Electron Probe Resolution

Electron Probe Resolution, Total:76 items.

The international standard classification for "Electron Probe Resolution" includes: Optical measuring instruments , Testing of metals , Other standards related to analytical chemistry , Optical equipment , Semiconducting materials , Other standards related to optics and optical measurements , Chemical technology (Vocabularies) , Electricity. Magnetism. Electrical and magnetic measurements , Exploratory and extraction equipment .

The Chinese standard classification for "Electron Probe Resolution" includes: Electron optics and other physical optics instrument , Metal physical property test method , Electrochemical, thermochemistry and optical profile type analyzer , Semimetal and semiconductor material in general , Basic standards and general methods , Radio Measurement , Petroleum geology exploration .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
GB/T 43661-2024 Surface chemical analysis—Scanning probe microscopy—Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
GB/T 15075-1994 Method for testing EPMA instrument
GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe
GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
GB/T 21636-2008 Microbeam analysis - Electron Probe Micro Analysis (EPMA) - Vocabulary
GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
GB/T 15074-2025 General specification for EPMA quantitative analysis
GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
GB/T 15074-2008 General guide of quantitative analysis by EPMA
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)
GB/T 15074-1994 General guide for EPMA quantitative analysis
GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe

National Metrological Verification Regulations of the People's Republic of China

JJG(地质) 1017-1990 Verification Regulations for Electronic Probe Instrument
JJG 901-1995 Verivication Regulation of Electron Probe Microanalyzer
JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method
JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method

Group Standards of the People's Republic of China

T/GDAQI 94-2022 Evaluation method for limit resolution of medical electronic endoscope

Professional Standard - Military and Civilian Products

WJ 2297-1995 Electronic Probe Verification Regulations

Professional Standard - Machinery

JB/T 12074-2014 Quantitative Analysis of Composition Metal - Electron Probe Microanalysis

Professional Standard - Petroleum

SY/T 6386-1999 Technical specifications of high resolution seismic exploration data acquisition for land
SY/T 6027-2019 Quantitative analysis of rocks and minerals by electron probe microanalysis
SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals
SY/T 6027-2012 Quantitative Analysis Method of Rock and Mineral by Electron Probe Microanalysis

Gosstandart of Russia

GOST 17038.6-1979 Ionizing-radiation scintillation detectors. Method for measurement of intrinsic and given detector resolution

CZ-CSN

CSN ON 81 3790-1966 Electric feeler
CSN ON 81 3791-1966 Holder of electric íeeler

PL-PKN

PN T06500-01-1986 Electronic measuring instruments General resolutions
PN T06400-01-1992 Dimensions of electronic tubes and valves General resolutions
PN T06400-02-1992 Dimensions of electronic tubes and valves Bases Generic resolutions

British Standards Institution (BSI)

BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
10/30165036 DC BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS ISO 12233:2000 Photography. Electronic still picture cameras. Resolution measurements
BS ISO 23833:2006 Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
BS ISO 12233:2023 Photography. Electronic still picture imaging. Resolution and spatial frequency responses
BS ISO 12233:2014 Photography. Electronic still picture imaging. Resolution and spatial frequency responses
BS ISO 12233:2017 Photography. Electronic still picture imaging. Resolution and spatial frequency responses

International Organization for Standardization (ISO)

ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
ISO 12233:2023 Photography — Electronic still picture imaging — Resolution and spatial frequency responses
ISO 12233:2000 Photography - Electronic still-picture cameras - Resolution measurements
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO 12233:2017 Photography - Electronic still picture imaging - Resolution and spatial frequency responses
ISO 23833:2013 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO 12233:2014 Photography - Electronic still picture imaging - Resolution and spatial frequency responses

Institute of Electrical and Electronics Engineers (IEEE)

IEEE N42.31-2003 Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 27911:2016 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
BH GSO ISO 23833:2017 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
BH GSO ISO 12233:2016 Photography -- Electronic still picture imaging -- Resolution and spatial frequency responses

GCC Standardization Organization

GSO OIML R115:2010 Clinical electrical thermometers with maximum device
GSO ISO 23833:2015 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary

Korean Agency for Technology and Standards (KATS)

KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
KS A ISO 12233:2018 Photography — Electronic still picture imaging — Resolution and spatial frequency responses
KS A ISO 12233-2018 Photography — Electronic still picture imaging — Resolution and spatial frequency responses
KS A ISO 12233-2023 Photography — Electronic still picture imaging — Resolution and spatial frequency responses
KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS A ISO 12233-2018(2023) Photography — Electronic still picture imaging — Resolution and spatial frequency responses
KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS A ISO 12233:2015 Photography－Electronic still-picture cameras－Resolution measurements

American Society for Testing and Materials (ASTM)

ASTM STP 349-1964 Symposium on X-ray and Electron Probe Analysis
ASTM STP 317-1962 Symposium on Advances in Electron Metallography and Electron Probe Microanalysis
ASTM F84-99 Method for measuring resistivity of silicon wafers - online four-point probe
ASTM F397-02 Silicon rod two-electrode probe resistivity test method

Danish Standards Foundation

DANSK DS/ISO 12233:2017 Photography – Electronic still picture imaging – Resolution and spatial frequency responses

Standard Association of Australia （SAA）

AS ISO 12233:2023 Photography — Electronic still picture imaging — Resolution and spatial frequency responses

German Institute for Standardization

DIN 6800-1:2016 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 23833:2015 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
OS GSO ISO 12233:2015 Photography -- Electronic still picture imaging -- Resolution and spatial frequency responses

International Telecommunication Union (ITU)

ITU-R INFORME BO.1075-2 SPANISH-1994 High-definition television by satellite

Association Francaise de Normalisation

NF X21-009:2008 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary.

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