Electron Probe Sheet
Electron Probe Sheet, Total:34 items.
The international standard classification for "Electron Probe Sheet" includes: Semiconducting materials , Optical measuring instruments , Other standards related to analytical chemistry , Optical equipment , Surgical instruments and materials .
The Chinese standard classification for "Electron Probe Sheet" includes: Metal physical property test method , Semimetal and semiconductor material in general , Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Other special devices , Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 15074-1994 General guide for EPMA quantitative analysis
- GB/T 15074-2008 General guide of quantitative analysis by EPMA
- GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
- GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
- GB/T 15075-1994 Method for testing EPMA instrument
- GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
- GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
- GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe
Professional Standard - Military and Civilian Products
- WJ 2297-1995 Electronic Probe Verification Regulations
Professional Standard - Medicine
- YY/T 0172-2014 Uterine probe
- YY/T 0172-1994 Explorer for womb
National Metrological Verification Regulations of the People's Republic of China
- JJG 901-1995 Verivication Regulation of Electron Probe Microanalyzer
- JJG(地质) 1017-1990 Verification Regulations for Electronic Probe Instrument
Professional Standard - Petroleum
- SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals
- SY/T 6027-2012 Quantitative Analysis Method of Rock and Mineral by Electron Probe Microanalysis
国家能源局
- SY/T 6027-2019 Quantitative analysis of rocks and minerals by electron probe microanalysis
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
Yunnan Provincial Standard of the People's Republic of China
- DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method
CZ-CSN
- CSN ON 81 3790-1966 Electric feeler
- CSN ON 81 3791-1966 Holder of electric íeeler
German Institute for Standardization
- DIN 6800-4:2000-12 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
- DIN 6800-4:2000 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
HU-MSZT
- MNOSZ 15510-1955 Surgical instruments. uterine probe
Korean Agency for Technology and Standards (KATS)
- KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
- KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
- KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
- KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
Japanese Industrial Standards Committee (JISC)
- JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
SCC
- BS ISO 23833:2006 Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
KR-KS
- KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
- KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
GSO
- GSO ISO 23833:2015 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
- BH GSO ISO 23833:2017 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
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