Electron probe preparation method

Electron probe preparation method, Total:52 items.

The international standard classification for "Electron probe preparation method" includes: Optical equipment , Optical measuring instruments , Other standards related to analytical chemistry , Semiconducting materials , Other standards related to optics and optical measurements , Test conditions and procedures in general , Testing of metals .

The Chinese standard classification for "Electron probe preparation method" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Semimetal and semiconductor material in general , Metal physical property test method , Chemical Measurement .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 17506-1998 The method of electron probe microanalysis as corrosive layer on ferrous metals of ship
GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
GB/T 15074-2008 General guide of quantitative analysis by EPMA
GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA
GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
GB/T 15074-1994 General guide for EPMA quantitative analysis
GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products - Part 1: Method of electron probe microanalysis
GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 17360-1998 Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels
GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
GB/T 15075-1994 Method for testing EPMA instrument
GB/T 17360-2008 Quantitative analysis method of low content Si and Mn in steel with electron probe microanalysis
GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)
GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe

Yunnan Provincial Standard of the People's Republic of China

DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method

Professional Standard - Petroleum

SY/T 6027-2012 Quantitative Analysis Method of Rock and Mineral by Electron Probe Microanalysis
SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals

国家能源局

SY/T 6027-2019 Quantitative analysis of rocks and minerals by electron probe microanalysis

Professional Standard - Aviation

HB 8422-2014 Quantitative detection method of EPMA for trace elements in alloys

Professional Standard - Military and Civilian Products

WJ 2297-1995 Electronic Probe Verification Regulations

National Metrological Verification Regulations of the People's Republic of China

JJG(地质) 1017-1990 Verification Regulations for Electronic Probe Instrument
JJG 901-1995 Verivication Regulation of Electron Probe Microanalyzer

National Metrological Technical Specifications of the People's Republic of China

JJF 1029-1991 The Technical Norm for Development of Certified Reference Materied Used in Quantitative Analysis of Electron Microprobe

Professional Standard - Machinery

JB/T 12074-2014 Quantitative Analysis of Composition Metal - Electron Probe Microanalysis

Professional Standard - Non-ferrous Metal

YS/T 602-2017 Test method for resistivity of zone-refined germanium ingot using a two-point probe
YS/T 602-2007 Test method for resistivity of zone-refined germanium ingot using a two-point probe

Fujian Provincial Standard of the People's Republic of China

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
GB/T 17360-2020 Microbeam analysis- Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer

Group Standards of the People's Republic of China

T/CSTM 00252-2020 Test method for carbon fiber electrical resistivity by Four-probe method

CZ-CSN

CSN ON 81 3790-1966 Electric feeler
CSN ON 81 3791-1966 Holder of electric íeeler

Japanese Industrial Standards Committee (JISC)

JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
JIS H 0602:1995 Testing method of resistivity for silicon crystals and silicon wafers with four-point probe

Korean Agency for Technology and Standards (KATS)

KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
KS D 0260-1989(1994) TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
KS C 0256-2002(2017) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
KS C 0256-2002 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe

German Institute for Standardization

DIN 6800-4:2000 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
DIN 6800-4:2000-12 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry

Association Francaise de Normalisation

NF ISO 11938:2012 Microbeam analysis - Electron microprobe analysis (Castaing microprobe) - Elemental mapping analysis methods using wavelength dispersive spectrometry

American Society for Testing and Materials (ASTM)

ASTM F1392-00 Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
ASTM F390-98 Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array

Others: Electron Probe Quantitative Analysis Method of Rare Earth Oxides,Production method,Quantitative Analysis Method of Electron Probe for Sulfide Minerals,Sample Preparation Method for Electron Probe Instrument,Electron Probe Sample Preparation Method,Methods of measurement of noise suppression sheets for digital apparatus and equipment,Electron Probe Analysis Method