Spectral separation

Spectral separation, Total:211 items.

The international standard classification for "Spectral separation" includes: Chemical analysis , Surface active agents , Other non-ferrous metals and their alloys , Fertilizers , Other standards related to optics and optical measurements , Testing of metals , Measuring instruments , Solid fuels , Geology. Meteorology. Hydrology .

The Chinese standard classification for "Spectral separation" includes: Basic standards and general methods , Industrial gas and chemical gas , Tooth paste, soap and detergent , Rare refractory metals and their compounds , Basic standards and general methods on chemical fertilizers , chromatograph , Semimetal and semiconductor material analysis method , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Coal petrography , Analysis methods for toxic substances in water , Meteorology .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GB/T 28726-2012 Gas analysis—Gas chromatograph with helium ionization detector
GB/T 13173.4-1991 Separation and determination of different forms of phosphate in detergents ion exchange column chrom-ato-graphy
GB/T 29400-2012 Determination of microamount of inorganic anions in fertilizers by ion chromatography
GB/T 22572-2008 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
GB/T 6150.7-2008 Methods for chemical analysis of tungsten concentrates - Determination of tantalum content and niobium content - Inductively coupled plasma emission spectrometry and spectrophotometry
GB/T 25186-2010 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of relative sensitivity factors from ion-implanted reference materials
GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon

Professional Standard - Agriculture

790兽药典一部-2015 Appendix Contents 0500 Chromatography 0513 Ion Chromatography
2311药典二部-2010 Appendix V J Ion Chromatography
SN/T 5055.1-2018 Analysis of biodiesel - Part 1: Determination of sodium, potassium, calcium, and magnesium cations - Ion chromatography method
203药典三部-2020 Chromatography 0513 Ion Chromatography
JJG(教委) 020-1996 Verification Regulations for Ion Chromatography
184药典三部-2015 Chromatography 0513 General Principles of Ion Chromatography 25
1769药典一部-2010 Appendix VI G Ion Chromatography
64药典四部-2020 0513 Ion chromatography
161药典三部-2010 Appendix III Chromatography IIIE Ion Chromatography
83药典四部-2015 0513 Ion chromatography
783兽药典二部-2015 Appendix Contents 0500 Chromatography 0513 Ion Chromatography

Professional Standard - Education

JY/T 020-1996 General rules for ion chromatograpy
JY/T 0575-2020 General rules of analytical methods for ion chromatography

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
GB/T 37385-2019 Test method for chloride content of silicon—Ion chromatography method
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
GB/T 36240-2018 Ion chromatographs
GB/T 37182-2018 Gas analysis--Gas chromatograph with plasma emission detector

Group Standards of the People's Republic of China

T/CASAS 010-2019 Determination of Trace Impurities Concentration and Distribution in GaN Materials by Secondary Ion Mass Spectrometry
T/CECS 10206-2022 Determination of Chloride Ion and Sulfate Ion in Concrete by Ion Chromatography
T/ZJATA 0023-2024 Determination of perchlorate in water Ion chromatography-mass spectrometry/mass spectrometry
T/CIS 17004-2020 Ambient ionization device
T/SZJL 4-2023 Determination of glucose concentration in human saliva－Ion chromatography

Henan Provincial Standard of the People's Republic of China

DB41/T 778-2013 Determination of Chloride Ion Content in Chemical Fertilizers by Ion Chromatography
DB41/T 1001-2014 Determination of Mixing Uniformity of Feed Products by Ion Chromatography

Professional Standard - Electron

SJ/T 11498-2015 Test method for measuring oxygen contamination in heavily doped silicon substrates by secondary ion mass spectrometry
SJ/T 11493-2015 Test method for measuring nitrogen concentration in silicon substrates by secondary ion mass spectrometry

Professional Standard - Medicine

YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry

Professional Standard - Electricity

DL/T 1479-2015 Analytical Method of Ethanolamine in steam and Water in Power Plant—Ion Chromatography

Military Standard of the People's Republic of China-General Armament Department

GJB 2802A-2021 Military fuel filter separator series model spectrum

Professional Standard - Coal

MT/T 807-1999 Separation of vitrinite group in bituminous coal

工业和信息化部

YS/T 1380-2020 Method for chemical analysis of rhodium compounds. Determination of the chloride ion and nitrate ion contents. Ion chromatography method
YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography

Professional Standard - Environmental Protection

HJ/T 84-2001 Water quality -- Determination of inorangic anions -- Ion chromatography method

National Metrological Verification Regulations of the People's Republic of China

JJG 823-1993 Verification Regulation of Ion Chromatograph
JJG 823-2014 Verification regulation for ion chromatograph
JJG(地质) 1008-1990 Verification Regulations for Ion Chromatography

Professional Standard - Water Conservancy

SL 86-1994 Determination of inorganic anions in water (Ion chromatography method)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 35664-2017 Determination of ammonium in the wet precipitation--Ion chromatography

Professional Standard - Commodity Inspection

SN/T 2210-2008 Determination of hexavalent chromium in health foods - IC-ICP-MS method
SN/T 5032-2017 Determination of chloride ions in petroleum products. Ion chromatography

Professional Standard - Petroleum

SY 7001-2014 Ion Chromatography for Composition Analysis of Heat Stable Salt Anions in Alcoholic Ammonia Desulfurization Solution
SY/T 7001-2014 Determination of beat stable salts anion composition in alkanolamine desulfurization solution. Ion chromatography

Professional Standard - Non-ferrous Metal

YS/T 1593.4-2023 Methods for chemical analysis of crude lithium carbonate— Part 4：Determination of anion contents— Ion chromatography

British Standards Institution (BSI)

BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 18114:2021 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
BS ISO 16564:2004 Rubber, raw natural - Determination of average molecular mass and molecular-mass distribution by size exclusion chromatography (SEC)
IEC TS 62607-6-30:2024 Nanomanufacturing. Key control characteristics - Graphene-based material. Anion concentration: Ion chromatography method
20/30409889 DC BS ISO 18114. Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
BS ISO 11632:1998(1999) Stationary source emissions — Determination of mass concentration of sulfur dioxide — Ion chromatography method
BS EN ISO 11401:1998 Plastics - Phenolic resins - Separation by liquid chromatography
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
BS EN ISO 15192:2021 Soil and waste. Determination of Chromium(VI) in solid material by alkaline digestion and ion chromatography with spectrophotometric detection
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
DD ENV 14029-2001 Lead and lead alloys. Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), after separation of the lead matrix
DD ENV 13800-2000 Lead and lead alloys. Analysis by flame atomic absorption spectromerty (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), without separation of the lead matrix
BS EN 16318:2013+A1:2016 Fertilizers and liming materials. Determination of chromium(VI) by photometry (method A) and by ion chromatography with spectrophotometric detection (method B)

GSO

OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BH GSO ISO 23830:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
GSO ISO 3924:2013 Petroleum products - Determination of boiling range distribution - Gas chromatography method
BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
BH GSO ISO 18114:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
GSO ISO 17560:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
BH GSO ISO 11632:2017 Stationary source emissions -- Determination of mass concentration of sulfur dioxide -- Ion chromatography method
GSO ISO 11632:2015 Stationary source emissions -- Determination of mass concentration of sulfur dioxide -- Ion chromatography method
BH GSO ISO 23812:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
OS GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials

Association Francaise de Normalisation

NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions
NF EN ISO 10304-4:2022 Water quality - Determination of dissolved anions by liquid ion chromatography - Part 4: determination of chlorate, chloride and chlorite ions in lightly contaminated water
NF X21-064*NF ISO 23830:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry.
NF EN ISO 11401:1998 Plastiques - Résines phénoliques - Séparation par chromatographie en phase liquide.
NF ISO 11632:1998 Emission from stationary sources - Determination of the mass concentration of sulfur dioxide - Ion chromatography method
NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
XP V04-441-2*XP ISO/TS 19046-2:2017 Cheese - Determination of propionic acid level by chromatography - Part 2 : method by ion exchange chromatography
NF E75-232:1993 Abrasive grains. Sampling and splitting.
XP ISO/TS 19046-2:2017 Cheeses - Determination of propionic acid content by chromatography - Part 2: ion exchange chromatography method
NF T51-404*NF EN ISO 11401:1998 Plastics. Phenolic resins. Separation by liquid chromatography.
NF X31-171:2011 Soil quality - Determination of chromium(VI) in solid material by alkaline digestion and ion chromatography with spectrophotometric detection.

Japanese Industrial Standards Committee (JISC)

JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
JIS K 0127:2001 General rules for ion chromatographic analysis
JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
JIS K 0127:1992 General rules for ion chromatographic analysis
JIS K 0127:2013 General rules for ion chromatography
JIS K 0163:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials

International Organization for Standardization (ISO)

ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
ISO 18114:2021 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
ISO 11401:1993 Plastics; phenolic resins; separation by liquid chromatography
ISO/TS 19046-2:2017 | IDF/RM 233-2:2017 Cheese — Determination of propionic acid level by chromatography — Part 2: Method by ion exchange chromatography
ISO 11632:1998 Stationary source emissions - Determination of mass concentration of sulfur dioxide - Ion chromatography method
ISO 15192:2010 Soil quality - Determination of chromium(VI) in solid material by alkaline digestion and ion chromatography with spectrophotometric detection
ISO 15192:2021 Soil and waste - Determination of Chromium(VI) in solid material by alkaline digestion and ion chromatography with spectrophotometric detection
ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

American Society for Testing and Materials (ASTM)

ASTM D5542-04(2009) Standard Test Methods for Trace Anions in High Purity Water by Ion Chromatography
ASTM E1438-06 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
ASTM D5542-04 Standard Test Methods for Trace Anions in High Purity Water by Ion Chromatography
ASTM E1438-91(1996) Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
ASTM E1438-91(2001) Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
ASTM D5542-94(1999)e1 Standard Test Methods for Trace Anions in High Purity Water by Ion Chromatography
ASTM D5542-16 Standard Test Methods for Trace Anions in High Purity Water by Ion Chromatography
ASTM E1162-87(1996) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E1162-87(2001) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM D5996-05 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
ASTM D5996-05(2009) Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
ASTM C1625-05 Standard Test Method for Uranium and Plutonium Concentrations and Isotopic Abundances by Thermal Ionization Mass Spectrometry
ASTM UOP1031-19 Chromium (III) and Chromium (VI) Speciation in Water by IC-ICP-MS (Ion Chromatography- Inductively Coupled Plasma Mass Spectrometry)
ASTM RR-D15-1025 2009 D5827-Test Method for Analysis of Engine Coolant for Chloride and Other Anions by Ion Chromatography
ASTM E1162-11 Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E10-08 Standard Test Method for Brinell Hardness of Metallic Materials
ASTM D5996-96(2000) Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography

Korean Agency for Technology and Standards (KATS)

KS M 0035-1993 General rules for ion chromatographic analysis
KS M 0035-2023 General rules for ion chromatographic analysis
KS D ISO 18114:2005 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS D ISO 18114-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS D ISO 18114-2005(2020) Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS M 0033-2008 General rules for analytical methods in high performance liquid chromatography
KS M ISO 11401-2010(2020) Plastics－Phenolic resins－Separation by liquid chromatography
KS M ISO 11401-2020 Plastics－Phenolic resins－Separation by liquid chromatography
KS M ISO 11401:2010 Plastics－Phenolic resins－Separation by liquid chromatography
KS I ISO 11632:2004 Stationary source emissions-Determination of the massconcentration of sulfur dioxide(Ion chromatography method)
KS I ISO 11632-2019 Stationary source emissions — Determination of the mass concentration of sulfur dioxide(ion chromatography method)
KS I ISO 11632:2014 Stationary source emissions — Determination of the mass concentration of sulfur dioxide(ion chromatography method)
KS I ISO 11632-2014(2019) Stationary source emissions — Determination of the mass concentration of sulfur dioxide(ion chromatography method)
KS M ISO 2272:2007 Surface active agents－Soaps－Determination of low contents of free glycerol by molecular absorption spectrometry
KS D ISO 20341-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Method for estimating depth resolution parameters with multiple delta-layer reference materials

US-ACEI

IPC TM-650 2.3.28-1995 Ionic Analysis of Circuit Boards Ion Chromatography Method

IPC - Association Connecting Electronics Industries

IPC TM-650 2.3.28A-2004 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
IPC TM-650 2.3.28B-2012 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
IPC TM-650 2.3.28.2-2009 Bare Printed Board Cleanliness by Ion Chromatography
IPC WP-008 CD-2005 Setting Up Ion Chromatography Capability

SCC

07/30138812 DC BS ISO 23830. Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
VDI 3869 BLATT 3-2010 Measuring ammonia in the ambient air — Sampling with coated diffusion separators (denuders) — Photometric or ion chromatographic analysis
AWWA QTC98245 Analysis of Metals by Inductively Coupled Plasma-Mass Spectrometry: Effect of Concentration on Accuracy and Precision
VDI 3869 BLATT 3-2010 Measuring ammonia in the ambient air — Sampling with coated diffusion separators (denuders) — Photometric or ion chromatographic analysis
DANSK DS/EN ISO 11401:1998 Plastics - Phenol resins - Separation by liquid chromatography
AWWA WQTC55099 The Use of Electrospray Ionization (ESI) High-Field Asymmetric Waveform Ion Mobility Mass Spectrometry (FAIMS-MS) for the Analysis of Haloacetic Acids (HAAS) in Drinking Water
VDI 3869 BLATT 4-2012 Measuring ammonia in outdoor air — Sampling with passive samplers — Photometric or ion chromatographic analysis
ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
10/30199169 DC BS ISO 12406. Surface chemical analysis. Secondary ion mass spectrometry. Method for depth profiling of arsenic in silicon
AWWA WQTC50450 Interlaboratory Validation of an Ion Chromatographic Method for the Analysis of DBP Anions in Drinking Water
AENOR UNE-EN ISO 11401:1999 PLASTICS - PHENOLIC RESINS - SEPARATION BY LIQUID CHROMATOGRAPHY (ISO 11401:1993)
VDI 3869 BLATT 4-2012 Measuring ammonia in outdoor air — Sampling with passive samplers — Photometric or ion chromatographic analysis
SN-CEN/TS 16318:2012 Fertilizers — Determination of trace elements — Determination of chromium(VI) by photometry (method A) and by ion chromatography with spectrophotometric detection (method B)
NS-EN ISO 11401:1998 Plastics — Phenolic resins — Separation by liquid chromatography (ISO 11401:1993)
NS-EN 16318:2013 Fertilizers — Determination of trace elements — Determination of chromium(VI) by photometry (method A) and by ion chromatography with spectrophotometric detection (method B)

KR-KS

KS M 0035-2008(2023) General rules for ion chromatographic analysis
KS D ISO 17560-2003(2023) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
KS D ISO 14237-2003(2023) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC TM-650 2.3.28-2004 Ionic Analysis of Circuit Boards, Ion Chromatography Method Revision A
IPC WP-008-2005 Setting Up Ion Chromatography Capability

European Committee for Standardization (CEN)

EN 16318:2013+A1:2016 Fertilizers and liming materials - Determination of chromium(VI) by photometry (method A) and by ion chromatography with spectrophotometric detection (method B)
PD CEN/TS 16318:2012 Fertilizers - Determination of trace elements - Determination of chromium(VI) by photometry (method A) and by ion chromatography with spectrophotometric detection (method B)
EN ISO 15192:2021 Soil and waste - Determination of Chromium(VI) in solid material by alkaline digestion and ion chromatography with spectrophotometric detection (ISO 15192:2021)

VDI - Verein Deutscher Ingenieure

VDI 3869 Blatt 3-2008 Measurement of ammonia in ambient air - Sampling with diffusion separators (denuders) - Photometric or ion chromatographic analysis
VDI 3869 Blatt 4-2010 Messen von Ammoniak in der Aussenluft - Probenahme mit Passivsammlern - Fotometrische oder ionenchromatografische Analyse

American National Standards Institute （ANSI)

ANSI/TIA/EIA 455-50B-1998 Light Launch Conditions for Long Length Graded-Index Optical Fiber Spectral Attenuation Measurements

RU-GOST R

GOST R 57940-2017 Plastics. Phenolic resins. Separation by liquid chromatography
GOST 33914-2016 Juice products. Determination of anions by ion chromatography

German Institute for Standardization

DIN EN ISO 11401:1998-10 Plastics - Phenolic resins - Separation by liquid chromatography (ISO 11401:1993); German version EN ISO 11401:1998
DIN EN ISO 11401:1998 Plastics - Phenolic resins - Separation by liquid chromatography (ISO 11401:1993); German version EN ISO 11401:1998
DIN 5030-3:2021-09 Spectral measurement of radiation - Spectral isolation - Definitions and characteristics
DIN 5030-3:2021 Spectral measurement of radiation - Spectral isolation - Definitions and characteristics
DIN EN 16318:2016-07 Fertilizers and liming materials - Determination of chromium(VI) by photometry (method A) and by ion chromatography with spectrophotometric detection (method B); German version EN 16318:2013+A1:2016

Standard Association of Australia （SAA）

AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon

Danish Standards Foundation

DS/EN ISO 11401:1999 Plastics - Phenol resins - Separation by liquid chromatography
DS/ISO 11632:1998 Stationary source emissions - Determination of mass concentration of sulfur dioxide - Ion chromatography method

Spanish Association for Standardization (UNE)

UNE 77226:1999 STATIONARY SOURCE EMISSIONS. DETERMINATION OF MASS CONCENTRATION OF SULFUR DIOXIDE. ION CHROMATOGRAPHY METHOD.
UNE 35054-1:1985 FERRONIOBIUM. SPECTROPHOTOMETRIC DETERMINATION OF NIOBIUM AFTER SEPARATION ON ION EXCHANGE RESIUS
UNE-EN 16318:2015+A1:2016 Fertilizers and liming materials - Determination of chromium (VI) by photometry (method A) and by ion chromatography with spectrophotometric detection (method B)

VN-TCVN

TCVN 6750-2000 Stationary source emissions.Determination of mass concentration of sulfur dioxide.Ion chromatography method

RO-ASRO

STAS 9475/2-1974 ION EXCHANGERS Size analysis

PL-PKN

PKN-ISO/TS 19046-2-2021-07 P Cheese -- Determination of propionic acid level by chromatography -- Part 2: Method by ion exchange chromatography

GOST

GOST 34801-2021 Drinking water. Determination of bromate ions content by ion chromatography