Dependability of software products containing reusable components - Guidance for functionality and tests
- IEC 60749-30:2020 RLV Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- IEC 60605-2:1994 Equipment reliability testing - Part 2: Design of test cycles
- IEC 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- IEC 60605-4:1986 Equipment reliability testing. Part 4 : Procedures for determining point estimates and confidence limits from equipment reliability determination tests
- IEC TR 62627-03-04:2013 Fibre optic interconecting devices and passive components - Part 03-04: Reliability - Guideline on high power reliability of passive optical components
- IEC 60605-1:1978 Equipment reliability testing. Part 1 : General requirements
- IEC 62309:2004 Dependability of products containing reused parts - Requirements for functionality and tests
- IEC 61163-2:1998 Reliability stress screening - Part 2: Electronic components
- IEC 62005-7:2004 Reliability of fibre optic interconnecting devices and passive optical components - Part 7: Life stress modeling
- IEC 61078:1991 Analysis techniques for dependability; reliability block diagram method
German Institute for Standardization
- DIN EN 60749-41 E:2017-04 Mechanical and climatic test methods for semiconductor devices Part 41: Reliability test methods for non-volatile memory components
- DIN EN IEC 63215-2:2021-01 Endurance test methods for die attach materials applied to power electronics devices - Part 2: Temperature cycling test method and reliability performance index for Die attach materials applied to discrete type power electronic devices (IEC 91/1660/CD:...
- DIN EN 62005-2:2002-02 Reliability of fibre optic interconnecting devices and passive components - Part 2: Quantitative assessment of reliability based on accelerated ageing tests; Temperature and humidity; Steady state (IEC 62005-2:2001); German version EN 62005-2:2001
- DIN IEC 61123:1993 Reliability testing; compliance test plans for success ratio; identical with IEC 61123:1991
- DIN EN IEC 60749-41:2023 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020
- DIN EN 62309:2005 Dependability of products containing reused parts - Requirements for functionality and test (IEC 62309:2004); German version EN 62309:2004
- DIN SPEC 15707:2012 Guide for reliable testing of digital cameras
- DIN EN 62005-9-2 E:2011-05 Fiber optic interconnecting devices and passive components reliability Part 9-2: Reliability qualification of single-mode individual fiber optic connector sets
- DIN EN IEC 60749-30:2023 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020
- DIN EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005); German version EN 60749-30:2005
- DIN IEC 60605-3-4:1993 Equipment reliability testing; preferred test conditions; equipment for portable and non-stationary use; low degree of simulation; identical with IEC 60605-3-4:1992
- DIN EN IEC 60300-1:2021-06 Dependability management - Part 1: Enabling dependability (IEC 56/1886/CD:2020); Text in German and English / Note: Date of issue 2021-05-14*Intended as replacement for DIN EN 60300-1 (2015-01).
GCC Standardization Organization
- GSO IEC 62005-2:2014 Reliability of fibre optic interconnecting devices and passive components - Part 2: Quantitative assessment of reliability based on accelerated ageing test - Temperature and humidity; steady state
- GSO IEC 60300-3-5:2015 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles
Swedish Institute for Standards
- SS-EN IEC 60749-41:2020 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
- SS-EN 62059-31-1:2009 Electricity metering equipment - Dependability - Part 31-1: Accelerated reliability testing - Elevated temperature and humidity
- SS-EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- SS-EN IEC 60749-30:2021 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
SE-SIS
- SIS SS IEC 605:1989 Dependability — Equipment reliability testing
European Committee for Electrotechnical Standardization(CENELEC)
- EN 62059-31-1:2008 Electricity metering equipment - Dependability - Part 31-1: Accelerated reliability testing - Elevated temperature and humidity
- EN 62005-2:2001 Reliability of Fibre Optic Interconnecting Devices and Passive Components - Part 2: Quantitative Assessment of Relibility Based on Accelerated Ageing Tests - Temperature and Humidity; Steady State
- EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Incorporates Amendment A1: 2011)
Comitato Elettrotecnico Italiano
- CEI EN 62005-2:2002 Reliability of fibre optic interconnecting devices and passive components - Part 2: Quantitative assessment of reliability based on accelerated ageing tests - Temperature and humidity; steady state
- CEI 56-46:2005 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles
- CEI EN IEC 60300-1:2024 Dependability management - Part 1: Managing dependability
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO IEC 62005-2:2014 Reliability of fibre optic interconnecting devices and passive components - Part 2: Quantitative assessment of reliability based on accelerated ageing test - Temperature and humidity; steady state
- OS GSO IEC 60300-3-5:2015 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles
Danish Standards Foundation
- DANSK DS/EN 62005-2:2001 Reliability of fibre optic interconnecting devices and passive components - Part 2: Quantitative assessment of reliability based on accelerated ageing tests - Temperature and humidity; steady state
- DS/EN 62005-2:2001 Reliability of fibre optic interconnecting devices and passive components - Part 2: Quantitative assessment of reliability based on accelerated ageing tests - Temperature and humidity; steady state
- DANSK DS/IEC 63284:2022 Semiconductor devices – Reliability test method by inductive load switching for gallium nitride transistors
US-Unspecified Preparing Activity
- DI-SESS-81629-2001 RELIABILITY DEVELOPMENT GROWTH TEST PROCEDURES
PH-BPS
- PNS IEC 60749-41:2021 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
- PNS IEC 60749-30:2021 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- PNS IEC/TS 62861:2021 Guidelines for principal component reliability testing for LED light sources and LED luminaires
- PNS IEC 60749-43:2021 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
Association Francaise de Normalisation
- NF C20-345*NF EN 62309:2005 Dependability of products containing reused parts - Requirements for functionality and tests
- NF C96-022-30*NF EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing.
- NF C20-325:1985 Equipment reliability testing Part 5:Compliance test plans for success ratio
- NF EN 62628:2012 Software Operational Safety Guidelines
- NF EN IEC 60300-1:2024 Dependability management - Part 1 : managing dependability
- NF C20-300-1*NF EN IEC 60300-1:2024 Dependability management - Part 1 : managing dependability
- NF C20-341:1994 Analysis techniques for dependability. Reliability block diagram method.
International Organization for Standardization (ISO)
- ISO 19973-4:2014 Pneumatic fluid power - Assessment of component reliability by testing - Part 4: Pressure regulators
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO IEC 60300-3-5:2016 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles
- BH GSO IEC 63275-1:2024 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
GM Global
- GMW 14834-2013 Speaker Validation and Reliability Test Specification Issue 2; English
American Society for Testing and Materials (ASTM)
- ASTM E3291-21 Standard Guide for Reliability Demonstration Testing
Spanish Association for Standardization (UNE)
- UNE 200001-3-5:2002 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles.
- UNE-EN 61078:1996 ANALYSIS TECHNIQUES FOR DEPENDABILITY. RELIABILITY BLOCK DIAGRAM METHOD.
- UNE 20609:1980 RELIABILITY TESTS: EXPONENTIAL DISTRIBUTION
- UNE 20-608 Pt.1-1986 Equipment reliability testing. General requirements
VN-TCVN
- TCVN 5413-1991 Household radioelectronic apparatus.Reliability indices and reliability test methods
American National Standards Institute (ANSI)
- ANSI/IEC/ASQ D1123:1997 Reliability Testing - Compliance Test Plans for Success Ratio
- ANSI/IEC/ASQ D1070:1997 Compliance Test Procedures for Steady State Reliability
- ANSI/RIA R15.05-3-1992 Industrial Robots and Robot Systems - Reliability Acceptance Testing - Guidelines
- ANSI R15.05-3-1992 Industrial Robots and Robot Systems - Reliability Acceptance Testing - Guidelines
- ANSI/RIA R15.05.3-1992 Industrial Robots and Robot Systems - Reliability Acceptance Testing - Guidelines
- ANSI/ASTM F450:2013 Test Methods for Vacuum Cleaner Hose - Durability and Reliability (Plastic)
American Society of Quality Control (ASQC)
- ASQ D61078-1997 Analysis Techniques for Dependability - Reliability Block Diagram Method T83
- ASQ D61123-1997 Reliability Testing - Compliance Plans for Success Ratio (T84E)
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE 1366-1998 Trial-use guide for electric power distribution reliability indices
PL-PKN
- PN-EN IEC 60749-41-2021-04 E Semiconductor devices -- Mechanical and climatic test methods -- Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020)
Bureau of Indian Standards
- IS 15474-3-5-2018 Dependability Management Part 3 Application Guide Section 5 Reliability Test Conditions and Statistical Test Principles
- IS 7354-6-1983 Guide on reliability of electronic and electrical items: Part 6 Inclusion of reliability clauses into specifications for components (or parts)
IN-BIS
- IS 7354 Pt.6-1983 Part VI of the Reliability Guidelines for Electronic and Electrical Products incorporates reliability clauses into the specifications of components (or parts)
Standard Association of Australia (SAA)
- AS 1211.2:1972 Reliability of electronic equipment and components - Reliability concepts
- Doc 1790-1971 Reliability of electronic equipment and components Part 3: Reliability programme for equipment
- AS 1211.3:1977 Reliability of electronic equipment and components, Part 3: Reliability program for equipment
- AS/NZS IEC 60300.1:2025 Dependability management, Part 1: Managing dependability
SCC
- ASQ/IEC D61078-1997 Analysis Techniques for Dependability - Reliability Block Diagram Method
RO-ASRO
- STAS R 12007/4-1989 Equipment reliability testing PROCEDURES FOR DETERMINING POINT ESTIMATES AND CONFI- DENCE LIMITS FROM EQUIPMENT RELIABILITY DETERMINATION TESTS
Association for Electrical, Electronic & Information Technologies (VDE)
- VDE 0435-120 E*DIN IEC 61810-2:2008-04 Electromechanical elementary relays – Part 2: Reliability
ECIA - Electronic Components Industry Association
- EIA-469-B-1988 Standard Test Method for Destructive Physical Analysis of High Reliability Ceramic Monolithic Capacitors
- RS-469-A-1983 Standard Test Method for Destructive Physical Analysis of High Reliability Ceramic Monolithic Capacitors
ISA - International Society of Automation
- ISA SENS PERF RELI-2005 Sensor Performance and Reliability
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC JESD22-A113G-2015 Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
- JEDEC JESD22-A113F-2008 Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
Reliability test method of optoelectronic devices for communication,Test methods for semiconductor discrete devices