secondary ion chromatography

secondary ion chromatography, Total:98 items.

The international standard classification for "secondary ion chromatography" includes: Chemical analysis , Testing of metals , Other standards related to optics and optical measurements , Alcohols. Ethers , Semiconducting materials , Geology. Meteorology. Hydrology .

The Chinese standard classification for "secondary ion chromatography" includes: Basic standards and general methods , Semimetal and semiconductor material analysis method , chromatograph , Basic organic chemicals , Semimetal and semiconductor material in general , Meteorology , Analysis methods for toxic substances in water .

Professional Standard - Agriculture

783兽药典二部-2015 Appendix Contents 0500 Chromatography 0513 Ion Chromatography
2311药典二部-2010 Appendix V J Ion Chromatography
1769药典一部-2010 Appendix VI G Ion Chromatography
161药典三部-2010 Appendix III Chromatography IIIE Ion Chromatography
791兽药典一部-2015 Appendix Contents 0500 Chromatography 0514 Size Exclusion Chromatography
64药典四部-2020 0513 Ion chromatography
203药典三部-2020 Chromatography 0513 Ion Chromatography
83药典四部-2015 0513 Ion chromatography
JJG(教委) 020-1996 Verification Regulations for Ion Chromatography
790兽药典一部-2015 Appendix Contents 0500 Chromatography 0513 Ion Chromatography
184药典三部-2015 Chromatography 0513 General Principles of Ion Chromatography 25

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
GB/T 35664-2017 Determination of ammonium in the wet precipitation--Ion chromatography
GB/T 14571.5-2016 Test method of monoethylene glycol for industrial use―Part 5:Determination of chloride ion―Ion chromatography
GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GB/T 42263-2022 Determination of nitrogen content in silicon single crystal—Secondary ion mass spectrometry method
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
GB/T 37385-2019 Test method for chloride content of silicon—Ion chromatography method
GB/T 36240-2018 Ion chromatographs
GB/T 24580-2009 Test method for measuring Boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry
GB/T 39144-2020 Test method for magnesium content in gallium nitride materials—Secondary ion mass spectrometry
GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
GB/T 45768-2025 Surface chemical analysis—Secondary ion mass spectrometry—Linearity of intensity scale in single ion counting time-of-flight mass analysers
SN/T 4585-2016 Determination of methylarsonic acid and dimethylarsinic acid residue in foods for export-LC-ICP-MS method
GB/T 25186-2010 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of relative sensitivity factors from ion-implanted reference materials

Group Standards of the People's Republic of China

T/HNNMIA 8-2023 Chemical analysis methods for secondary aluminium ash - Determination of total fluorine content - Ion chromatography
T/NAIA 035-2021 Determination of Sulfur Dioxide Content in Wolfberry by Ion Chromatography
T/SHPTA 035-2023 Experimental methods for testing secondary batteries and their key materials using time-of-flight secondary ion mass spectrometry
T/JSWA 006-2023 Determination of sodium hypochlorite bromate and chlorate by ion chromatography

Professional Standard - Electron

SJ/T 11493-2015 Test method for measuring nitrogen concentration in silicon substrates by secondary ion mass spectrometry
SJ/T 11498-2015 Test method for measuring oxygen contamination in heavily doped silicon substrates by secondary ion mass spectrometry

Professional Standard - Commodity Inspection

SN/T 4244-2015 Determination of chloride in ethylene glycol,diethylene glycol and triethylene
SN/T 4250-2015 Determination of sulfer dioxide in bamboo and wood products - Ion chromatography method
SN/T 5032-2017 Determination of chloride ions in petroleum products. Ion chromatography

Shandong Provincial Standard of the People's Republic of China

DB37/T 2393-2013 Secondary lithium ion battery electrolyte

Anhui Provincial Standard of the People's Republic of China

DB34/T 1108-2009 Determination of sodium formaldehyde sulfoxylate (hanging white block) in rice noodles by ion chromatography

Professional Standard - Environmental Protection

HJ/T 84-2001 Water quality -- Determination of inorangic anions -- Ion chromatography method

National Metrological Verification Regulations of the People's Republic of China

JJG 823-2014 Verification regulation for ion chromatograph
JJG 823-1993 Verification Regulation of Ion Chromatograph
JJG(地质) 1008-1990 Verification Regulations for Ion Chromatography

Professional Standard - Water Conservancy

SL 86-1994 Determination of inorganic anions in water (Ion chromatography method)

Henan Provincial Standard of the People's Republic of China

DB41/T 778-2013 Determination of Chloride Ion Content in Chemical Fertilizers by Ion Chromatography

International Organization for Standardization (ISO)

ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry

British Standards Institution (BSI)

BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
25/30500395 DC BS ISO 13084 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
07/30138812 DC BS ISO 23830. Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry
BS ISO 18114:2021 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials

GCC Standardization Organization

GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
OS GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BH GSO ISO 23830:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BH GSO ISO 22048:2016 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
BH GSO ISO 18114:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon

Japanese Industrial Standards Committee (JISC)

JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
JIS K 0127:2001 General rules for ion chromatographic analysis
JIS K 0127:1992 General rules for ion chromatographic analysis
JIS K 0127:2013 General rules for ion chromatography

Association Francaise de Normalisation

NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions
NF ISO 11632:1998 Emission from stationary sources - Determination of the mass concentration of sulfur dioxide - Ion chromatography method

Ente Nazionale Italiano di Unificazione

UNI 9813:1991 Ionic chromatography procedures. Anions analysis by ionic chromatography and high pressure liquid chromatography.

American Society for Testing and Materials (ASTM)

ASTM E1635-11 Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E1504-11(2019) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E1162-87(2001) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E1162-87(1996) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy
ASTM E1635-95(2000) Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E1635-06(2019) Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)

Korean Agency for Technology and Standards (KATS)

KS D ISO 22048-2020 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 22048-2005(2020) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 18114-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS D ISO 18114-2005(2020) Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS M 0035-1993 General rules for ion chromatographic analysis
KS M 0035-2008(2023) General rules for ion chromatographic analysis

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC TM-650 2.3.28B-2012 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
IPC TM-650 2.3.28A-2004 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
IPC TM-650 2.3.28-1995 Ionic Analysis of Circuit Boards Ion Chromatography Method
IPC WP-008-2005 Setting Up Ion Chromatography Capability
IPC WP-008 CD-2005 Setting Up Ion Chromatography Capability
IPC TM-650 2.3.28-2004 Ionic Analysis of Circuit Boards, Ion Chromatography Method Revision A

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