Probe sample
Probe sample, Total:9 items.
The international standard classification for "Probe sample" includes: Chemical analysis of metals , Semiconducting materials , Other methods of testing of metals , Carbon materials .
The Chinese standard classification for "Probe sample" includes: Metal physical property test method , Semimetal and semiconductor material in general , Semimetal and semiconductor material analysis method , Oxide and elementary substance .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
- GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
- GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
- GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe
- GB/T 14146-1993 Silicon epitaxial layers--Determination of carrier concentration--Mercury probe Valtage-capacitance method
- GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
- GB/T 1551-1995 Test method for resistivity of silicon and germanium bars using a two-point probe
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 39978-2021 Nanotechnology—Resistivity of carbon nanotube powder—Four probe method
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4378-2022 Four-probe method for non-destructive testing of sheet resistance of nanometer and submicron scale thin films on substrate surface
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