tof mass spectrum power

tof mass spectrum power, Total:124 items.

The international standard classification for "tof mass spectrum power" includes: Chemical analysis , Testing of metals , Semiconducting materials , Textiles in general , Organic chemicals in general , Meat, meat products and other animal produce , Protection against crime .

The Chinese standard classification for "tof mass spectrum power" includes: Basic standards and general methods , Semimetal and semiconductor material analysis method , Semimetal and semiconductor material in general , Basic standards and general methods , Elemental semiconductor material , Organic chemicals in general , Basic standards and general methods , Crime judging technology .

Professional Standard - Agriculture

771兽药典二部-2015 Appendix Contents 0400 Spectroscopy
781兽药典一部-2015 Appendix Contents 0400 Spectroscopy 0412 Inductively Coupled Plasma Mass Spectrometry
779兽药典二部-2015 Appendix Contents 0500 Chromatography 0501 Paper Chromatography
775兽药典二部-2015 Appendix Contents 0400 Spectroscopy 0411 Inductively Coupled Plasma Mass Spectrometry
783兽药典一部-2015 Appendix Contents 0400 Spectrometry 0431 Mass Spectrometry
777兽药典二部-2015 Appendix Contents 0400 Spectrometry 0421 Mass Spectrometry
786兽药典一部-2015 Appendix Contents 0500 Chromatography 0501 Paper Chromatography

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 39144-2020 Test method for magnesium content in gallium nitride materials—Secondary ion mass spectrometry
GB/T 38571-2020 Determination of alkaloids as plant secondary metabolites—Liquid chromatography-mass spectrometry
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
GB/T 41153-2021 Determination of boron,aluminum and nitrogen impurity content in silicon carbide single crystal―Secondary ion mass spectrometry
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Group Standards of the People's Republic of China

T/CASAS 010-2019 Determination of Trace Impurities Concentration and Distribution in GaN Materials by Secondary Ion Mass Spectrometry
T/NAIA 0291-2024 Determination of ethylene oxide residues in disposable sanitary products Gas chromatography-mass spectrometry
T/CASAS 009-2019 Determination of Trace Impurities Concentration and Distribution in Semi-insulating SiC Materials by Secondary Ion Mass Spectrometry
T/CAQI 156-2020 Detection of single nucleotide polymorphism (SNP) in biological samples MALDI-TOF MS method
T/SHPTA 035-2023 Experimental methods for testing secondary batteries and their key materials using time-of-flight secondary ion mass spectrometry

Professional Standard - Electron

SJ/T 11493-2015 Test method for measuring nitrogen concentration in silicon substrates by secondary ion mass spectrometry
SJ/T 11498-2015 Test method for measuring oxygen contamination in heavily doped silicon substrates by secondary ion mass spectrometry

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 24580-2009 Test method for measuring Boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry
GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GB/T 29852-2013 Test Method for Measuring Phosphorus, Arsenic and Antimony in Silicon Materials Used for Photovoltaic Applications by Secondary Ion Mass Spectrometry
GB/T 6041-2002 General rules for mass spectrometric analysis
GB/T 29851-2013 Test method for measuring boron and aluminium in silicon materials used for photovoltaic applications by secondary ion mass spectrometry
GB/T 42699.2-2023 Textiles―Qualitative and quantitative proteomic analysis of some animal hair fibres―Part 2:Peptide detection using MALDI-TOF-MS
GB/T 6041-2020 General rules for mass spectrometric analysis
GB/T 21981-2008 Determination of hormone multiresidues in food of animal origin - LC-MS/MS method
GB/T 42263-2022 Determination of nitrogen content in silicon single crystal—Secondary ion mass spectrometry method
GB/T 22572-2008 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
GB/T 24575-2009 Test method for measuring surface sodium,aluminum,potassium,and iron on silicon and epi substrates by secondary ion mass spectrometry

未注明发布机构

DIN EN ISO 10927 E:2017-03 Determination of Molecular Mass and Molecular Mass Distribution of Polymer Species by Auxiliary Matrix Laser Adsorption/Ionization Time-of-Flight Mass Spectrometry for Plastics (MALDI-TOF-MS) (Draft)

Professional Standard - Public Safety Standards

GA/T 934-2011 LC-MS-MS examination method for hypaconitine aconitine and mesaconitine in biological samples

Professional Standard - Commodity Inspection

SN/T 2231-2008 Determination of dinotefuran residues in food for import and export—LC-MS/MS
SN/T 3872-2014 Test method for four kinds of pathogenic bacterium in food for export - MALDI-TOF-MS
SN/T 0520-2012 Determination of imazalil in cereals for export. HPLC-MS/MS method

Tianjin Provincial Standard of the People's Republic of China

DB12/T 952-2020 Detection method of antibiotic residues in pig manure by liquid chromatography-mass spectrometry/mass spectrometry

国家质量监督检验检疫总局

SN/T 4777-2017 Determination of anthraquinone residues in tea for export—GC-MS/MS method
SN/T 0601-2015 Determination of chlorfenvinphos residue in foodstuffs for export by HPLC-MS/MS method

International Organization for Standardization (ISO)

ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Danish Standards Foundation

DS/EN ISO 10927:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS)

British Standards Institution (BSI)

BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
BS EN ISO 10927:2011 Plastics. Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS)
BS EN ISO 10927:2018 Plastics. Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS)
BS ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry
BS ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry

GSO

GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
OS GSO ISO 10927:2013 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS)
BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BH GSO ISO 23830:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
GSO ISO 17560:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
BH GSO ISO 23812:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
OS GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
BH GSO ISO 22048:2016 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
OS GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials

Japanese Industrial Standards Committee (JISC)

JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry

American Society for Testing and Materials (ASTM)

ASTM E1504-92(2001) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E1504-92(1996) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E1504-11(2019) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E1504-06 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy
ASTM D2712-17 Standard Test Method for Determination of Hydrocarbon Impurities in High Purity Propylene by Gas Chromatography
ASTM D2712-18 Standard Test Method for Determination of Hydrocarbon Impurities in High Purity Propylene by Gas Chromatography
ASTM D6159-97(2007) Standard Test Method for Determination of Hydrocarbon Impurities in Ethylene by Gas Chromatography
ASTM F1366-92(1997)e1 Standard Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry
ASTM E1635-06(2011) Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E1162-87(2001) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E1162-87(1996) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM D7134-05(2012) Standard Test Method for Molecular Mass Averages and Molecular Mass Distribution of Atactic Polystyrene by Matrix Assisted Laser Desorption/Ionization (MALDI)-Time of Flight (TOF) Mass Spectrometry (MS)
ASTM D7134-05 Standard Test Method for Molecular Mass Averages and Molecular Mass Distribution of Atactic Polystyrene by Matrix Assisted Laser Desorption/Ionization (MALDI)-Time of Flight (TOF) Mass Spectrometry (MS)
ASTM E2838-11 Standard Test Method for Determination of Thiodiglycol on Wipes by Solvent Extraction Followed by Liquid Chromatography/Tandem Mass Spectrometry (LC/MS/MS)

SCC

10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
DANSK DS/EN ISO 10927:2018 Plastics – Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2018)
AENOR UNE-EN ISO 10927:2012 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2011)
NS-EN ISO 10927:2011 Plastics — Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2011)
DIN EN ISO 10927 E:2017 Draft Document - Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO/DIS 10927:2017); German and English v...
07/30138812 DC BS ISO 23830. Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
NS-EN ISO 10927:2018 Plastics — Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2018)
10/30199169 DC BS ISO 12406. Surface chemical analysis. Secondary ion mass spectrometry. Method for depth profiling of arsenic in silicon

Association Francaise de Normalisation

NF T51-241:2018 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS)
NF T30-711:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
NF EN ISO 10927:2018 Plastics - Determination of molecular mass and molecular mass distribution of polymers by time-of-flight mass spectrometry after matrix-assisted laser desorption/ionization (MS-MALDI-TOF)
NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions
NF T51-241:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
NF X21-064*NF ISO 23830:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry.
NF X21-066*NF ISO 23812:2009 Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
NF V03-155:2010 Food analysis - Determination of patuline by High performance liquid chromatography - Mass spectrometry/Mass spectrometry method (HPLC-MS/MS).

ES-UNE

UNE-EN ISO 10927:2019 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2018)

German Institute for Standardization

DIN EN ISO 10927:2018 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2018)
DIN EN ISO 10927:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2011); German version EN ISO 10927:2011

Lithuanian Standards Office

LST EN ISO 10927:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2011)

AENOR

UNE-EN ISO 10927:2012 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2011)

Korean Agency for Technology and Standards (KATS)

KS D ISO 20341-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Method for estimating depth resolution parameters with multiple delta-layer reference materials
KS D ISO 20341-2005(2020) Surface chemical analysis－Secondary-ion mass spectrometry－Method for estimating depth resolution parameters with multiple delta-layer reference materials
KS M 0027-2023 General rules for analytical methods in gas chromatography mass spectrometry
KS M 0027-1993 General Rules for Analytical Methods in Gas Chromatography Mass Spectrometry
KS D ISO 22048-2005(2020) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 22048-2020 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry

KR-KS

KS M 0027-2008(2023) General rules for analytical methods in gas chromatography mass spectrometry