Electron Probe Resolution
Electron Probe Resolution, Total:57 items.
The international standard classification for "Electron Probe Resolution" includes: Test conditions and procedures in general , Optical measuring instruments , Other standards related to analytical chemistry , Testing of metals , Semiconducting materials , Chemical technology (Vocabularies) , Electricity. Magnetism. Electrical and magnetic measurements , Surgical instruments and materials , Exploratory and extraction equipment .
The Chinese standard classification for "Electron Probe Resolution" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Metal physical property test method , Semimetal and semiconductor material in general , Basic standards and general methods , Radio Measurement , Other special devices , Petroleum geology exploration .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
- GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
- GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
- GB/T 15074-2025 General specification for EPMA quantitative analysis
- GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe
- GB/T 15075-1994 Method for testing EPMA instrument
- GB/T 15074-1994 General guide for EPMA quantitative analysis
- GB/T 15074-2008 General guide of quantitative analysis by EPMA
- GB/T 21636-2008 Microbeam analysis - Electron Probe Micro Analysis (EPMA) - Vocabulary
- GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
- GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
National Metrological Verification Regulations of the People's Republic of China
- JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method
- JJG 901-1995 Verivication Regulation of Electron Probe Microanalyzer
- JJG(地质) 1017-1990 Verification Regulations for Electronic Probe Instrument
Professional Standard - Military and Civilian Products
- WJ 2297-1995 Electronic Probe Verification Regulations
Professional Standard - Medicine
- YY/T 0172-2014 Uterine probe
- YY/T 0172-1994 Explorer for womb
Group Standards of the People's Republic of China
- T/GDAQI 94-2022 Evaluation method for limit resolution of medical electronic endoscope
Professional Standard - Petroleum
- SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals
- SY/T 6027-2019 Quantitative analysis of rocks and minerals by electron probe microanalysis
- SY/T 6027-2012 Quantitative Analysis Method of Rock and Mineral by Electron Probe Microanalysis
- SY/T 6386-1999 Technical specifications of high resolution seismic exploration data acquisition for land
Gosstandart of Russia
- GOST 17038.6-1979 Ionizing-radiation scintillation detectors. Method for measurement of intrinsic and given detector resolution
Czech Standards Institute (UNMZ)
- CSN ON 81 3790-1966 Electric feeler
- CSN ON 81 3791-1966 Holder of electric íeeler
Polski Komitet Normalizacyjny (PKN)
- PN T06500-01-1986 Electronic measuring instruments General resolutions
- PN T06400-02-1992 Information Processing Communication Standards in Civil Aviation Systems
- PN T06400-01-1992 Dimensions of electronic tubes and valves General resolutions
International Organization for Standardization (ISO)
- ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
- ISO 12233:2023 Photography — Electronic still picture imaging — Resolution and spatial frequency responses
- ISO 12233:2000 Photography - Electronic still-picture cameras - Resolution measurements
- ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
British Standards Institution (BSI)
- BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
- 25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope
- BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- BS ISO 12233:2000 Photography. Electronic still picture cameras. Resolution measurements
- BS IEC 62977-3-6:2025 Electronic displays - Evaluation of optical performance. Spatial resolution
- BS ISO 23833:2006 Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
- 10/30165036 DC BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- BS ISO 12233:2014 Photography. Electronic still picture imaging. Resolution and spatial frequency responses
GCC Standardization Organization
- GSO OIML R115:2010 Clinical electrical thermometers with maximum device
- GSO ISO 23833:2015 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE N42.31-2003 Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 27911:2016 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
- BH GSO ISO 23833:2017 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
Korean Agency for Technology and Standards (KATS)
- KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
- KS A ISO 12233-2023 Photography — Electronic still picture imaging — Resolution and spatial frequency responses
- KS A ISO 12233-2018 Photography — Electronic still picture imaging — Resolution and spatial frequency responses
- KS A ISO 12233:2018 Photography — Electronic still picture imaging — Resolution and spatial frequency responses
- KS A ISO 12233-2018(2023) Photography — Electronic still picture imaging — Resolution and spatial frequency responses
- KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
- KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
- KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
- KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
American Society for Testing and Materials (ASTM)
- ASTM STP 349-1964 Symposium on X-ray and Electron Probe Analysis
Danish Standards Foundation
- DANSK DS/ISO 12233:2017 Photography – Electronic still picture imaging – Resolution and spatial frequency responses
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 23833:2015 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
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