Resistivity detection technology
Resistivity detection technology, Total:30 items.
The international standard classification for "Resistivity detection technology" includes: Exploratory and extraction equipment , Semiconducting materials , Other methods of testing of metals , Chemical analysis of metals , Carbon materials , Testing of metals , Electricity. Magnetism. Electrical and magnetic measurements .
The Chinese standard classification for "Resistivity detection technology" includes: Petroleum geology exploration , Semimetal and semiconductor material in general , Metal physical property test method , Semimetal and semiconductor material analysis method , Oxide and elementary substance , Technical management , Geological mineral survey and development in general , Radio Measurement .
Professional Standard - Petroleum
- SY/T 6689-2007 Technical specifications for complex resistivity method
Group Standards of the People's Republic of China
- T/CASAS 019-2021 Test method for resistivity of micro and nano metal sintered compact: four probe method
- T/QGCML 3275-2024 Technical Specifications for Detection of Physical Property Parameters of Rocks and Minerals - Resistivity Detection Method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
- GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
- GB/T 1551-1995 Test method for resistivity of silicon and germanium bars using a two-point probe
- GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
- GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
- GB/T 39978-2021 Nanotechnology—Resistivity of carbon nanotube powder—Four probe method
Professional Standard - Electron
- SJ/T 10314-1992 Generic specification of resistivity measuring instrument with four-point probe
Professional Standard - Geology
- DZ/T 0073-1993 Technical Specification for Resistivity Profiling Method
- DZ/T 0072-1993 Technical Specification for Resistivity Sounding Method
- DZ/T 0072-2020 Technical Specifications for Resistivity Bathymetry
National Metrological Verification Regulations of the People's Republic of China
- JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method
- JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method
Professional Standard - Non-ferrous Metal
- YS/T 602-2007 Test method for resistivity of zone-refined germanium ingot using a two-point probe
- YS/T 602-2017 Test method for resistivity of zone-refined germanium ingot using a two-point probe
ES-AENOR
- UNE 22-613-1986 Geophysical survey. Resistivity method. Vertical electrical detection
Japanese Industrial Standards Committee (JISC)
- JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
American Society for Testing and Materials (ASTM)
- ASTM D6431-99(2010) Standard Guide for Using the Direct Current Resistivity Method for Subsurface Investigation
- ASTM D6431-99 Standard Guide for Using the Direct Current Resistivity Method for Subsurface Investigation
- ASTM D6431-99(2005) Standard Guide for Using the Direct Current Resistivity Method for Subsurface Investigation
AENOR
- UNE 22613:1986 GEOPHYSICAL TERRESTRIAL PROSPECTING. RESISTIVITY METHOD. VERTICAL ELECTRIC SOUNDINGS.
Korean Agency for Technology and Standards (KATS)
- KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
- KS L 1619-2003 Test methods for measuring resistivity of electrically conductive ceramic thin films with four point probe method
- KS L 1619-2013 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
- KS L 1619-2013(2018) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
- KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
Exploration Technical Regulations by Complex Resistivity Method,Resistivity Bathymetry Technology,Technical Regulations for Resistivity Profile Method
