wafer inspection
wafer inspection, Total:8 items.
The international standard classification for "wafer inspection" includes: .
The Chinese standard classification for "wafer inspection" includes: Dedicated processing equipment .
Professional Standard - Electron
- SJ/T 31092-1994 Requirements of Readiness and Methods of Inspection and Assessment for NC Wafer Cutting (Scribing) Machines
- SJ/T 31091-1994 Requirements of Readiness and Methods of Inspection and Assessment for Wafer Slicers
- SJ/T 31065-1994 Requirements of readiness and methods of inspection and assessment for Type 24 NC wafer buffing machines
Group Standards of the People's Republic of China
- T/ZZB 0497-2018 Single crystal wafers for surface acoustic wave device applications
Professional Standard - Agriculture
- 123药典 四部-2020 0900 Characteristic Inspection Method 0981 Crystallinity Inspection Method
- 142药典 四部-2015 0900 Characteristic Inspection Method 0981 Crystallinity Inspection Method
Korean Agency for Technology and Standards (KATS)
- KS D 0261-2012(2017) Visual inspection for silicon wafers with specular surfaces
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC JESD22-B118-2011 Semiconductor Wafer and Die Backside External Visual Inspection
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